Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct
- Autores
- Bermeo, Diego Fernando; Della Torre, H.; Kleiman, Ariel Javier; Minotti, Fernando Oscar; Marquez, Adriana Beatriz
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Nanostructured Ti films were obtained employing a cathodic arc with a straightmagnetic filter. The films were characterized using X-ray diffraction, scanning electron andatomic force microscopy. The films were found to be dense and with columnar grains,whose size increased with the exposure time. The number of macroparticles, the filmroughness and the deposition rate were also analyzed, and the latter compared with theresults of a fluid plasma model. Number of macroparticles and film roughness in sampleslocated ahead of the magnetic duct inlet were higher than those determined fromsamples placed inside the magnetic duct. The deposition rate depended on the axial andradial position inside the duct. The thickness along the radial position was more uniformfor samples located at axial positions near the filter extremes, but the mean depositionrate was lower at these positions. Measured and modeled deposition rates agreed reasonablywell.
Fil: Bermeo, Diego Fernando. Universidad Santiago de Cali; Colombia
Fil: Della Torre, H.. Universidad del Valle de Mexico; México
Fil: Kleiman, Ariel Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; Argentina
Fil: Minotti, Fernando Oscar. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; Argentina
Fil: Marquez, Adriana Beatriz. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; Argentina - Materia
-
CATHODIC ARC
TITANIUM
MAGNETIC DUCT
PLASMA - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/103204
Ver los metadatos del registro completo
id |
CONICETDig_5d8e21a421b0d4d2ea970d691838f6d7 |
---|---|
oai_identifier_str |
oai:ri.conicet.gov.ar:11336/103204 |
network_acronym_str |
CONICETDig |
repository_id_str |
3498 |
network_name_str |
CONICET Digital (CONICET) |
spelling |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic DuctBermeo, Diego FernandoDella Torre, H.Kleiman, Ariel JavierMinotti, Fernando OscarMarquez, Adriana BeatrizCATHODIC ARCTITANIUMMAGNETIC DUCTPLASMAhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Nanostructured Ti films were obtained employing a cathodic arc with a straightmagnetic filter. The films were characterized using X-ray diffraction, scanning electron andatomic force microscopy. The films were found to be dense and with columnar grains,whose size increased with the exposure time. The number of macroparticles, the filmroughness and the deposition rate were also analyzed, and the latter compared with theresults of a fluid plasma model. Number of macroparticles and film roughness in sampleslocated ahead of the magnetic duct inlet were higher than those determined fromsamples placed inside the magnetic duct. The deposition rate depended on the axial andradial position inside the duct. The thickness along the radial position was more uniformfor samples located at axial positions near the filter extremes, but the mean depositionrate was lower at these positions. Measured and modeled deposition rates agreed reasonablywell.Fil: Bermeo, Diego Fernando. Universidad Santiago de Cali; ColombiaFil: Della Torre, H.. Universidad del Valle de Mexico; MéxicoFil: Kleiman, Ariel Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; ArgentinaFil: Minotti, Fernando Oscar. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; ArgentinaFil: Marquez, Adriana Beatriz. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; ArgentinaIOP Publishing2014-05info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/103204Bermeo, Diego Fernando; Della Torre, H.; Kleiman, Ariel Javier; Minotti, Fernando Oscar; Marquez, Adriana Beatriz; Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct; IOP Publishing; Journal of Physics: Conference Series; 511; 5-20141742-6596CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://iopscience.iop.org/article/10.1088/1742-6596/511/1/012070info:eu-repo/semantics/altIdentifier/doi/10.1088/1742-6596/511/1/012070info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:44:54Zoai:ri.conicet.gov.ar:11336/103204instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:44:55.082CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
title |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
spellingShingle |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct Bermeo, Diego Fernando CATHODIC ARC TITANIUM MAGNETIC DUCT PLASMA |
title_short |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
title_full |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
title_fullStr |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
title_full_unstemmed |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
title_sort |
Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct |
dc.creator.none.fl_str_mv |
Bermeo, Diego Fernando Della Torre, H. Kleiman, Ariel Javier Minotti, Fernando Oscar Marquez, Adriana Beatriz |
author |
Bermeo, Diego Fernando |
author_facet |
Bermeo, Diego Fernando Della Torre, H. Kleiman, Ariel Javier Minotti, Fernando Oscar Marquez, Adriana Beatriz |
author_role |
author |
author2 |
Della Torre, H. Kleiman, Ariel Javier Minotti, Fernando Oscar Marquez, Adriana Beatriz |
author2_role |
author author author author |
dc.subject.none.fl_str_mv |
CATHODIC ARC TITANIUM MAGNETIC DUCT PLASMA |
topic |
CATHODIC ARC TITANIUM MAGNETIC DUCT PLASMA |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
Nanostructured Ti films were obtained employing a cathodic arc with a straightmagnetic filter. The films were characterized using X-ray diffraction, scanning electron andatomic force microscopy. The films were found to be dense and with columnar grains,whose size increased with the exposure time. The number of macroparticles, the filmroughness and the deposition rate were also analyzed, and the latter compared with theresults of a fluid plasma model. Number of macroparticles and film roughness in sampleslocated ahead of the magnetic duct inlet were higher than those determined fromsamples placed inside the magnetic duct. The deposition rate depended on the axial andradial position inside the duct. The thickness along the radial position was more uniformfor samples located at axial positions near the filter extremes, but the mean depositionrate was lower at these positions. Measured and modeled deposition rates agreed reasonablywell. Fil: Bermeo, Diego Fernando. Universidad Santiago de Cali; Colombia Fil: Della Torre, H.. Universidad del Valle de Mexico; México Fil: Kleiman, Ariel Javier. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; Argentina Fil: Minotti, Fernando Oscar. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; Argentina Fil: Marquez, Adriana Beatriz. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física del Plasma. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física del Plasma; Argentina |
description |
Nanostructured Ti films were obtained employing a cathodic arc with a straightmagnetic filter. The films were characterized using X-ray diffraction, scanning electron andatomic force microscopy. The films were found to be dense and with columnar grains,whose size increased with the exposure time. The number of macroparticles, the filmroughness and the deposition rate were also analyzed, and the latter compared with theresults of a fluid plasma model. Number of macroparticles and film roughness in sampleslocated ahead of the magnetic duct inlet were higher than those determined fromsamples placed inside the magnetic duct. The deposition rate depended on the axial andradial position inside the duct. The thickness along the radial position was more uniformfor samples located at axial positions near the filter extremes, but the mean depositionrate was lower at these positions. Measured and modeled deposition rates agreed reasonablywell. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-05 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/103204 Bermeo, Diego Fernando; Della Torre, H.; Kleiman, Ariel Javier; Minotti, Fernando Oscar; Marquez, Adriana Beatriz; Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct; IOP Publishing; Journal of Physics: Conference Series; 511; 5-2014 1742-6596 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/103204 |
identifier_str_mv |
Bermeo, Diego Fernando; Della Torre, H.; Kleiman, Ariel Javier; Minotti, Fernando Oscar; Marquez, Adriana Beatriz; Characterization of Titanium Films Deposited with a Cathodic Arc Using a Straight Magnetic Duct; IOP Publishing; Journal of Physics: Conference Series; 511; 5-2014 1742-6596 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/https://iopscience.iop.org/article/10.1088/1742-6596/511/1/012070 info:eu-repo/semantics/altIdentifier/doi/10.1088/1742-6596/511/1/012070 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
IOP Publishing |
publisher.none.fl_str_mv |
IOP Publishing |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
_version_ |
1842268697238962176 |
score |
13.13397 |