High pressure synthesis of the carbon allotrope hexagonite with carbon nanotubes in a diamond anvil cell

• Autores: Bucknum, Michael J.; Castro, Eduardo Alberto
• Año de publicación: 2011
• Idioma: inglés
• Tipo de recurso: parte de libro
• Materia: Química; Diamond Anvil Cell; Density functional theory; Infinite Family; Carbon Allotrope; Ultrasoft Pseudopotentials
• Institución: Universidad Nacional de La Plata

In a previous report, the approximate crystalline structure and electronic structure of a novel, hypothetical hexagonal carbon allotrope has been disclosed. Employing the approximate extended Huckel method, this C structure was determined to be a semi-conducting structure. In contrast, a state-of-the-art density functional theory (DFT) optimization reveals the hexagonal structure to be metallic in band profile. It is built upon a bicyclo[2.2.2]-2,5,7-octatriene (barrelene) generating fragment molecule, and is a Catalan network, with the Wells point symbol (6⁶)₂(6³)₃ and the corresponding Schlafli symbol (6, 3.4). As the network is entirely composed of hexagons and, in addition, possesses hexagonal symmetry, lying in space group P6/mmm (space group #191), it has been given the name hexagonite. The present report describes a density functional theory (DFT) optimization of the lattice parameters of the parent hexagonite structure, with the result giving the optimized lattice parameters of a = 0.477 nm and c = 0.412 nm. A calculation is then reported of a simple diffraction pattern of hexagonite from these optimized lattice parameters, with Bragg spacings enumerated for the lattice out to fourth order. Results of a synchrotron diffraction study of carbon nanotubes which underwent cold compression in a diamond anvil cell (DAC) to 100 GPa, in which the carbon nanotubes have evidently collapsed into a hitherto unknown hexagonal C polymorph, are then compared to the calculated diffraction pattern for the DFT optimized hexagonite structure. It is seen that a close fit is obtained to the experimental data, with a standard deviation over the five matched reflections being given by σx = 0.003107 nm/reflection.
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas