A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy

Autores
Miguel, María de la Paz; Tomba, Juan Pablo
Año de publicación
2012
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
We compare and analyze different approaches to perform depth profiling of polymer films and coatings by confocal Raman microscopy (CRM). Data were generated using three methodologies: conventional metallurgical objectives, oil-immersion optics and numerical post processing of the as-measured intensity profiles, via an optimized deconvolution technique adapted to CRM. A series of bi- and multi-layered polymeric films were used as test systems. Strengths and weaknesses of each methodology are evaluated in terms of delivered depth resolution, signal throughput and flexibility. It is shown that the application of regularized deconvolution on data obtained from dry objectives yielded intensity profiles with a quality comparable, in some cases superior, to those obtained with immersion objectives, with the advantage of being totally non-invasive. © 2011 Elsevier B.V. All Rights Reserved.
Fil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina
Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina
Materia
Confocal Raman Microscopy
Deconvolution
Depth Profiling
Polymer Films And Coatings
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/54043

id CONICETDig_dbd804097a0417c919174cb45a3a3ba9
oai_identifier_str oai:ri.conicet.gov.ar:11336/54043
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopyMiguel, María de la PazTomba, Juan PabloConfocal Raman MicroscopyDeconvolutionDepth ProfilingPolymer Films And Coatingshttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2We compare and analyze different approaches to perform depth profiling of polymer films and coatings by confocal Raman microscopy (CRM). Data were generated using three methodologies: conventional metallurgical objectives, oil-immersion optics and numerical post processing of the as-measured intensity profiles, via an optimized deconvolution technique adapted to CRM. A series of bi- and multi-layered polymeric films were used as test systems. Strengths and weaknesses of each methodology are evaluated in terms of delivered depth resolution, signal throughput and flexibility. It is shown that the application of regularized deconvolution on data obtained from dry objectives yielded intensity profiles with a quality comparable, in some cases superior, to those obtained with immersion objectives, with the advantage of being totally non-invasive. © 2011 Elsevier B.V. All Rights Reserved.Fil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; ArgentinaFil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; ArgentinaElsevier Science Sa2012-05info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/54043Miguel, María de la Paz; Tomba, Juan Pablo; A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy; Elsevier Science Sa; Propress In Organic Coatings; 74; 1; 5-2012; 43-490300-9440CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.porgcoat.2011.09.016info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S030094401100289Xinfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-10T13:01:09Zoai:ri.conicet.gov.ar:11336/54043instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-10 13:01:09.559CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
title A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
spellingShingle A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
Miguel, María de la Paz
Confocal Raman Microscopy
Deconvolution
Depth Profiling
Polymer Films And Coatings
title_short A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
title_full A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
title_fullStr A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
title_full_unstemmed A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
title_sort A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy
dc.creator.none.fl_str_mv Miguel, María de la Paz
Tomba, Juan Pablo
author Miguel, María de la Paz
author_facet Miguel, María de la Paz
Tomba, Juan Pablo
author_role author
author2 Tomba, Juan Pablo
author2_role author
dc.subject.none.fl_str_mv Confocal Raman Microscopy
Deconvolution
Depth Profiling
Polymer Films And Coatings
topic Confocal Raman Microscopy
Deconvolution
Depth Profiling
Polymer Films And Coatings
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv We compare and analyze different approaches to perform depth profiling of polymer films and coatings by confocal Raman microscopy (CRM). Data were generated using three methodologies: conventional metallurgical objectives, oil-immersion optics and numerical post processing of the as-measured intensity profiles, via an optimized deconvolution technique adapted to CRM. A series of bi- and multi-layered polymeric films were used as test systems. Strengths and weaknesses of each methodology are evaluated in terms of delivered depth resolution, signal throughput and flexibility. It is shown that the application of regularized deconvolution on data obtained from dry objectives yielded intensity profiles with a quality comparable, in some cases superior, to those obtained with immersion objectives, with the advantage of being totally non-invasive. © 2011 Elsevier B.V. All Rights Reserved.
Fil: Miguel, María de la Paz. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina
Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina
description We compare and analyze different approaches to perform depth profiling of polymer films and coatings by confocal Raman microscopy (CRM). Data were generated using three methodologies: conventional metallurgical objectives, oil-immersion optics and numerical post processing of the as-measured intensity profiles, via an optimized deconvolution technique adapted to CRM. A series of bi- and multi-layered polymeric films were used as test systems. Strengths and weaknesses of each methodology are evaluated in terms of delivered depth resolution, signal throughput and flexibility. It is shown that the application of regularized deconvolution on data obtained from dry objectives yielded intensity profiles with a quality comparable, in some cases superior, to those obtained with immersion objectives, with the advantage of being totally non-invasive. © 2011 Elsevier B.V. All Rights Reserved.
publishDate 2012
dc.date.none.fl_str_mv 2012-05
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/54043
Miguel, María de la Paz; Tomba, Juan Pablo; A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy; Elsevier Science Sa; Propress In Organic Coatings; 74; 1; 5-2012; 43-49
0300-9440
CONICET Digital
CONICET
url http://hdl.handle.net/11336/54043
identifier_str_mv Miguel, María de la Paz; Tomba, Juan Pablo; A comparison of different approaches for depth profiling of films and coatings by confocal Raman microscopy; Elsevier Science Sa; Propress In Organic Coatings; 74; 1; 5-2012; 43-49
0300-9440
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1016/j.porgcoat.2011.09.016
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S030094401100289X
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier Science Sa
publisher.none.fl_str_mv Elsevier Science Sa
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1842979929864536064
score 12.48226