Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films

Autores
Tomba, Juan Pablo; Pastor, José M.
Año de publicación
2007
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
In this work, we test simple models proposed to predict two characteristic features when performing depth profiling with dry-optics confocal Raman microspectroscopy (CRM): the decay in the collected intensity and the degradation of depth resolution with focusing depth due to laser refraction. With this aim, we carried out experiments on transparent thick polystyrene and poly(methyl methacrylate) films, in which we tracked the collected Raman intensity as a function of focusing depth. These results are interpreted in the context of the model proposed by Batchelder. We also investigated the Raman response on a series of well-defined planar interfaces, generated by contact between thin poly(methyl methacrylate) films (45, 94 and 145 μm thickness) coated onto a much thicker piece of poly(butyl methacrylate). These results allowed us to test the enlargement in focus length with focusing depth predicted by the models of Everall and Batchelder. We found that with minor modifications that keep the simplicity of the original treatment, the model of Batchelder reproduces reliably fine features of the Raman intensity profiles. The results of this work show that these simple models cannot only be used to assist data interpretation but also to predict quantitatively Raman intensity variations in depth profiling experiments. © 2006 Elsevier B.V. All rights reserved.
Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina
Fil: Pastor, José M.. Universidad de Valladolid; España
Materia
Confocal Raman Microspectroscopy
Depth Profiling
Depth Resolution
Dry Objectives
Polymer Films
Refraction
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/72029
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer filmsTomba, Juan PabloPastor, José M.Confocal Raman MicrospectroscopyDepth ProfilingDepth ResolutionDry ObjectivesPolymer FilmsRefractionhttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1In this work, we test simple models proposed to predict two characteristic features when performing depth profiling with dry-optics confocal Raman microspectroscopy (CRM): the decay in the collected intensity and the degradation of depth resolution with focusing depth due to laser refraction. With this aim, we carried out experiments on transparent thick polystyrene and poly(methyl methacrylate) films, in which we tracked the collected Raman intensity as a function of focusing depth. These results are interpreted in the context of the model proposed by Batchelder. We also investigated the Raman response on a series of well-defined planar interfaces, generated by contact between thin poly(methyl methacrylate) films (45, 94 and 145 μm thickness) coated onto a much thicker piece of poly(butyl methacrylate). These results allowed us to test the enlargement in focus length with focusing depth predicted by the models of Everall and Batchelder. We found that with minor modifications that keep the simplicity of the original treatment, the model of Batchelder reproduces reliably fine features of the Raman intensity profiles. The results of this work show that these simple models cannot only be used to assist data interpretation but also to predict quantitatively Raman intensity variations in depth profiling experiments. © 2006 Elsevier B.V. All rights reserved.Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; ArgentinaFil: Pastor, José M.. Universidad de Valladolid; EspañaElsevier Science2007-05info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/72029Tomba, Juan Pablo; Pastor, José M.; Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films; Elsevier Science; Vibrational Spectroscopy; 44; 1; 5-2007; 62-680924-2031CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0924203106001767info:eu-repo/semantics/altIdentifier/doi/10.1016/j.vibspec.2006.08.001info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T10:03:19Zoai:ri.conicet.gov.ar:11336/72029instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 10:03:19.874CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
title Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
spellingShingle Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
Tomba, Juan Pablo
Confocal Raman Microspectroscopy
Depth Profiling
Depth Resolution
Dry Objectives
Polymer Films
Refraction
title_short Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
title_full Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
title_fullStr Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
title_full_unstemmed Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
title_sort Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films
dc.creator.none.fl_str_mv Tomba, Juan Pablo
Pastor, José M.
author Tomba, Juan Pablo
author_facet Tomba, Juan Pablo
Pastor, José M.
author_role author
author2 Pastor, José M.
author2_role author
dc.subject.none.fl_str_mv Confocal Raman Microspectroscopy
Depth Profiling
Depth Resolution
Dry Objectives
Polymer Films
Refraction
topic Confocal Raman Microspectroscopy
Depth Profiling
Depth Resolution
Dry Objectives
Polymer Films
Refraction
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv In this work, we test simple models proposed to predict two characteristic features when performing depth profiling with dry-optics confocal Raman microspectroscopy (CRM): the decay in the collected intensity and the degradation of depth resolution with focusing depth due to laser refraction. With this aim, we carried out experiments on transparent thick polystyrene and poly(methyl methacrylate) films, in which we tracked the collected Raman intensity as a function of focusing depth. These results are interpreted in the context of the model proposed by Batchelder. We also investigated the Raman response on a series of well-defined planar interfaces, generated by contact between thin poly(methyl methacrylate) films (45, 94 and 145 μm thickness) coated onto a much thicker piece of poly(butyl methacrylate). These results allowed us to test the enlargement in focus length with focusing depth predicted by the models of Everall and Batchelder. We found that with minor modifications that keep the simplicity of the original treatment, the model of Batchelder reproduces reliably fine features of the Raman intensity profiles. The results of this work show that these simple models cannot only be used to assist data interpretation but also to predict quantitatively Raman intensity variations in depth profiling experiments. © 2006 Elsevier B.V. All rights reserved.
Fil: Tomba, Juan Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentina
Fil: Pastor, José M.. Universidad de Valladolid; España
description In this work, we test simple models proposed to predict two characteristic features when performing depth profiling with dry-optics confocal Raman microspectroscopy (CRM): the decay in the collected intensity and the degradation of depth resolution with focusing depth due to laser refraction. With this aim, we carried out experiments on transparent thick polystyrene and poly(methyl methacrylate) films, in which we tracked the collected Raman intensity as a function of focusing depth. These results are interpreted in the context of the model proposed by Batchelder. We also investigated the Raman response on a series of well-defined planar interfaces, generated by contact between thin poly(methyl methacrylate) films (45, 94 and 145 μm thickness) coated onto a much thicker piece of poly(butyl methacrylate). These results allowed us to test the enlargement in focus length with focusing depth predicted by the models of Everall and Batchelder. We found that with minor modifications that keep the simplicity of the original treatment, the model of Batchelder reproduces reliably fine features of the Raman intensity profiles. The results of this work show that these simple models cannot only be used to assist data interpretation but also to predict quantitatively Raman intensity variations in depth profiling experiments. © 2006 Elsevier B.V. All rights reserved.
publishDate 2007
dc.date.none.fl_str_mv 2007-05
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/72029
Tomba, Juan Pablo; Pastor, José M.; Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films; Elsevier Science; Vibrational Spectroscopy; 44; 1; 5-2007; 62-68
0924-2031
CONICET Digital
CONICET
url http://hdl.handle.net/11336/72029
identifier_str_mv Tomba, Juan Pablo; Pastor, José M.; Confocal Raman microspectroscopy with dry objectives: A depth profiling study on polymer films; Elsevier Science; Vibrational Spectroscopy; 44; 1; 5-2007; 62-68
0924-2031
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0924203106001767
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.vibspec.2006.08.001
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier Science
publisher.none.fl_str_mv Elsevier Science
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.13397

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