ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations
- Autores
- Gilabert, Ulises Eduardo; Heredia, Eduardo Armando; Trigubo, Alicia Beatriz
- Año de publicación
- 2006
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Epitaxial films of Hg1-xCdxTe (MCT) with x≅0.2 were grown on CdTe, Cd0.96Zn0.04Te and CdTe0.96Se0.04 substrates by the isothermal vapor phase epitaxy (ISOVPE) technique with no mercury overpressure. The growth was accomplished in different crystallographic orientations: (1 1 1)Cd, (1 1 1)Te, (1 1 0) and (1 0 0). The structural characterization of substrates and films was performed by X-ray diffraction (Laue technique), surface chemical etching and optical microscopy. Chemical composition analysis was performed by an electronic microprobe in the wavelength dispersive spectroscopic mode and electrical characterization by Hall effect measurements. MCT is an important semiconductor for the manufacture of infrared detectors. The alloyed substrates have a closer lattice match with Hg1-xCdxTe. Furthermore, these substrates usually have a lower dislocation density. Both facts determine a lower generation of lineal defects during growth. This fact could produce a larger carrier lifetime and, as a consequence, better electrical properties of devices. On the other hand the surface morphology of ISOVPE MCT epitaxial films only depends on the crystallographic orientation, being independent of the use of pure or alloyed substrates.
Fil: Gilabert, Ulises Eduardo. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires; Argentina. Secretaría de Industria y Minería. Servicio Geológico Minero Argentino; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Heredia, Eduardo Armando. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas. Centro de Investigaciones en Sólidos; Argentina
Fil: Trigubo, Alicia Beatriz. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas. Centro de Investigaciones en Sólidos; Argentina. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires; Argentina - Materia
-
A1. Characterization
A1. Etching
A1. Line Defects
A1. Substrates
A3. Vapor Phase Epitaxy
B2. Semiconducting Ii-Vi Materials - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/82212
Ver los metadatos del registro completo
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ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientationsGilabert, Ulises EduardoHeredia, Eduardo ArmandoTrigubo, Alicia BeatrizA1. CharacterizationA1. EtchingA1. Line DefectsA1. SubstratesA3. Vapor Phase EpitaxyB2. Semiconducting Ii-Vi Materialshttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Epitaxial films of Hg1-xCdxTe (MCT) with x≅0.2 were grown on CdTe, Cd0.96Zn0.04Te and CdTe0.96Se0.04 substrates by the isothermal vapor phase epitaxy (ISOVPE) technique with no mercury overpressure. The growth was accomplished in different crystallographic orientations: (1 1 1)Cd, (1 1 1)Te, (1 1 0) and (1 0 0). The structural characterization of substrates and films was performed by X-ray diffraction (Laue technique), surface chemical etching and optical microscopy. Chemical composition analysis was performed by an electronic microprobe in the wavelength dispersive spectroscopic mode and electrical characterization by Hall effect measurements. MCT is an important semiconductor for the manufacture of infrared detectors. The alloyed substrates have a closer lattice match with Hg1-xCdxTe. Furthermore, these substrates usually have a lower dislocation density. Both facts determine a lower generation of lineal defects during growth. This fact could produce a larger carrier lifetime and, as a consequence, better electrical properties of devices. On the other hand the surface morphology of ISOVPE MCT epitaxial films only depends on the crystallographic orientation, being independent of the use of pure or alloyed substrates.Fil: Gilabert, Ulises Eduardo. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires; Argentina. Secretaría de Industria y Minería. Servicio Geológico Minero Argentino; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Heredia, Eduardo Armando. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas. Centro de Investigaciones en Sólidos; ArgentinaFil: Trigubo, Alicia Beatriz. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas. Centro de Investigaciones en Sólidos; Argentina. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires; ArgentinaElsevier Science2006-09info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/82212Gilabert, Ulises Eduardo; Heredia, Eduardo Armando; Trigubo, Alicia Beatriz; ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations; Elsevier Science; Journal of Crystal Growth; 295; 1; 9-2006; 1-60022-0248CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0022024806007366info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jcrysgro.2006.07.015info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T10:14:21Zoai:ri.conicet.gov.ar:11336/82212instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 10:14:22.11CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
title |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
spellingShingle |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations Gilabert, Ulises Eduardo A1. Characterization A1. Etching A1. Line Defects A1. Substrates A3. Vapor Phase Epitaxy B2. Semiconducting Ii-Vi Materials |
