Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets
- Autores
- Montoro, Luciano A.; Isaac, A; Giovanetti, Lisandro José; Requejo, Félix Gregorio; Ramirez, Antonio J.
- Año de publicación
- 2011
- Idioma
- inglés
- Tipo de recurso
- documento de conferencia
- Estado
- versión publicada
- Descripción
- The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmission electron microscopy (HRTEM) investigation of buried CoSi2/Si nanostructures unconventionally obtained from a soft-chemistry method. In addition, the HRTEM images were studied by a strain state analysis method (GPA) [3] to calculate the 2D lattice distortion around the nanostructures. These results were compared with predictions as obtained by Finite Element Simulation (FE) to verify the induced 3D strain state.
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas - Materia
-
Ciencias Exactas
metal silicides
electrical resistance material - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- http://creativecommons.org/licenses/by/4.0/
- Repositorio
- Institución
- Universidad Nacional de La Plata
- OAI Identificador
- oai:sedici.unlp.edu.ar:10915/145125
Ver los metadatos del registro completo
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Interface and Structural Characterization of Buried CoSi2/Si(001) NanoplateletsMontoro, Luciano A.Isaac, AGiovanetti, Lisandro JoséRequejo, Félix GregorioRamirez, Antonio J.Ciencias Exactasmetal silicideselectrical resistance materialThe knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmission electron microscopy (HRTEM) investigation of buried CoSi2/Si nanostructures unconventionally obtained from a soft-chemistry method. In addition, the HRTEM images were studied by a strain state analysis method (GPA) [3] to calculate the 2D lattice distortion around the nanostructures. These results were compared with predictions as obtained by Finite Element Simulation (FE) to verify the induced 3D strain state.Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas2011info:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionResumenhttp://purl.org/coar/resource_type/c_5794info:ar-repo/semantics/documentoDeConferenciaapplication/pdf1326-1327http://sedici.unlp.edu.ar/handle/10915/145125enginfo:eu-repo/semantics/altIdentifier/issn/1431-9276info:eu-repo/semantics/altIdentifier/issn/1435-8115info:eu-repo/semantics/altIdentifier/doi/10.1017/s1431927611007501info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by/4.0/Creative Commons Attribution 4.0 International (CC BY 4.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-09-29T11:32:21Zoai:sedici.unlp.edu.ar:10915/145125Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-09-29 11:32:22.03SEDICI (UNLP) - Universidad Nacional de La Platafalse |
dc.title.none.fl_str_mv |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
title |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
spellingShingle |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets Montoro, Luciano A. Ciencias Exactas metal silicides electrical resistance material |
title_short |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
title_full |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
title_fullStr |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
title_full_unstemmed |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
title_sort |
Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets |
dc.creator.none.fl_str_mv |
Montoro, Luciano A. Isaac, A Giovanetti, Lisandro José Requejo, Félix Gregorio Ramirez, Antonio J. |
author |
Montoro, Luciano A. |
author_facet |
Montoro, Luciano A. Isaac, A Giovanetti, Lisandro José Requejo, Félix Gregorio Ramirez, Antonio J. |
author_role |
author |
author2 |
Isaac, A Giovanetti, Lisandro José Requejo, Félix Gregorio Ramirez, Antonio J. |
author2_role |
author author author author |
dc.subject.none.fl_str_mv |
Ciencias Exactas metal silicides electrical resistance material |
topic |
Ciencias Exactas metal silicides electrical resistance material |
dc.description.none.fl_txt_mv |
The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmission electron microscopy (HRTEM) investigation of buried CoSi2/Si nanostructures unconventionally obtained from a soft-chemistry method. In addition, the HRTEM images were studied by a strain state analysis method (GPA) [3] to calculate the 2D lattice distortion around the nanostructures. These results were compared with predictions as obtained by Finite Element Simulation (FE) to verify the induced 3D strain state. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas |
description |
The knowledge of the crystal shape and of the CoSi2/Si interface is essential for the theoretical modeling of these systems because these features have important influence on the electronic behavior, in particular the Schottky barrier height. Here is presented a comprehensive high resolution transmission electron microscopy (HRTEM) investigation of buried CoSi2/Si nanostructures unconventionally obtained from a soft-chemistry method. In addition, the HRTEM images were studied by a strain state analysis method (GPA) [3] to calculate the 2D lattice distortion around the nanostructures. These results were compared with predictions as obtained by Finite Element Simulation (FE) to verify the induced 3D strain state. |
publishDate |
2011 |
dc.date.none.fl_str_mv |
2011 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/conferenceObject info:eu-repo/semantics/publishedVersion Resumen http://purl.org/coar/resource_type/c_5794 info:ar-repo/semantics/documentoDeConferencia |
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conferenceObject |
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publishedVersion |
dc.identifier.none.fl_str_mv |
http://sedici.unlp.edu.ar/handle/10915/145125 |
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http://sedici.unlp.edu.ar/handle/10915/145125 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
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info:eu-repo/semantics/altIdentifier/issn/1431-9276 info:eu-repo/semantics/altIdentifier/issn/1435-8115 info:eu-repo/semantics/altIdentifier/doi/10.1017/s1431927611007501 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/4.0/ Creative Commons Attribution 4.0 International (CC BY 4.0) |
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openAccess |
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http://creativecommons.org/licenses/by/4.0/ Creative Commons Attribution 4.0 International (CC BY 4.0) |
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application/pdf 1326-1327 |
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