Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films

Autores
Reyes Tolosa, María Dolores; Alajami, Mutaz; Montero Reguera, A. E.; Damonte, Laura Cristina; Hernández Fenollosa, María de los Ángeles
Año de publicación
2019
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The quality and properties of electrodeposited nanostructured ZnO flms are improved when they are deposited on a crystal lattice-matching substrate. To this end, a highly conductive indium tin oxide substrate is covered with an interlayer of ZnO using direct-current magnetron sputtering. In this manuscript, we describe the efect of this interlayer on the morphological and optical properties of several nanostructured ZnO flms grown by diferent electrodeposition methods. The thickness of the ZnO interlayer was varied starting from ultrathin layers of 10 nm all the way up to 230 nm as determined by ellipsometry. The structural and optical properties of the nanostructured ZnO flms deposited on top of these interlayers were characterized using feld emission scanning electron microscopy (FESEM), atomic force microscopy and UV–visible spectroscopy. Optimum properties of the nanostructured ZnO flms for application in thin-flm optoelectronic devices are obtained when the ZnO interlayer has a thickness of approximately 45 nm. This is the case for all the electrodeposition methods used in this work.
Fil: Reyes Tolosa, María Dolores. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Alajami, Mutaz. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Montero Reguera, A. E.. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Damonte, Laura Cristina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; Argentina
Fil: Hernández Fenollosa, María de los Ángeles. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Materia
ZNO FILMS
ELECTRODEPOSITION
NANOSTRUCTURES
OPTICAL PROPERTIES
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/121779
Acceder
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network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured filmsReyes Tolosa, María DoloresAlajami, MutazMontero Reguera, A. E.Damonte, Laura CristinaHernández Fenollosa, María de los ÁngelesZNO FILMSELECTRODEPOSITIONNANOSTRUCTURESOPTICAL PROPERTIEShttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1The quality and properties of electrodeposited nanostructured ZnO flms are improved when they are deposited on a crystal lattice-matching substrate. To this end, a highly conductive indium tin oxide substrate is covered with an interlayer of ZnO using direct-current magnetron sputtering. In this manuscript, we describe the efect of this interlayer on the morphological and optical properties of several nanostructured ZnO flms grown by diferent electrodeposition methods. The thickness of the ZnO interlayer was varied starting from ultrathin layers of 10 nm all the way up to 230 nm as determined by ellipsometry. The structural and optical properties of the nanostructured ZnO flms deposited on top of these interlayers were characterized using feld emission scanning electron microscopy (FESEM), atomic force microscopy and UV–visible spectroscopy. Optimum properties of the nanostructured ZnO flms for application in thin-flm optoelectronic devices are obtained when the ZnO interlayer has a thickness of approximately 45 nm. This is the case for all the electrodeposition methods used in this work.Fil: Reyes Tolosa, María Dolores. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; EspañaFil: Alajami, Mutaz. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; EspañaFil: Montero Reguera, A. E.. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; EspañaFil: Damonte, Laura Cristina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; ArgentinaFil: Hernández Fenollosa, María de los Ángeles. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; EspañaSpringer2019-09-20info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/121779Reyes Tolosa, María Dolores; Alajami, Mutaz; Montero Reguera, A. E.; Damonte, Laura Cristina; Hernández Fenollosa, María de los Ángeles; Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films; Springer; SN Applied Sciences; 1; 1245; 20-9-2019; 1-92523-39712523-3963CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://link.springer.com/10.1007/s42452-019-1293-7info:eu-repo/semantics/altIdentifier/doi/10.1007/s42452-019-1293-7info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:49:43Zoai:ri.conicet.gov.ar:11336/121779instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:49:43.543CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
title Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
spellingShingle Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
Reyes Tolosa, María Dolores
ZNO FILMS
ELECTRODEPOSITION
NANOSTRUCTURES
OPTICAL PROPERTIES
title_short Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
title_full Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
title_fullStr Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
title_full_unstemmed Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
title_sort Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films
dc.creator.none.fl_str_mv Reyes Tolosa, María Dolores
Alajami, Mutaz
Montero Reguera, A. E.
