Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

Autores
Miccio, Luis Alejandro; Kummali, Mohammed M.; Montemartini, Pablo Ezequiel; Oyanguren, Patricia Angelica; Colmenero, Juan; Schwartz, Gustavo A.; Alegría, Angel
Año de publicación
2011
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.
Fil: Miccio, Luis Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Kummali, Mohammed M.. Materials Physics Center; España
Fil: Montemartini, Pablo Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Oyanguren, Patricia Angelica. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Colmenero, Juan. Materials Physics Center; España
Fil: Schwartz, Gustavo A.. Materials Physics Center; España
Fil: Alegría, Angel. Materials Physics Center; España
Materia
Electric Force Microscopy
Fluorine Depth Profiles
Epoxy Networks
Dielectric
Polymers
Permittivity
Atomic Force Microscopy
X-Ray Photoelectron Spectroscopy
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/9645
Acceder
id CONICETDig_3a95262c2572ee0fb02d87d83ab13a9a
oai_identifier_str oai:ri.conicet.gov.ar:11336/9645
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Determining concentration depth profiles in fluorinated networks by means of electric force microscopyMiccio, Luis AlejandroKummali, Mohammed M.Montemartini, Pablo EzequielOyanguren, Patricia AngelicaColmenero, JuanSchwartz, Gustavo A.Alegría, AngelElectric Force MicroscopyFluorine Depth ProfilesEpoxy NetworksDielectricPolymersPermittivityAtomic Force MicroscopyX-Ray Photoelectron Spectroscopyhttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2https://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1https://purl.org/becyt/ford/2.10https://purl.org/becyt/ford/2By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.Fil: Miccio, Luis Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Kummali, Mohammed M.. Materials Physics Center; EspañaFil: Montemartini, Pablo Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Oyanguren, Patricia Angelica. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Colmenero, Juan. Materials Physics Center; EspañaFil: Schwartz, Gustavo A.. Materials Physics Center; EspañaFil: Alegría, Angel. Materials Physics Center; EspañaAmerican Institute Of Physics2011-08-11info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/9645Miccio, Luis Alejandro; Kummali, Mohammed M.; Montemartini, Pablo Ezequiel; Oyanguren, Patricia Angelica; Colmenero, Juan; et al.; Determining concentration depth profiles in fluorinated networks by means of electric force microscopy; American Institute Of Physics; Journal Of Chemical Physics; 135; 6; 11-8-2011; 647041-6470450021-9606enginfo:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/abs/10.1063/1.3624574info:eu-repo/semantics/altIdentifier/doi/10.1063/1.3624574info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-29T11:45:33Zoai:ri.conicet.gov.ar:11336/9645instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-29 11:45:33.928CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
title Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
spellingShingle Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
Miccio, Luis Alejandro
Electric Force Microscopy
Fluorine Depth Profiles
Epoxy Networks
Dielectric
Polymers
Permittivity
Atomic Force Microscopy
X-Ray Photoelectron Spectroscopy
title_short Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
title_full Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
title_fullStr Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
title_full_unstemmed Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
title_sort Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
dc.creator.none.fl_str_mv Miccio, Luis Alejandro
Kummali, Mohammed M.
Montemartini, Pablo Ezequiel
Oyanguren, Patricia Angelica
Colmenero, Juan
Schwartz, Gustavo A.
Alegría, Angel
author Miccio, Luis Alejandro
author_facet Miccio, Luis Alejandro
Kummali, Mohammed M.
Montemartini, Pablo Ezequiel
Oyanguren, Patricia Angelica
Colmenero, Juan
Schwartz, Gustavo A.
Alegría, Angel
author_role author
author2 Kummali, Mohammed M.
Montemartini, Pablo Ezequiel
Oyanguren, Patricia Angelica
Colmenero, Juan
Schwartz, Gustavo A.
Alegría, Angel
author2_role author
author
author
author
author
author
dc.subject.none.fl_str_mv Electric Force Microscopy
Fluorine Depth Profiles
Epoxy Networks
Dielectric
Polymers
Permittivity
Atomic Force Microscopy
X-Ray Photoelectron Spectroscopy
topic Electric Force Microscopy
Fluorine Depth Profiles
Epoxy Networks
Dielectric
Polymers
Permittivity
Atomic Force Microscopy
X-Ray Photoelectron Spectroscopy
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
https://purl.org/becyt/ford/2.10
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.
Fil: Miccio, Luis Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Kummali, Mohammed M.. Materials Physics Center; España
Fil: Montemartini, Pablo Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Oyanguren, Patricia Angelica. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Colmenero, Juan. Materials Physics Center; España
Fil: Schwartz, Gustavo A.. Materials Physics Center; España
Fil: Alegría, Angel. Materials Physics Center; España
description By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.
publishDate 2011
dc.date.none.fl_str_mv 2011-08-11
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/9645
Miccio, Luis Alejandro; Kummali, Mohammed M.; Montemartini, Pablo Ezequiel; Oyanguren, Patricia Angelica; Colmenero, Juan; et al.; Determining concentration depth profiles in fluorinated networks by means of electric force microscopy; American Institute Of Physics; Journal Of Chemical Physics; 135; 6; 11-8-2011; 647041-647045
0021-9606
url http://hdl.handle.net/11336/9645
identifier_str_mv Miccio, Luis Alejandro; Kummali, Mohammed M.; Montemartini, Pablo Ezequiel; Oyanguren, Patricia Angelica; Colmenero, Juan; et al.; Determining concentration depth profiles in fluorinated networks by means of electric force microscopy; American Institute Of Physics; Journal Of Chemical Physics; 135; 6; 11-8-2011; 647041-647045
0021-9606
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/abs/10.1063/1.3624574
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.3624574
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute Of Physics
publisher.none.fl_str_mv American Institute Of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1847426427529461760
score 13.10058

Publicaciones similares