Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices

Autores
Schulman, Alejandro Raúl; Lanosa, Leandro Federico; Acha, Carlos Enrique
Año de publicación
2015
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa2Cu3O7−δ (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels Et in the 0.06–0.11 eV range. Et remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime.
Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; Argentina
Fil: Lanosa, Leandro Federico. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; Argentina
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; Argentina
Materia
MEMORIAS RESISTIVAS
INTERFACES
CONDUCCIÓN ELÉCTRICA
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
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oai:ri.conicet.gov.ar:11336/46125
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repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devicesSchulman, Alejandro RaúlLanosa, Leandro FedericoAcha, Carlos EnriqueMEMORIAS RESISTIVASINTERFACESCONDUCCIÓN ELÉCTRICAhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa2Cu3O7−δ (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels Et in the 0.06–0.11 eV range. Et remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime.Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; ArgentinaFil: Lanosa, Leandro Federico. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; ArgentinaFil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; ArgentinaAmerican Institute of Physics2015-07info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/46125Schulman, Alejandro Raúl; Lanosa, Leandro Federico; Acha, Carlos Enrique; Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices; American Institute of Physics; Journal of Applied Physics; 118; 4; 7-2015; 445111-4451160021-8979CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.4927522info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4927522info:eu-repo/semantics/altIdentifier/url/https://arxiv.org/abs/1505.05813info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T14:30:02Zoai:ri.conicet.gov.ar:11336/46125instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 14:30:03.136CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
title Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
spellingShingle Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
Schulman, Alejandro Raúl
MEMORIAS RESISTIVAS
INTERFACES
CONDUCCIÓN ELÉCTRICA
title_short Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
title_full Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
title_fullStr Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
title_full_unstemmed Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
title_sort Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices
dc.creator.none.fl_str_mv Schulman, Alejandro Raúl
Lanosa, Leandro Federico
Acha, Carlos Enrique
author Schulman, Alejandro Raúl
author_facet Schulman, Alejandro Raúl
Lanosa, Leandro Federico
Acha, Carlos Enrique
author_role author
author2 Lanosa, Leandro Federico
Acha, Carlos Enrique
author2_role author
author
dc.subject.none.fl_str_mv MEMORIAS RESISTIVAS
INTERFACES
CONDUCCIÓN ELÉCTRICA
topic MEMORIAS RESISTIVAS
INTERFACES
CONDUCCIÓN ELÉCTRICA
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa2Cu3O7−δ (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels Et in the 0.06–0.11 eV range. Et remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime.
Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; Argentina
Fil: Lanosa, Leandro Federico. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; Argentina
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Física. Laboratorio de Física de Bajas Temperaturas; Argentina
description Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [R(T)] of Au/YBa2Cu3O7−δ (optimally doped YBCO) interfaces have been studied at different resistance states. These states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the R(T) dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels Et in the 0.06–0.11 eV range. Et remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with a further increase in the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level, and the temperature range determine an electrical conduction dominated by non-linear effects, either in a P-F emission or in a variable-range hopping regime.
publishDate 2015
dc.date.none.fl_str_mv 2015-07
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/46125
Schulman, Alejandro Raúl; Lanosa, Leandro Federico; Acha, Carlos Enrique; Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices; American Institute of Physics; Journal of Applied Physics; 118; 4; 7-2015; 445111-445116
0021-8979
CONICET Digital
CONICET
url http://hdl.handle.net/11336/46125
identifier_str_mv Schulman, Alejandro Raúl; Lanosa, Leandro Federico; Acha, Carlos Enrique; Poole-Frenkel effect and variable-range hopping conduction in metal/YBCO resistive switching devices; American Institute of Physics; Journal of Applied Physics; 118; 4; 7-2015; 445111-445116
0021-8979
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/10.1063/1.4927522
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4927522
info:eu-repo/semantics/altIdentifier/url/https://arxiv.org/abs/1505.05813
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.22299

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