A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers

Autores
Laprovitta, Agustín; Peretti, Gabriela; Romero, Eduardo
Año de publicación
2011
Idioma
inglés
Tipo de recurso
documento de conferencia
Estado
versión publicada
Descripción
In this paper, we propose a built-in self-test (BIST) for the resistor array in an embedded analog configurable circuit (EACC) that is present in the Texas Instruments® MSP430 microcontrollers family. The EACC is formed also by an Operational Amplifier (OA) and interconnection resources. We focus in the resistor array test due to this section establishes the feedback path for the embedded OAs and set the gain value for the EACC closed-loop configurations. The test establishes, through very simple measurements, which combinations of the resistor ladder are available for the user by using only the resources embedded in the microcontroller. The experimental results show that the BIST proposed presents a very good repeatability in the measurements with very low dispersion, for one chip, for a sample of chips and under different temperature conditions. The error in the measurements, evaluated using a higher precision voltmeter, is also low. These results show that the BIST proposed is useful for testing the functionality of the resistor array in the EACC under test using a simple strategy at a very low cost.
Sociedad Argentina de Informática e Investigación Operativa
Materia
Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by-nc-sa/4.0/
Repositorio
SEDICI (UNLP)
Institución
Universidad Nacional de La Plata
OAI Identificador
oai:sedici.unlp.edu.ar:10915/125314
Acceder
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oai_identifier_str oai:sedici.unlp.edu.ar:10915/125314
network_acronym_str SEDICI
repository_id_str 1329
network_name_str SEDICI (UNLP)
spelling A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollersLaprovitta, AgustínPeretti, GabrielaRomero, EduardoCiencias Informáticasbuilt-in self-testmixed signal testingembedded analog testIn this paper, we propose a built-in self-test (BIST) for the resistor array in an embedded analog configurable circuit (EACC) that is present in the Texas Instruments® MSP430 microcontrollers family. The EACC is formed also by an Operational Amplifier (OA) and interconnection resources. We focus in the resistor array test due to this section establishes the feedback path for the embedded OAs and set the gain value for the EACC closed-loop configurations. The test establishes, through very simple measurements, which combinations of the resistor ladder are available for the user by using only the resources embedded in the microcontroller. The experimental results show that the BIST proposed presents a very good repeatability in the measurements with very low dispersion, for one chip, for a sample of chips and under different temperature conditions. The error in the measurements, evaluated using a higher precision voltmeter, is also low. These results show that the BIST proposed is useful for testing the functionality of the resistor array in the EACC under test using a simple strategy at a very low cost.Sociedad Argentina de Informática e Investigación Operativa2011-08info:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionObjeto de conferenciahttp://purl.org/coar/resource_type/c_5794info:ar-repo/semantics/documentoDeConferenciaapplication/pdf98-107http://sedici.unlp.edu.ar/handle/10915/125314enginfo:eu-repo/semantics/altIdentifier/issn/1850-2806info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-sa/4.0/Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-09-03T11:02:14Zoai:sedici.unlp.edu.ar:10915/125314Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-09-03 11:02:14.812SEDICI (UNLP) - Universidad Nacional de La Platafalse
dc.title.none.fl_str_mv A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
title A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
spellingShingle A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
Laprovitta, Agustín
Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
title_short A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
title_full A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
title_fullStr A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
title_full_unstemmed A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
title_sort A built-in self-test approach for the embedded resistor array in TI MSP430 microcontrollers
dc.creator.none.fl_str_mv Laprovitta, Agustín
Peretti, Gabriela
Romero, Eduardo
author Laprovitta, Agustín
author_facet Laprovitta, Agustín
Peretti, Gabriela
Romero, Eduardo
author_role author
author2 Peretti, Gabriela
Romero, Eduardo
author2_role author
author
dc.subject.none.fl_str_mv Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
topic Ciencias Informáticas
built-in self-test
mixed signal testing
embedded analog test
dc.description.none.fl_txt_mv In this paper, we propose a built-in self-test (BIST) for the resistor array in an embedded analog configurable circuit (EACC) that is present in the Texas Instruments® MSP430 microcontrollers family. The EACC is formed also by an Operational Amplifier (OA) and interconnection resources. We focus in the resistor array test due to this section establishes the feedback path for the embedded OAs and set the gain value for the EACC closed-loop configurations. The test establishes, through very simple measurements, which combinations of the resistor ladder are available for the user by using only the resources embedded in the microcontroller. The experimental results show that the BIST proposed presents a very good repeatability in the measurements with very low dispersion, for one chip, for a sample of chips and under different temperature conditions. The error in the measurements, evaluated using a higher precision voltmeter, is also low. These results show that the BIST proposed is useful for testing the functionality of the resistor array in the EACC under test using a simple strategy at a very low cost.
Sociedad Argentina de Informática e Investigación Operativa
description In this paper, we propose a built-in self-test (BIST) for the resistor array in an embedded analog configurable circuit (EACC) that is present in the Texas Instruments® MSP430 microcontrollers family. The EACC is formed also by an Operational Amplifier (OA) and interconnection resources. We focus in the resistor array test due to this section establishes the feedback path for the embedded OAs and set the gain value for the EACC closed-loop configurations. The test establishes, through very simple measurements, which combinations of the resistor ladder are available for the user by using only the resources embedded in the microcontroller. The experimental results show that the BIST proposed presents a very good repeatability in the measurements with very low dispersion, for one chip, for a sample of chips and under different temperature conditions. The error in the measurements, evaluated using a higher precision voltmeter, is also low. These results show that the BIST proposed is useful for testing the functionality of the resistor array in the EACC under test using a simple strategy at a very low cost.
publishDate 2011
dc.date.none.fl_str_mv 2011-08
dc.type.none.fl_str_mv info:eu-repo/semantics/conferenceObject
info:eu-repo/semantics/publishedVersion
Objeto de conferencia
http://purl.org/coar/resource_type/c_5794
info:ar-repo/semantics/documentoDeConferencia
format conferenceObject
status_str publishedVersion
dc.identifier.none.fl_str_mv http://sedici.unlp.edu.ar/handle/10915/125314
url http://sedici.unlp.edu.ar/handle/10915/125314
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/issn/1850-2806
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-sa/4.0/
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-sa/4.0/
Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0)
dc.format.none.fl_str_mv application/pdf
98-107
dc.source.none.fl_str_mv reponame:SEDICI (UNLP)
instname:Universidad Nacional de La Plata
instacron:UNLP
reponame_str SEDICI (UNLP)
collection SEDICI (UNLP)
instname_str Universidad Nacional de La Plata
instacron_str UNLP
institution UNLP
repository.name.fl_str_mv SEDICI (UNLP) - Universidad Nacional de La Plata
repository.mail.fl_str_mv alira@sedici.unlp.edu.ar
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