High resolution X-Ray diffraction analysis of InGaAs/InP superlattices

Autores
Cornet, D. M.; LaPierre, R. R; Pusep, Yu A.; Comedi, David Mario
Año de publicación
2006
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The interfacial properties of lattice-matched InGaAs/InP superlattice (SL) structures grown by gas source molecular beam epitaxy were investigated by high resolution x-ray diffraction (HRXRD). SLs with various periods were grown to determine the contributions of the interface layers to the structural properties of the SLs. The HRXRD curves exhibited a number of features indicative of interfacial layers, including weak even-order satellite peaks, and a zero-order diffraction peak that shifted toward lower diffraction angles with decreasing SL period. A detailed structural model is proposed to explain these observations, consisting of strained InAsP and InGaAsP monolayers due to the group-V gas switching and atomic exchange at the SL interfaces.
Fil: Cornet, D. M.. Mc Master University; Canadá
Fil: LaPierre, R. R. Mc Master University; Canadá
Fil: Pusep, Yu A.. Universidade de São Paulo; Brasil
Fil: Comedi, David Mario. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina
Materia
InGaAs/InP
superlattice
X-ray diffraction
InGaAsP
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/85672
Acceder
id CONICETDig_9bd3a05b9455c86cfaed2fca333bc7cf
oai_identifier_str oai:ri.conicet.gov.ar:11336/85672
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling High resolution X-Ray diffraction analysis of InGaAs/InP superlatticesCornet, D. M.LaPierre, R. RPusep, Yu A.Comedi, David MarioInGaAs/InPsuperlatticeX-ray diffractionInGaAsPhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1The interfacial properties of lattice-matched InGaAs/InP superlattice (SL) structures grown by gas source molecular beam epitaxy were investigated by high resolution x-ray diffraction (HRXRD). SLs with various periods were grown to determine the contributions of the interface layers to the structural properties of the SLs. The HRXRD curves exhibited a number of features indicative of interfacial layers, including weak even-order satellite peaks, and a zero-order diffraction peak that shifted toward lower diffraction angles with decreasing SL period. A detailed structural model is proposed to explain these observations, consisting of strained InAsP and InGaAsP monolayers due to the group-V gas switching and atomic exchange at the SL interfaces.Fil: Cornet, D. M.. Mc Master University; CanadáFil: LaPierre, R. R. Mc Master University; CanadáFil: Pusep, Yu A.. Universidade de São Paulo; BrasilFil: Comedi, David Mario. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; ArgentinaAmerican Institute of Physics2006-12info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/85672Cornet, D. M.; LaPierre, R. R; Pusep, Yu A.; Comedi, David Mario; High resolution X-Ray diffraction analysis of InGaAs/InP superlattices; American Institute of Physics; Journal of Applied Physics; 100; 12-2006; 1-60021-8979CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1063/1.2335689info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.2335689info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T10:08:47Zoai:ri.conicet.gov.ar:11336/85672instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 10:08:47.922CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
title High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
spellingShingle High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
Cornet, D. M.
InGaAs/InP
superlattice
X-ray diffraction
InGaAsP
title_short High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
title_full High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
title_fullStr High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
title_full_unstemmed High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
title_sort High resolution X-Ray diffraction analysis of InGaAs/InP superlattices
dc.creator.none.fl_str_mv Cornet, D. M.
LaPierre, R. R
Pusep, Yu A.
Comedi, David Mario
author Cornet, D. M.
author_facet Cornet, D. M.
LaPierre, R. R
Pusep, Yu A.
Comedi, David Mario
author_role author
author2 LaPierre, R. R
Pusep, Yu A.
Comedi, David Mario
author2_role author
author
author
dc.subject.none.fl_str_mv InGaAs/InP
superlattice
X-ray diffraction
InGaAsP
topic InGaAs/InP
superlattice
X-ray diffraction
InGaAsP
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The interfacial properties of lattice-matched InGaAs/InP superlattice (SL) structures grown by gas source molecular beam epitaxy were investigated by high resolution x-ray diffraction (HRXRD). SLs with various periods were grown to determine the contributions of the interface layers to the structural properties of the SLs. The HRXRD curves exhibited a number of features indicative of interfacial layers, including weak even-order satellite peaks, and a zero-order diffraction peak that shifted toward lower diffraction angles with decreasing SL period. A detailed structural model is proposed to explain these observations, consisting of strained InAsP and InGaAsP monolayers due to the group-V gas switching and atomic exchange at the SL interfaces.
Fil: Cornet, D. M.. Mc Master University; Canadá
Fil: LaPierre, R. R. Mc Master University; Canadá
Fil: Pusep, Yu A.. Universidade de São Paulo; Brasil
Fil: Comedi, David Mario. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Sólido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Tucumán; Argentina
description The interfacial properties of lattice-matched InGaAs/InP superlattice (SL) structures grown by gas source molecular beam epitaxy were investigated by high resolution x-ray diffraction (HRXRD). SLs with various periods were grown to determine the contributions of the interface layers to the structural properties of the SLs. The HRXRD curves exhibited a number of features indicative of interfacial layers, including weak even-order satellite peaks, and a zero-order diffraction peak that shifted toward lower diffraction angles with decreasing SL period. A detailed structural model is proposed to explain these observations, consisting of strained InAsP and InGaAsP monolayers due to the group-V gas switching and atomic exchange at the SL interfaces.
publishDate 2006
dc.date.none.fl_str_mv 2006-12
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/85672
Cornet, D. M.; LaPierre, R. R; Pusep, Yu A.; Comedi, David Mario; High resolution X-Ray diffraction analysis of InGaAs/InP superlattices; American Institute of Physics; Journal of Applied Physics; 100; 12-2006; 1-6
0021-8979
CONICET Digital
CONICET
url http://hdl.handle.net/11336/85672
identifier_str_mv Cornet, D. M.; LaPierre, R. R; Pusep, Yu A.; Comedi, David Mario; High resolution X-Ray diffraction analysis of InGaAs/InP superlattices; American Institute of Physics; Journal of Applied Physics; 100; 12-2006; 1-6
0021-8979
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1063/1.2335689
info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.2335689
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1842270057480060928
score 13.13397

Publicaciones similares