Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films

Autores
Bojorge, Claudia Daniela; Bianchetti, Mario Fidel; Canepa, Horacio Ricardo; Walsoe, Noemi Elizabeth
Año de publicación
2015
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
ZnO is a versatile material used in numerous applications, such as antireflective coatings, transparent electrodes for solar cells, gas sensors, varistors and electro and photoluminescent devices. One of the most important properties of ZnO is the photoconductivity in the UV, due to the band-gap energy. In this work, nanostructured pure and aluminium doped ZnO films were grown by sol-gel method. The precursor solutions were deposited with a different quantity of layers by spin-coating technique on SiO2 substrates. The films were characterized by X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM). Photoconductivity study of prepared films showed that layers also exhibit sensitivity in the visible spectrum besides a remarkable and usual sensitivity to UV. Performance of pure and doped ZnO films was compared. The UV sensitivity related to the film thickness was also studied.
Fil: Bojorge, Claudia Daniela. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Fil: Bianchetti, Mario Fidel. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Fil: Canepa, Horacio Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Fil: Walsoe, Noemi Elizabeth. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Materia
Zno
Nanostructured Films
Photoconductivity
Uv
Visible
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/44194
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/44194
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al FilmsBojorge, Claudia DanielaBianchetti, Mario FidelCanepa, Horacio RicardoWalsoe, Noemi ElizabethZnoNanostructured FilmsPhotoconductivityUvVisiblehttps://purl.org/becyt/ford/2.10https://purl.org/becyt/ford/2ZnO is a versatile material used in numerous applications, such as antireflective coatings, transparent electrodes for solar cells, gas sensors, varistors and electro and photoluminescent devices. One of the most important properties of ZnO is the photoconductivity in the UV, due to the band-gap energy. In this work, nanostructured pure and aluminium doped ZnO films were grown by sol-gel method. The precursor solutions were deposited with a different quantity of layers by spin-coating technique on SiO2 substrates. The films were characterized by X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM). Photoconductivity study of prepared films showed that layers also exhibit sensitivity in the visible spectrum besides a remarkable and usual sensitivity to UV. Performance of pure and doped ZnO films was compared. The UV sensitivity related to the film thickness was also studied.Fil: Bojorge, Claudia Daniela. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; ArgentinaFil: Bianchetti, Mario Fidel. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; ArgentinaFil: Canepa, Horacio Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; ArgentinaFil: Walsoe, Noemi Elizabeth. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; ArgentinaElsevier2015-07info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/44194Bojorge, Claudia Daniela; Bianchetti, Mario Fidel; Canepa, Horacio Ricardo; Walsoe, Noemi Elizabeth; Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films; Elsevier; Procedia Materials Science; 8; 7-2015; 623-6292211-8128CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.mspro.2015.04.117info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:56:38Zoai:ri.conicet.gov.ar:11336/44194instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:56:39.024CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
title Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
spellingShingle Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
Bojorge, Claudia Daniela
Zno
Nanostructured Films
Photoconductivity
Uv
Visible
title_short Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
title_full Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
title_fullStr Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
title_full_unstemmed Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
title_sort Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films
dc.creator.none.fl_str_mv Bojorge, Claudia Daniela
Bianchetti, Mario Fidel
Canepa, Horacio Ricardo
Walsoe, Noemi Elizabeth
author Bojorge, Claudia Daniela
author_facet Bojorge, Claudia Daniela
Bianchetti, Mario Fidel
Canepa, Horacio Ricardo
Walsoe, Noemi Elizabeth
author_role author
author2 Bianchetti, Mario Fidel
Canepa, Horacio Ricardo
Walsoe, Noemi Elizabeth
author2_role author
author
author
dc.subject.none.fl_str_mv Zno
Nanostructured Films
Photoconductivity
Uv
Visible
topic Zno
Nanostructured Films
Photoconductivity
Uv
Visible
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.10
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv ZnO is a versatile material used in numerous applications, such as antireflective coatings, transparent electrodes for solar cells, gas sensors, varistors and electro and photoluminescent devices. One of the most important properties of ZnO is the photoconductivity in the UV, due to the band-gap energy. In this work, nanostructured pure and aluminium doped ZnO films were grown by sol-gel method. The precursor solutions were deposited with a different quantity of layers by spin-coating technique on SiO2 substrates. The films were characterized by X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM). Photoconductivity study of prepared films showed that layers also exhibit sensitivity in the visible spectrum besides a remarkable and usual sensitivity to UV. Performance of pure and doped ZnO films was compared. The UV sensitivity related to the film thickness was also studied.
Fil: Bojorge, Claudia Daniela. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Fil: Bianchetti, Mario Fidel. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Fil: Canepa, Horacio Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
Fil: Walsoe, Noemi Elizabeth. Consejo Nacional de Investigaciones Científicas y Técnicas. Unidad de Investigación y Desarrollo Estratégico para la Defensa. Ministerio de Defensa. Unidad de Investigación y Desarrollo Estratégico para la Defensa; Argentina
description ZnO is a versatile material used in numerous applications, such as antireflective coatings, transparent electrodes for solar cells, gas sensors, varistors and electro and photoluminescent devices. One of the most important properties of ZnO is the photoconductivity in the UV, due to the band-gap energy. In this work, nanostructured pure and aluminium doped ZnO films were grown by sol-gel method. The precursor solutions were deposited with a different quantity of layers by spin-coating technique on SiO2 substrates. The films were characterized by X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM). Photoconductivity study of prepared films showed that layers also exhibit sensitivity in the visible spectrum besides a remarkable and usual sensitivity to UV. Performance of pure and doped ZnO films was compared. The UV sensitivity related to the film thickness was also studied.
publishDate 2015
dc.date.none.fl_str_mv 2015-07
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/44194
Bojorge, Claudia Daniela; Bianchetti, Mario Fidel; Canepa, Horacio Ricardo; Walsoe, Noemi Elizabeth; Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films; Elsevier; Procedia Materials Science; 8; 7-2015; 623-629
2211-8128
CONICET Digital
CONICET
url http://hdl.handle.net/11336/44194
identifier_str_mv Bojorge, Claudia Daniela; Bianchetti, Mario Fidel; Canepa, Horacio Ricardo; Walsoe, Noemi Elizabeth; Photoconductivity Measurements in Nanostructured ZnO and ZnO:Al Films; Elsevier; Procedia Materials Science; 8; 7-2015; 623-629
2211-8128
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mspro.2015.04.117
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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