Radiation effects on SOI microrelays for space applications

Autores
Lozano, Alex; Palumbo, Félix Roberto Mario; Alurralde, Martín Alejo
Año de publicación
2009
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Considerable effort has gone into the study of the failure mechanisms and reliability of micro-electro-mechanical-systems (MEMS) to extend its use to critical areas. In this paper a prototype of SOI microrelays is evaluated for space applications. The MEMS devices are subjected to uniform proton beam of 10MeV, while its response is monitored by electrical characteristics for successive irradiation pulses. Although the system shows a significant increase of positive trapped charge, it has not been found any limitation on the functionality based in the main parameters such as the actuation voltage, the leakage currents, and conduction mechanism of the switch.
Fil: Lozano, Alex. Instituto Nacional de Tecnología Industrial; Argentina
Fil: Palumbo, Félix Roberto Mario. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Alurralde, Martín Alejo. Comisión Nacional de Energía Atómica; Argentina
Materia
Mems
Radiation Effects in Devices
Radiation Hardeding
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/63068
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Radiation effects on SOI microrelays for space applicationsLozano, AlexPalumbo, Félix Roberto MarioAlurralde, Martín AlejoMemsRadiation Effects in DevicesRadiation Hardedinghttps://purl.org/becyt/ford/2.10https://purl.org/becyt/ford/2Considerable effort has gone into the study of the failure mechanisms and reliability of micro-electro-mechanical-systems (MEMS) to extend its use to critical areas. In this paper a prototype of SOI microrelays is evaluated for space applications. The MEMS devices are subjected to uniform proton beam of 10MeV, while its response is monitored by electrical characteristics for successive irradiation pulses. Although the system shows a significant increase of positive trapped charge, it has not been found any limitation on the functionality based in the main parameters such as the actuation voltage, the leakage currents, and conduction mechanism of the switch.Fil: Lozano, Alex. Instituto Nacional de Tecnología Industrial; ArgentinaFil: Palumbo, Félix Roberto Mario. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Alurralde, Martín Alejo. Comisión Nacional de Energía Atómica; ArgentinaThe Electrochemical Society2009-08info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/63068Lozano, Alex; Palumbo, Félix Roberto Mario; Alurralde, Martín Alejo; Radiation effects on SOI microrelays for space applications; The Electrochemical Society; ECS Transactions; 23; 1; 8-2009; 279-2851938-6737CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1149/1.3183730info:eu-repo/semantics/altIdentifier/url/http://ecst.ecsdl.org/content/23/1/279.abstractinfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:57:29Zoai:ri.conicet.gov.ar:11336/63068instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:57:29.326CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Radiation effects on SOI microrelays for space applications
title Radiation effects on SOI microrelays for space applications
spellingShingle Radiation effects on SOI microrelays for space applications
Lozano, Alex
Mems
Radiation Effects in Devices
Radiation Hardeding
title_short Radiation effects on SOI microrelays for space applications
title_full Radiation effects on SOI microrelays for space applications
title_fullStr Radiation effects on SOI microrelays for space applications
title_full_unstemmed Radiation effects on SOI microrelays for space applications
title_sort Radiation effects on SOI microrelays for space applications
dc.creator.none.fl_str_mv Lozano, Alex
Palumbo, Félix Roberto Mario
Alurralde, Martín Alejo
author Lozano, Alex
author_facet Lozano, Alex
Palumbo, Félix Roberto Mario
Alurralde, Martín Alejo
author_role author
author2 Palumbo, Félix Roberto Mario
Alurralde, Martín Alejo
author2_role author
author
dc.subject.none.fl_str_mv Mems
Radiation Effects in Devices
Radiation Hardeding
topic Mems
Radiation Effects in Devices
Radiation Hardeding
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.10
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv Considerable effort has gone into the study of the failure mechanisms and reliability of micro-electro-mechanical-systems (MEMS) to extend its use to critical areas. In this paper a prototype of SOI microrelays is evaluated for space applications. The MEMS devices are subjected to uniform proton beam of 10MeV, while its response is monitored by electrical characteristics for successive irradiation pulses. Although the system shows a significant increase of positive trapped charge, it has not been found any limitation on the functionality based in the main parameters such as the actuation voltage, the leakage currents, and conduction mechanism of the switch.
Fil: Lozano, Alex. Instituto Nacional de Tecnología Industrial; Argentina
Fil: Palumbo, Félix Roberto Mario. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Alurralde, Martín Alejo. Comisión Nacional de Energía Atómica; Argentina
description Considerable effort has gone into the study of the failure mechanisms and reliability of micro-electro-mechanical-systems (MEMS) to extend its use to critical areas. In this paper a prototype of SOI microrelays is evaluated for space applications. The MEMS devices are subjected to uniform proton beam of 10MeV, while its response is monitored by electrical characteristics for successive irradiation pulses. Although the system shows a significant increase of positive trapped charge, it has not been found any limitation on the functionality based in the main parameters such as the actuation voltage, the leakage currents, and conduction mechanism of the switch.
publishDate 2009
dc.date.none.fl_str_mv 2009-08
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/63068
Lozano, Alex; Palumbo, Félix Roberto Mario; Alurralde, Martín Alejo; Radiation effects on SOI microrelays for space applications; The Electrochemical Society; ECS Transactions; 23; 1; 8-2009; 279-285
1938-6737
CONICET Digital
CONICET
url http://hdl.handle.net/11336/63068
identifier_str_mv Lozano, Alex; Palumbo, Félix Roberto Mario; Alurralde, Martín Alejo; Radiation effects on SOI microrelays for space applications; The Electrochemical Society; ECS Transactions; 23; 1; 8-2009; 279-285
1938-6737
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1149/1.3183730
info:eu-repo/semantics/altIdentifier/url/http://ecst.ecsdl.org/content/23/1/279.abstract
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv The Electrochemical Society
publisher.none.fl_str_mv The Electrochemical Society
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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