Numerical and experimental study of stochastic resistive switching
- Autores
- Patterson, Germán Agustín; Fierens, Pablo Ignacio; García, A. A.; Grosz, Diego Fernando
- Año de publicación
- 2013
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- In this paper we study the role of noise in the context of resistive switching phenomena by means of experiments and numerical simulations. Experiments are conducted on a manganite sample. We show that the addition of external Gaussian noise to a small amplitude driving signal yields a contrast ratio between low- and high-resistance states, comparable to that obtained by the application of a large amplitude noiseless signal. Furthermore, excellent agreement between numerical simulation and measurement allows us to study resistive switching under varying input conditions and, thus, properly characterize the beneficial role of noise. We believe these results might be of relevance in the area of memory devices where the large scale of electronic integration renders the presence of noise unavoidable. © 2013 American Physical Society.
Fil: Patterson, Germán Agustín. Instituto Tecnológico de Buenos Aires; Argentina
Fil: Fierens, Pablo Ignacio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; Argentina
Fil: García, A. A.. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina
Fil: Grosz, Diego Fernando. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; Argentina - Materia
-
Stochastic
Resistive
Switching
Memristors - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/77855
Ver los metadatos del registro completo
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Numerical and experimental study of stochastic resistive switchingPatterson, Germán AgustínFierens, Pablo IgnacioGarcía, A. A.Grosz, Diego FernandoStochasticResistiveSwitchingMemristorshttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1In this paper we study the role of noise in the context of resistive switching phenomena by means of experiments and numerical simulations. Experiments are conducted on a manganite sample. We show that the addition of external Gaussian noise to a small amplitude driving signal yields a contrast ratio between low- and high-resistance states, comparable to that obtained by the application of a large amplitude noiseless signal. Furthermore, excellent agreement between numerical simulation and measurement allows us to study resistive switching under varying input conditions and, thus, properly characterize the beneficial role of noise. We believe these results might be of relevance in the area of memory devices where the large scale of electronic integration renders the presence of noise unavoidable. © 2013 American Physical Society.Fil: Patterson, Germán Agustín. Instituto Tecnológico de Buenos Aires; ArgentinaFil: Fierens, Pablo Ignacio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; ArgentinaFil: García, A. A.. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; ArgentinaFil: Grosz, Diego Fernando. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; ArgentinaAmerican Physical Society2013-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/77855Patterson, Germán Agustín; Fierens, Pablo Ignacio; García, A. A.; Grosz, Diego Fernando; Numerical and experimental study of stochastic resistive switching; American Physical Society; Physical Review E: Statistical, Nonlinear and Soft Matter Physics; 87; 1; 1-2013; 1-41539-3755CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevE.87.012128info:eu-repo/semantics/altIdentifier/url/https://journals.aps.org/pre/abstract/10.1103/PhysRevE.87.012128info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T10:05:58Zoai:ri.conicet.gov.ar:11336/77855instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 10:05:58.892CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Numerical and experimental study of stochastic resistive switching |
title |
Numerical and experimental study of stochastic resistive switching |
spellingShingle |
Numerical and experimental study of stochastic resistive switching Patterson, Germán Agustín Stochastic Resistive Switching Memristors |
title_short |
Numerical and experimental study of stochastic resistive switching |
title_full |
Numerical and experimental study of stochastic resistive switching |
title_fullStr |
Numerical and experimental study of stochastic resistive switching |
title_full_unstemmed |
Numerical and experimental study of stochastic resistive switching |
title_sort |
Numerical and experimental study of stochastic resistive switching |
dc.creator.none.fl_str_mv |
Patterson, Germán Agustín Fierens, Pablo Ignacio García, A. A. Grosz, Diego Fernando |
author |
Patterson, Germán Agustín |
author_facet |
Patterson, Germán Agustín Fierens, Pablo Ignacio García, A. A. Grosz, Diego Fernando |
author_role |
author |
author2 |
Fierens, Pablo Ignacio García, A. A. Grosz, Diego Fernando |
author2_role |
author author author |
dc.subject.none.fl_str_mv |
Stochastic Resistive Switching Memristors |
topic |
Stochastic Resistive Switching Memristors |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
In this paper we study the role of noise in the context of resistive switching phenomena by means of experiments and numerical simulations. Experiments are conducted on a manganite sample. We show that the addition of external Gaussian noise to a small amplitude driving signal yields a contrast ratio between low- and high-resistance states, comparable to that obtained by the application of a large amplitude noiseless signal. Furthermore, excellent agreement between numerical simulation and measurement allows us to study resistive switching under varying input conditions and, thus, properly characterize the beneficial role of noise. We believe these results might be of relevance in the area of memory devices where the large scale of electronic integration renders the presence of noise unavoidable. © 2013 American Physical Society. Fil: Patterson, Germán Agustín. Instituto Tecnológico de Buenos Aires; Argentina Fil: Fierens, Pablo Ignacio. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; Argentina Fil: García, A. A.. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina Fil: Grosz, Diego Fernando. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Instituto Tecnológico de Buenos Aires; Argentina |
description |
In this paper we study the role of noise in the context of resistive switching phenomena by means of experiments and numerical simulations. Experiments are conducted on a manganite sample. We show that the addition of external Gaussian noise to a small amplitude driving signal yields a contrast ratio between low- and high-resistance states, comparable to that obtained by the application of a large amplitude noiseless signal. Furthermore, excellent agreement between numerical simulation and measurement allows us to study resistive switching under varying input conditions and, thus, properly characterize the beneficial role of noise. We believe these results might be of relevance in the area of memory devices where the large scale of electronic integration renders the presence of noise unavoidable. © 2013 American Physical Society. |
publishDate |
2013 |
dc.date.none.fl_str_mv |
2013-01 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/77855 Patterson, Germán Agustín; Fierens, Pablo Ignacio; García, A. A.; Grosz, Diego Fernando; Numerical and experimental study of stochastic resistive switching; American Physical Society; Physical Review E: Statistical, Nonlinear and Soft Matter Physics; 87; 1; 1-2013; 1-4 1539-3755 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/77855 |
identifier_str_mv |
Patterson, Germán Agustín; Fierens, Pablo Ignacio; García, A. A.; Grosz, Diego Fernando; Numerical and experimental study of stochastic resistive switching; American Physical Society; Physical Review E: Statistical, Nonlinear and Soft Matter Physics; 87; 1; 1-2013; 1-4 1539-3755 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevE.87.012128 info:eu-repo/semantics/altIdentifier/url/https://journals.aps.org/pre/abstract/10.1103/PhysRevE.87.012128 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
American Physical Society |
publisher.none.fl_str_mv |
American Physical Society |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) |
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CONICET Digital (CONICET) |
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Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
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dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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13.070432 |