title_short |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
title_full |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
title_fullStr |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
title_full_unstemmed |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
title_sort |
ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations |
dc.creator.none.fl_str_mv |
Gilabert, Ulises Eduardo Heredia, Eduardo Armando Trigubo, Alicia Beatriz |
author |
Gilabert, Ulises Eduardo |
author_facet |
Gilabert, Ulises Eduardo Heredia, Eduardo Armando Trigubo, Alicia Beatriz |
author_role |
author |
author2 |
Heredia, Eduardo Armando Trigubo, Alicia Beatriz |
author2_role |
author author |
dc.subject.none.fl_str_mv |
A1. Characterization A1. Etching A1. Line Defects A1. Substrates A3. Vapor Phase Epitaxy B2. Semiconducting Ii-Vi Materials |
topic |
A1. Characterization A1. Etching A1. Line Defects A1. Substrates A3. Vapor Phase Epitaxy B2. Semiconducting Ii-Vi Materials |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
Epitaxial films of Hg1-xCdxTe (MCT) with x≅0.2 were grown on CdTe, Cd0.96Zn0.04Te and CdTe0.96Se0.04 substrates by the isothermal vapor phase epitaxy (ISOVPE) technique with no mercury overpressure. The growth was accomplished in different crystallographic orientations: (1 1 1)Cd, (1 1 1)Te, (1 1 0) and (1 0 0). The structural characterization of substrates and films was performed by X-ray diffraction (Laue technique), surface chemical etching and optical microscopy. Chemical composition analysis was performed by an electronic microprobe in the wavelength dispersive spectroscopic mode and electrical characterization by Hall effect measurements. MCT is an important semiconductor for the manufacture of infrared detectors. The alloyed substrates have a closer lattice match with Hg1-xCdxTe. Furthermore, these substrates usually have a lower dislocation density. Both facts determine a lower generation of lineal defects during growth. This fact could produce a larger carrier lifetime and, as a consequence, better electrical properties of devices. On the other hand the surface morphology of ISOVPE MCT epitaxial films only depends on the crystallographic orientation, being independent of the use of pure or alloyed substrates. Fil: Gilabert, Ulises Eduardo. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires; Argentina. Secretaría de Industria y Minería. Servicio Geológico Minero Argentino; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina Fil: Heredia, Eduardo Armando. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas. Centro de Investigaciones en Sólidos; Argentina Fil: Trigubo, Alicia Beatriz. Consejo Nacional de Investigaciones Científicas y Técnicas. Instituto de Investigaciones Científicas y Técnicas de las Fuerzas Armadas. Centro de Investigaciones en Sólidos; Argentina. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires; Argentina |
description |
Epitaxial films of Hg1-xCdxTe (MCT) with x≅0.2 were grown on CdTe, Cd0.96Zn0.04Te and CdTe0.96Se0.04 substrates by the isothermal vapor phase epitaxy (ISOVPE) technique with no mercury overpressure. The growth was accomplished in different crystallographic orientations: (1 1 1)Cd, (1 1 1)Te, (1 1 0) and (1 0 0). The structural characterization of substrates and films was performed by X-ray diffraction (Laue technique), surface chemical etching and optical microscopy. Chemical composition analysis was performed by an electronic microprobe in the wavelength dispersive spectroscopic mode and electrical characterization by Hall effect measurements. MCT is an important semiconductor for the manufacture of infrared detectors. The alloyed substrates have a closer lattice match with Hg1-xCdxTe. Furthermore, these substrates usually have a lower dislocation density. Both facts determine a lower generation of lineal defects during growth. This fact could produce a larger carrier lifetime and, as a consequence, better electrical properties of devices. On the other hand the surface morphology of ISOVPE MCT epitaxial films only depends on the crystallographic orientation, being independent of the use of pure or alloyed substrates. |
publishDate |
2006 |
dc.date.none.fl_str_mv |
2006-09 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/82212 Gilabert, Ulises Eduardo; Heredia, Eduardo Armando; Trigubo, Alicia Beatriz; ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations; Elsevier Science; Journal of Crystal Growth; 295; 1; 9-2006; 1-6 0022-0248 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/82212 |
identifier_str_mv |
Gilabert, Ulises Eduardo; Heredia, Eduardo Armando; Trigubo, Alicia Beatriz; ISOVPE MCT films grown on pure and alloyed CdTe substrates with different crystalline orientations; Elsevier Science; Journal of Crystal Growth; 295; 1; 9-2006; 1-6 0022-0248 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0022024806007366 info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jcrysgro.2006.07.015 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier Science |
publisher.none.fl_str_mv |
Elsevier Science |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1844614069964767232 |
score |
13.070432 |