Modulated photoconductivity in the high and low frequency regimes

Autores
Schmidt, Javier Alejandro; Longeaud, C.; Koropecki, Roberto Roman; Arce, Roberto Delio; Kleider, J.
Año de publicación
2008
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Different methods have been proposed to use modulated photoconductivity (MPC) measurements in order to extract information about the density of states (DOS) within the gap of defective semiconductors. Depending on the frequency of the modulation, two regimes have to be considered: the high frequency (HF) and the low frequency (LF) regimes. In this paper, we use computer-generated data, obtained from the complete solution of the MPC equations, to test the different procedures proposed to treat the MPC data in both regimes. We show that Bru¨ggemann’s method provides an accurate reconstruction of the introduced DOS provided the capture coefficients are known, while in the LF limit of Kounavis’ method a factor of two is missing. We also test the accuracy of different procedures proposed to extract the capture coefficients of the defects, which are necessary to get absolute DOS values in the methods that utilize the HF regime. The LF–MPC method, on the other hand, has the advantage that the capture coefficients are not needed.
Fil: Schmidt, Javier Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina
Fil: Longeaud, C.. Universite Pierre et Marie Curie; Francia
Fil: Koropecki, Roberto Roman. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina
Fil: Arce, Roberto Delio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina
Fil: Kleider, J.. Universite Pierre et Marie Curie; Francia
Materia
Defect State
Modulated Photoconductivity
Density of States
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/25377
Acceder
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spelling Modulated photoconductivity in the high and low frequency regimesSchmidt, Javier AlejandroLongeaud, C.Koropecki, Roberto RomanArce, Roberto DelioKleider, J.Defect StateModulated PhotoconductivityDensity of Stateshttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Different methods have been proposed to use modulated photoconductivity (MPC) measurements in order to extract information about the density of states (DOS) within the gap of defective semiconductors. Depending on the frequency of the modulation, two regimes have to be considered: the high frequency (HF) and the low frequency (LF) regimes. In this paper, we use computer-generated data, obtained from the complete solution of the MPC equations, to test the different procedures proposed to treat the MPC data in both regimes. We show that Bru¨ggemann’s method provides an accurate reconstruction of the introduced DOS provided the capture coefficients are known, while in the LF limit of Kounavis’ method a factor of two is missing. We also test the accuracy of different procedures proposed to extract the capture coefficients of the defects, which are necessary to get absolute DOS values in the methods that utilize the HF regime. The LF–MPC method, on the other hand, has the advantage that the capture coefficients are not needed.Fil: Schmidt, Javier Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; ArgentinaFil: Longeaud, C.. Universite Pierre et Marie Curie; FranciaFil: Koropecki, Roberto Roman. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; ArgentinaFil: Arce, Roberto Delio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; ArgentinaFil: Kleider, J.. Universite Pierre et Marie Curie; FranciaElsevier Science2008-12info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/25377Schmidt, Javier Alejandro; Longeaud, C.; Koropecki, Roberto Roman; Arce, Roberto Delio; Kleider, J.; Modulated photoconductivity in the high and low frequency regimes; Elsevier Science; Journal of Non-crystalline Solids; 354; 19-25; 12-2008; 2914-29170022-3093CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.jnoncrysol.2007.09.104info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0022309308000227info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:43:05Zoai:ri.conicet.gov.ar:11336/25377instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:43:05.785CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Modulated photoconductivity in the high and low frequency regimes
title Modulated photoconductivity in the high and low frequency regimes
spellingShingle Modulated photoconductivity in the high and low frequency regimes
Schmidt, Javier Alejandro
Defect State
Modulated Photoconductivity
Density of States
title_short Modulated photoconductivity in the high and low frequency regimes
title_full Modulated photoconductivity in the high and low frequency regimes
title_fullStr Modulated photoconductivity in the high and low frequency regimes
title_full_unstemmed Modulated photoconductivity in the high and low frequency regimes
title_sort Modulated photoconductivity in the high and low frequency regimes
dc.creator.none.fl_str_mv Schmidt, Javier Alejandro
Longeaud, C.
Koropecki, Roberto Roman
Arce, Roberto Delio
Kleider, J.
author Schmidt, Javier Alejandro
author_facet Schmidt, Javier Alejandro
Longeaud, C.
Koropecki, Roberto Roman
Arce, Roberto Delio
Kleider, J.
author_role author
author2 Longeaud, C.
Koropecki, Roberto Roman
Arce, Roberto Delio
Kleider, J.
author2_role author
author
author
author
dc.subject.none.fl_str_mv Defect State
Modulated Photoconductivity
Density of States
topic Defect State
Modulated Photoconductivity
Density of States
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Different methods have been proposed to use modulated photoconductivity (MPC) measurements in order to extract information about the density of states (DOS) within the gap of defective semiconductors. Depending on the frequency of the modulation, two regimes have to be considered: the high frequency (HF) and the low frequency (LF) regimes. In this paper, we use computer-generated data, obtained from the complete solution of the MPC equations, to test the different procedures proposed to treat the MPC data in both regimes. We show that Bru¨ggemann’s method provides an accurate reconstruction of the introduced DOS provided the capture coefficients are known, while in the LF limit of Kounavis’ method a factor of two is missing. We also test the accuracy of different procedures proposed to extract the capture coefficients of the defects, which are necessary to get absolute DOS values in the methods that utilize the HF regime. The LF–MPC method, on the other hand, has the advantage that the capture coefficients are not needed.
Fil: Schmidt, Javier Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina
Fil: Longeaud, C.. Universite Pierre et Marie Curie; Francia
Fil: Koropecki, Roberto Roman. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina
Fil: Arce, Roberto Delio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina
Fil: Kleider, J.. Universite Pierre et Marie Curie; Francia
description Different methods have been proposed to use modulated photoconductivity (MPC) measurements in order to extract information about the density of states (DOS) within the gap of defective semiconductors. Depending on the frequency of the modulation, two regimes have to be considered: the high frequency (HF) and the low frequency (LF) regimes. In this paper, we use computer-generated data, obtained from the complete solution of the MPC equations, to test the different procedures proposed to treat the MPC data in both regimes. We show that Bru¨ggemann’s method provides an accurate reconstruction of the introduced DOS provided the capture coefficients are known, while in the LF limit of Kounavis’ method a factor of two is missing. We also test the accuracy of different procedures proposed to extract the capture coefficients of the defects, which are necessary to get absolute DOS values in the methods that utilize the HF regime. The LF–MPC method, on the other hand, has the advantage that the capture coefficients are not needed.
publishDate 2008
dc.date.none.fl_str_mv 2008-12
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/25377
Schmidt, Javier Alejandro; Longeaud, C.; Koropecki, Roberto Roman; Arce, Roberto Delio; Kleider, J.; Modulated photoconductivity in the high and low frequency regimes; Elsevier Science; Journal of Non-crystalline Solids; 354; 19-25; 12-2008; 2914-2917
0022-3093
CONICET Digital
CONICET
url http://hdl.handle.net/11336/25377
identifier_str_mv Schmidt, Javier Alejandro; Longeaud, C.; Koropecki, Roberto Roman; Arce, Roberto Delio; Kleider, J.; Modulated photoconductivity in the high and low frequency regimes; Elsevier Science; Journal of Non-crystalline Solids; 354; 19-25; 12-2008; 2914-2917
0022-3093
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jnoncrysol.2007.09.104
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0022309308000227
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier Science
publisher.none.fl_str_mv Elsevier Science
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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