SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators
- Autores
- Bierzychudek, M. E.; Elmquist, R.; Hernández, F.
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- This work presents a supplementary comparison of high value resistance standards performed during 2012 and January 2013, following the guidelines presented in a document about measurement comparisons in the CIPM MRA. The purpose of this task was to compare the high resistance cryogenic current comparator scaling of the participating institutes: National Institute of Standards and Technology, USA (NIST), Centro Nacional de Metrología, Mexico (CENAM) and Instituto Nacional de Tecnología Industrial, Argentina (INTI), all of which are members of the Sistema Interamericano de Metrología (SIM) Regional Metrology Organization. All the measurements of this comparison were performed with two-terminal cryogenic current comparators (CCC). Degrees of equivalence of the participating institutes relative to the comparison reference values are given in the report for the measured resistance values.
Fil: Bierzychudek, M. E. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Elmquist, R. National Institute of Standards and Technology (NIST); Estados Unidos
Fil: Hernández, F. Centro Nacional de Metrología (CENAM); México - Fuente
- Metrología, 51
- Materia
-
Sistema Interamericano de Metrología
Metrología
Calibración
Patrones
Comparadores
Resistores
Criogenia - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by/3.0/
- Repositorio
- Institución
- Instituto Nacional de Tecnología Industrial
- OAI Identificador
- nuevadc:Bierzychudek2014SIM_pdf
Ver los metadatos del registro completo
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SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparatorsBierzychudek, M. E.Elmquist, R.Hernández, F.Sistema Interamericano de MetrologíaMetrologíaCalibraciónPatronesComparadoresResistoresCriogeniaThis work presents a supplementary comparison of high value resistance standards performed during 2012 and January 2013, following the guidelines presented in a document about measurement comparisons in the CIPM MRA. The purpose of this task was to compare the high resistance cryogenic current comparator scaling of the participating institutes: National Institute of Standards and Technology, USA (NIST), Centro Nacional de Metrología, Mexico (CENAM) and Instituto Nacional de Tecnología Industrial, Argentina (INTI), all of which are members of the Sistema Interamericano de Metrología (SIM) Regional Metrology Organization. All the measurements of this comparison were performed with two-terminal cryogenic current comparators (CCC). Degrees of equivalence of the participating institutes relative to the comparison reference values are given in the report for the measured resistance values.Fil: Bierzychudek, M. E. Instituto Nacional de Tecnología Industrial (INTI); ArgentinaFil: Elmquist, R. National Institute of Standards and Technology (NIST); Estados UnidosFil: Hernández, F. Centro Nacional de Metrología (CENAM); MéxicoIOP Publishing2014info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfBierzychudek2014SIM.pdfhttps://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Bierzych.dir/doc.pdfMetrología, 51reponame:Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)instname:Instituto Nacional de Tecnología Industrialenginfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/3.0/openAccess2025-10-16T10:46:44Znuevadc:Bierzychudek2014SIM_pdfinstacron:INTIInstitucionalhttps://app.inti.gob.ar/greenstone3/biblioOrganismo científico-tecnológicohttps://argentina.gob.ar/intihttps://app.inti.gob.ar/greenstone3/oaiserver?verb=Identifypfalcato@inti.gob.arArgentinaopendoar:2025-10-16 10:46:45.364Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) - Instituto Nacional de Tecnología Industrialfalse |
dc.title.none.fl_str_mv |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
title |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
spellingShingle |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators Bierzychudek, M. E. Sistema Interamericano de Metrología Metrología Calibración Patrones Comparadores Resistores Criogenia |
title_short |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
title_full |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
title_fullStr |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
title_full_unstemmed |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
title_sort |
SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
dc.creator.none.fl_str_mv |
Bierzychudek, M. E. Elmquist, R. Hernández, F. |
author |
Bierzychudek, M. E. |
author_facet |
Bierzychudek, M. E. Elmquist, R. Hernández, F. |
author_role |
author |
author2 |
Elmquist, R. Hernández, F. |
author2_role |
author author |
dc.subject.none.fl_str_mv |
Sistema Interamericano de Metrología Metrología Calibración Patrones Comparadores Resistores Criogenia |
topic |
Sistema Interamericano de Metrología Metrología Calibración Patrones Comparadores Resistores Criogenia |
dc.description.none.fl_txt_mv |
This work presents a supplementary comparison of high value resistance standards performed during 2012 and January 2013, following the guidelines presented in a document about measurement comparisons in the CIPM MRA. The purpose of this task was to compare the high resistance cryogenic current comparator scaling of the participating institutes: National Institute of Standards and Technology, USA (NIST), Centro Nacional de Metrología, Mexico (CENAM) and Instituto Nacional de Tecnología Industrial, Argentina (INTI), all of which are members of the Sistema Interamericano de Metrología (SIM) Regional Metrology Organization. All the measurements of this comparison were performed with two-terminal cryogenic current comparators (CCC). Degrees of equivalence of the participating institutes relative to the comparison reference values are given in the report for the measured resistance values. Fil: Bierzychudek, M. E. Instituto Nacional de Tecnología Industrial (INTI); Argentina Fil: Elmquist, R. National Institute of Standards and Technology (NIST); Estados Unidos Fil: Hernández, F. Centro Nacional de Metrología (CENAM); México |
description |
This work presents a supplementary comparison of high value resistance standards performed during 2012 and January 2013, following the guidelines presented in a document about measurement comparisons in the CIPM MRA. The purpose of this task was to compare the high resistance cryogenic current comparator scaling of the participating institutes: National Institute of Standards and Technology, USA (NIST), Centro Nacional de Metrología, Mexico (CENAM) and Instituto Nacional de Tecnología Industrial, Argentina (INTI), all of which are members of the Sistema Interamericano de Metrología (SIM) Regional Metrology Organization. All the measurements of this comparison were performed with two-terminal cryogenic current comparators (CCC). Degrees of equivalence of the participating institutes relative to the comparison reference values are given in the report for the measured resistance values. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
Bierzychudek2014SIM.pdf https://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Bierzych.dir/doc.pdf |
identifier_str_mv |
Bierzychudek2014SIM.pdf |
url |
https://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Bierzych.dir/doc.pdf |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by/3.0/ openAccess |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by/3.0/ openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
IOP Publishing |
publisher.none.fl_str_mv |
IOP Publishing |
dc.source.none.fl_str_mv |
Metrología, 51 reponame:Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) instname:Instituto Nacional de Tecnología Industrial |
reponame_str |
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) |
collection |
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) |
instname_str |
Instituto Nacional de Tecnología Industrial |
repository.name.fl_str_mv |
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) - Instituto Nacional de Tecnología Industrial |
repository.mail.fl_str_mv |
pfalcato@inti.gob.ar |
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1846147091230883840 |
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12.712165 |