Damonte, Laura Cristina
Hernández Fenollosa, María de los Ángeles
author Reyes Tolosa, María Dolores
author_facet Reyes Tolosa, María Dolores
Alajami, Mutaz
Montero Reguera, A. E.
Damonte, Laura Cristina
Hernández Fenollosa, María de los Ángeles
author_role author
author2 Alajami, Mutaz
Montero Reguera, A. E.
Damonte, Laura Cristina
Hernández Fenollosa, María de los Ángeles
author2_role author
author
author
author
dc.subject.none.fl_str_mv ZNO FILMS
ELECTRODEPOSITION
NANOSTRUCTURES
OPTICAL PROPERTIES
topic ZNO FILMS
ELECTRODEPOSITION
NANOSTRUCTURES
OPTICAL PROPERTIES
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The quality and properties of electrodeposited nanostructured ZnO flms are improved when they are deposited on a crystal lattice-matching substrate. To this end, a highly conductive indium tin oxide substrate is covered with an interlayer of ZnO using direct-current magnetron sputtering. In this manuscript, we describe the efect of this interlayer on the morphological and optical properties of several nanostructured ZnO flms grown by diferent electrodeposition methods. The thickness of the ZnO interlayer was varied starting from ultrathin layers of 10 nm all the way up to 230 nm as determined by ellipsometry. The structural and optical properties of the nanostructured ZnO flms deposited on top of these interlayers were characterized using feld emission scanning electron microscopy (FESEM), atomic force microscopy and UV–visible spectroscopy. Optimum properties of the nanostructured ZnO flms for application in thin-flm optoelectronic devices are obtained when the ZnO interlayer has a thickness of approximately 45 nm. This is the case for all the electrodeposition methods used in this work.
Fil: Reyes Tolosa, María Dolores. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Alajami, Mutaz. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Montero Reguera, A. E.. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Damonte, Laura Cristina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; Argentina
Fil: Hernández Fenollosa, María de los Ángeles. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
description The quality and properties of electrodeposited nanostructured ZnO flms are improved when they are deposited on a crystal lattice-matching substrate. To this end, a highly conductive indium tin oxide substrate is covered with an interlayer of ZnO using direct-current magnetron sputtering. In this manuscript, we describe the efect of this interlayer on the morphological and optical properties of several nanostructured ZnO flms grown by diferent electrodeposition methods. The thickness of the ZnO interlayer was varied starting from ultrathin layers of 10 nm all the way up to 230 nm as determined by ellipsometry. The structural and optical properties of the nanostructured ZnO flms deposited on top of these interlayers were characterized using feld emission scanning electron microscopy (FESEM), atomic force microscopy and UV–visible spectroscopy. Optimum properties of the nanostructured ZnO flms for application in thin-flm optoelectronic devices are obtained when the ZnO interlayer has a thickness of approximately 45 nm. This is the case for all the electrodeposition methods used in this work.
publishDate 2019
dc.date.none.fl_str_mv 2019-09-20
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/121779
Reyes Tolosa, María Dolores; Alajami, Mutaz; Montero Reguera, A. E.; Damonte, Laura Cristina; Hernández Fenollosa, María de los Ángeles; Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films; Springer; SN Applied Sciences; 1; 1245; 20-9-2019; 1-9
2523-3971
2523-3963
CONICET Digital
CONICET
url http://hdl.handle.net/11336/121779
identifier_str_mv Reyes Tolosa, María Dolores; Alajami, Mutaz; Montero Reguera, A. E.; Damonte, Laura Cristina; Hernández Fenollosa, María de los Ángeles; Influence of seed layer thickness on properties of electrodeposited ZnO nanostructured films; Springer; SN Applied Sciences; 1; 1245; 20-9-2019; 1-9
2523-3971
2523-3963
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://link.springer.com/10.1007/s42452-019-1293-7
info:eu-repo/semantics/altIdentifier/doi/10.1007/s42452-019-1293-7
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Springer
publisher.none.fl_str_mv Springer
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.13397

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