ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition
- Autores
- Reyes Tolosa, M. D.; Orozco-Messana, Javier; Damonte, Laura Cristina; Hernández-Fenollosa, M. A.
- Año de publicación
- 2011
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- The fabrication of nanostructured ZnO thin films is a critic process for a lot of applications of this semiconductor material. The final properties of this film depend fundamentally of the morphology of the sintered layer. In this paper a process is presented for the fabrication of ZnO nanostructured layers with morphology control by pulsed electrodeposition over ITO. Process optimization is achieved by pulsed electrodeposition and results are assessed after a careful characterization of both morphology and electrical properties. SEM is used for nucleation analysis on pulsed deposited samples. Optical properties like transmission spectra and Indirect Optical Band Gap are used to evaluate the quality of the obtained ZnO structures.
Facultad de Ciencias Exactas - Materia
-
Ciencias Exactas
Física
nanostructured ZnO thin films
pulsed electrodeposition - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- http://creativecommons.org/licenses/by-nc-sa/4.0/
- Repositorio
- Institución
- Universidad Nacional de La Plata
- OAI Identificador
- oai:sedici.unlp.edu.ar:10915/128578
Ver los metadatos del registro completo
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ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed ElectrodepositionReyes Tolosa, M. D.Orozco-Messana, JavierDamonte, Laura CristinaHernández-Fenollosa, M. A.Ciencias ExactasFísicananostructured ZnO thin filmspulsed electrodepositionThe fabrication of nanostructured ZnO thin films is a critic process for a lot of applications of this semiconductor material. The final properties of this film depend fundamentally of the morphology of the sintered layer. In this paper a process is presented for the fabrication of ZnO nanostructured layers with morphology control by pulsed electrodeposition over ITO. Process optimization is achieved by pulsed electrodeposition and results are assessed after a careful characterization of both morphology and electrical properties. SEM is used for nucleation analysis on pulsed deposited samples. Optical properties like transmission spectra and Indirect Optical Band Gap are used to evaluate the quality of the obtained ZnO structures.Facultad de Ciencias Exactas2011-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdf452-455http://sedici.unlp.edu.ar/handle/10915/128578enginfo:eu-repo/semantics/altIdentifier/issn/0013-4651info:eu-repo/semantics/altIdentifier/doi/10.1149/1.3593004info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-sa/4.0/Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-09-03T11:03:09Zoai:sedici.unlp.edu.ar:10915/128578Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-09-03 11:03:09.42SEDICI (UNLP) - Universidad Nacional de La Platafalse |
dc.title.none.fl_str_mv |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
title |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
spellingShingle |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition Reyes Tolosa, M. D. Ciencias Exactas Física nanostructured ZnO thin films pulsed electrodeposition |
title_short |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
title_full |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
title_fullStr |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
title_full_unstemmed |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
title_sort |
ZnO Nanoestructured Layers Processing with Morphology Control by Pulsed Electrodeposition |
dc.creator.none.fl_str_mv |
Reyes Tolosa, M. D. Orozco-Messana, Javier Damonte, Laura Cristina Hernández-Fenollosa, M. A. |
author |
Reyes Tolosa, M. D. |
author_facet |
Reyes Tolosa, M. D. Orozco-Messana, Javier Damonte, Laura Cristina Hernández-Fenollosa, M. A. |
author_role |
author |
author2 |
Orozco-Messana, Javier Damonte, Laura Cristina Hernández-Fenollosa, M. A. |
author2_role |
author author author |
dc.subject.none.fl_str_mv |
Ciencias Exactas Física nanostructured ZnO thin films pulsed electrodeposition |
topic |
Ciencias Exactas Física nanostructured ZnO thin films pulsed electrodeposition |
dc.description.none.fl_txt_mv |
The fabrication of nanostructured ZnO thin films is a critic process for a lot of applications of this semiconductor material. The final properties of this film depend fundamentally of the morphology of the sintered layer. In this paper a process is presented for the fabrication of ZnO nanostructured layers with morphology control by pulsed electrodeposition over ITO. Process optimization is achieved by pulsed electrodeposition and results are assessed after a careful characterization of both morphology and electrical properties. SEM is used for nucleation analysis on pulsed deposited samples. Optical properties like transmission spectra and Indirect Optical Band Gap are used to evaluate the quality of the obtained ZnO structures. Facultad de Ciencias Exactas |
description |
The fabrication of nanostructured ZnO thin films is a critic process for a lot of applications of this semiconductor material. The final properties of this film depend fundamentally of the morphology of the sintered layer. In this paper a process is presented for the fabrication of ZnO nanostructured layers with morphology control by pulsed electrodeposition over ITO. Process optimization is achieved by pulsed electrodeposition and results are assessed after a careful characterization of both morphology and electrical properties. SEM is used for nucleation analysis on pulsed deposited samples. Optical properties like transmission spectra and Indirect Optical Band Gap are used to evaluate the quality of the obtained ZnO structures. |
publishDate |
2011 |
dc.date.none.fl_str_mv |
2011-01 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Articulo http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://sedici.unlp.edu.ar/handle/10915/128578 |
url |
http://sedici.unlp.edu.ar/handle/10915/128578 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/issn/0013-4651 info:eu-repo/semantics/altIdentifier/doi/10.1149/1.3593004 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc-sa/4.0/ Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0) |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
http://creativecommons.org/licenses/by-nc-sa/4.0/ Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0) |
dc.format.none.fl_str_mv |
application/pdf 452-455 |
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