Graphical analysis of current-voltage characteristics in memristive interfaces
- Autores
- Acha, Carlos Enrique
- Año de publicación
- 2017
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- A graphical representation of current-voltage (IV) measurements of typical memristive interfaces at constant temperature is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples where the IV characteristics were simulated in order to gain insight into the influence of the fitting parameters.
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina - Materia
-
Memorias Resistivas
Mecanismos de Conducción
Características Iv - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/52384
Ver los metadatos del registro completo
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Graphical analysis of current-voltage characteristics in memristive interfacesAcha, Carlos EnriqueMemorias ResistivasMecanismos de ConducciónCaracterísticas Ivhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1A graphical representation of current-voltage (IV) measurements of typical memristive interfaces at constant temperature is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples where the IV characteristics were simulated in order to gain insight into the influence of the fitting parameters.Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; ArgentinaAmerican Institute of Physics2017-04info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/52384Acha, Carlos Enrique; Graphical analysis of current-voltage characteristics in memristive interfaces; American Institute of Physics; Journal of Applied Physics; 121; 13; 4-2017; 134502,1-70021-8979CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1063/1.4979723info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-17T10:52:58Zoai:ri.conicet.gov.ar:11336/52384instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-17 10:52:58.625CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Graphical analysis of current-voltage characteristics in memristive interfaces |
title |
Graphical analysis of current-voltage characteristics in memristive interfaces |
spellingShingle |
Graphical analysis of current-voltage characteristics in memristive interfaces Acha, Carlos Enrique Memorias Resistivas Mecanismos de Conducción Características Iv |
title_short |
Graphical analysis of current-voltage characteristics in memristive interfaces |
title_full |
Graphical analysis of current-voltage characteristics in memristive interfaces |
title_fullStr |
Graphical analysis of current-voltage characteristics in memristive interfaces |
title_full_unstemmed |
Graphical analysis of current-voltage characteristics in memristive interfaces |
title_sort |
Graphical analysis of current-voltage characteristics in memristive interfaces |
dc.creator.none.fl_str_mv |
Acha, Carlos Enrique |
author |
Acha, Carlos Enrique |
author_facet |
Acha, Carlos Enrique |
author_role |
author |
dc.subject.none.fl_str_mv |
Memorias Resistivas Mecanismos de Conducción Características Iv |
topic |
Memorias Resistivas Mecanismos de Conducción Características Iv |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
A graphical representation of current-voltage (IV) measurements of typical memristive interfaces at constant temperature is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples where the IV characteristics were simulated in order to gain insight into the influence of the fitting parameters. Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina |
description |
A graphical representation of current-voltage (IV) measurements of typical memristive interfaces at constant temperature is presented. This is the starting point to extract relevant microscopic information of the parameters that control the electrical properties of a device based on a particular metal-oxide interface. The convenience of the method is illustrated presenting some examples where the IV characteristics were simulated in order to gain insight into the influence of the fitting parameters. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-04 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/52384 Acha, Carlos Enrique; Graphical analysis of current-voltage characteristics in memristive interfaces; American Institute of Physics; Journal of Applied Physics; 121; 13; 4-2017; 134502,1-7 0021-8979 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/52384 |
identifier_str_mv |
Acha, Carlos Enrique; Graphical analysis of current-voltage characteristics in memristive interfaces; American Institute of Physics; Journal of Applied Physics; 121; 13; 4-2017; 134502,1-7 0021-8979 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4979723 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
American Institute of Physics |
publisher.none.fl_str_mv |
American Institute of Physics |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1843606167699324928 |
score |
13.001348 |