Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy

Autores
Miguel, María de la Paz; Tomba, Juan Pablo
Año de publicación
2012
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
We present a simple experiment that allows the complete and direct characterization of the point spread function (PSF) in refraction-aberrated depth profiling experiments with confocal Raman microscopy. We used a wedge-shaped solid polymer film to induce refraction aberrations on the response of an infinitesimally thin Raman scatterer, represented by a polished silicon wafer. The system, with the film pasted on top of the Si wafer, was probed by a depth slicing technique under a dry-optics configuration. Post-acquisition processing of the Si and polymer intensity maps allowed the reconstruction of the axial PSF spatially resolved each 1 μm or less in the z-axis and for virtually continuous values of focusing depth. In agreement with theory, we found that PSF broadens asymmetrically with focusing depth, with a marked shift in the focus point. From the shape of PSF, we obtained values of depth resolution within the film that confirm that axial discrimination is not drastically deteriorated, as suggested by previous works, and that confocal aperture effectively reduces the collection volume even under severe refraction interference.
Fil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingenieria; Argentina
Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingenieria; Argentina
Materia
CONFOCAL RAMAN MICROSCOPY
DEPTH PROFILING
POINT SPREAD FUNCTION
REFRACTION
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/2347
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopyMiguel, María de la PazTomba, Juan PabloCONFOCAL RAMAN MICROSCOPYDEPTH PROFILINGPOINT SPREAD FUNCTIONREFRACTIONhttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2https://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1We present a simple experiment that allows the complete and direct characterization of the point spread function (PSF) in refraction-aberrated depth profiling experiments with confocal Raman microscopy. We used a wedge-shaped solid polymer film to induce refraction aberrations on the response of an infinitesimally thin Raman scatterer, represented by a polished silicon wafer. The system, with the film pasted on top of the Si wafer, was probed by a depth slicing technique under a dry-optics configuration. Post-acquisition processing of the Si and polymer intensity maps allowed the reconstruction of the axial PSF spatially resolved each 1 μm or less in the z-axis and for virtually continuous values of focusing depth. In agreement with theory, we found that PSF broadens asymmetrically with focusing depth, with a marked shift in the focus point. From the shape of PSF, we obtained values of depth resolution within the film that confirm that axial discrimination is not drastically deteriorated, as suggested by previous works, and that confocal aperture effectively reduces the collection volume even under severe refraction interference.Fil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingenieria; ArgentinaFil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingenieria; ArgentinaJohn Wiley & Sons Ltd2012-08-30info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/2347Miguel, María de la Paz; Tomba, Juan Pablo; Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy; John Wiley & Sons Ltd; Journal Of Raman Spectroscopy; 44; 3; 30-8-2012; 447-4520377-0486enginfo:eu-repo/semantics/altIdentifier/doi/10.1002/jrs.4195info:eu-repo/semantics/altIdentifier/url/http://onlinelibrary.wiley.com/doi/10.1002/jrs.4195info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T15:33:00Zoai:ri.conicet.gov.ar:11336/2347instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 15:33:00.919CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
title Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
spellingShingle Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
Miguel, María de la Paz
CONFOCAL RAMAN MICROSCOPY
DEPTH PROFILING
POINT SPREAD FUNCTION
REFRACTION
title_short Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
title_full Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
title_fullStr Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
title_full_unstemmed Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
title_sort Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy
dc.creator.none.fl_str_mv Miguel, María de la Paz
Tomba, Juan Pablo
author Miguel, María de la Paz
author_facet Miguel, María de la Paz
Tomba, Juan Pablo
author_role author
author2 Tomba, Juan Pablo
author2_role author
dc.subject.none.fl_str_mv CONFOCAL RAMAN MICROSCOPY
DEPTH PROFILING
POINT SPREAD FUNCTION
REFRACTION
topic CONFOCAL RAMAN MICROSCOPY
DEPTH PROFILING
POINT SPREAD FUNCTION
REFRACTION
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv We present a simple experiment that allows the complete and direct characterization of the point spread function (PSF) in refraction-aberrated depth profiling experiments with confocal Raman microscopy. We used a wedge-shaped solid polymer film to induce refraction aberrations on the response of an infinitesimally thin Raman scatterer, represented by a polished silicon wafer. The system, with the film pasted on top of the Si wafer, was probed by a depth slicing technique under a dry-optics configuration. Post-acquisition processing of the Si and polymer intensity maps allowed the reconstruction of the axial PSF spatially resolved each 1 μm or less in the z-axis and for virtually continuous values of focusing depth. In agreement with theory, we found that PSF broadens asymmetrically with focusing depth, with a marked shift in the focus point. From the shape of PSF, we obtained values of depth resolution within the film that confirm that axial discrimination is not drastically deteriorated, as suggested by previous works, and that confocal aperture effectively reduces the collection volume even under severe refraction interference.
Fil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingenieria; Argentina
Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingenieria; Argentina
description We present a simple experiment that allows the complete and direct characterization of the point spread function (PSF) in refraction-aberrated depth profiling experiments with confocal Raman microscopy. We used a wedge-shaped solid polymer film to induce refraction aberrations on the response of an infinitesimally thin Raman scatterer, represented by a polished silicon wafer. The system, with the film pasted on top of the Si wafer, was probed by a depth slicing technique under a dry-optics configuration. Post-acquisition processing of the Si and polymer intensity maps allowed the reconstruction of the axial PSF spatially resolved each 1 μm or less in the z-axis and for virtually continuous values of focusing depth. In agreement with theory, we found that PSF broadens asymmetrically with focusing depth, with a marked shift in the focus point. From the shape of PSF, we obtained values of depth resolution within the film that confirm that axial discrimination is not drastically deteriorated, as suggested by previous works, and that confocal aperture effectively reduces the collection volume even under severe refraction interference.
publishDate 2012
dc.date.none.fl_str_mv 2012-08-30
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/2347
Miguel, María de la Paz; Tomba, Juan Pablo; Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy; John Wiley & Sons Ltd; Journal Of Raman Spectroscopy; 44; 3; 30-8-2012; 447-452
0377-0486
url http://hdl.handle.net/11336/2347
identifier_str_mv Miguel, María de la Paz; Tomba, Juan Pablo; Determination of one-dimensional spherically aberrated point spread function in depth profiling by confocal Raman microscopy; John Wiley & Sons Ltd; Journal Of Raman Spectroscopy; 44; 3; 30-8-2012; 447-452
0377-0486
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1002/jrs.4195
info:eu-repo/semantics/altIdentifier/url/http://onlinelibrary.wiley.com/doi/10.1002/jrs.4195
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv John Wiley & Sons Ltd
publisher.none.fl_str_mv John Wiley & Sons Ltd
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.22299

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