Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper

Autores
Hioki, A.; Nonose, N.; Liandi, M.; Jingbo, C.; Liuxing, F.; Chao, W.; Cho, K. H.; Suh, J. K.; Min, H. S.; Lim, Y.; Recknagel, S.; Koenig, M.; Vogl, J.; Caciano de Sena, R.; Reis, L. A.; Borinsky, M.; Puelles, M.; Hatamleh, N.; Acosta, O.; Turk, G.; Rabb, S.; Sturgeon, R.; Methven, B.; Rienitz, O.; Jaehrling, R.; Konopelko, L. A.; Kustikov, Y. A.; Kozyreva, S. B.; Korzh, A. A.
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The CCQM-K88 key comparison was organised by the Inorganic Analysis Working Group of CCQM to test the abilities of the national metrology institutes to measure the mass fraction of lead in lead-free solder containing silver and copper. National Metrology Institute of Japan (NMIJ), National Institute of Metrology P. R. China (NIM) and Korea Research Institute of Standards and Science (KRISS) acted as the coordinating laboratories. The participants used different measurement methods, though most of them used inductively coupled plasma optical emission spectrometry (ICP-OES) or isotope-dilution inductively coupled plasma mass spectrometry (ID-ICP-MS). Accounting for relative expanded uncertainty, comparability of measurement results was successfully demonstrated by the participating NMIs for the measurement of the mass fraction of lead in lead-free solder at the level of 200 mg/kg. It is expected that metals at mass fractions greater than approximately100 mg/kg in lead-free solder containing silver and copper can be determined by each participant using the same technique(s) employed for this key comparison to achieve similar uncertainties mentioned in the present report.
Fil: Hioki, A. National Metrology Institute of Japan (NMIJ); Japón
Fil: Nonose, N. National Metrology Institute of Japan (NMIJ); Japón
Fil: Liandi, M. National Institute of Metrology (NIM); China
Fil: Jingbo, C. National Institute of Metrology (NIM); China
Fil: Liuxing, F. National Institute of Metrology (NIM); China
Fil: Chao, W. National Institute of Metrology (NIM); China
Fil: Cho, K. H. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Suh, J. K. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Min, H. S. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Lim, Y. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Recknagel, S. Federal Institute for Materials Research and Testing (BAM); Alemania
Fil: Koenig, M. Federal Institute for Materials Research and Testing (BAM); Alemania
Fil: Vogl, J. Federal Institute for Materials Research and Testing (BAM); Alemania
Fil: Caciano de Sena, R. Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMetro); Brasil
Fil: Reis, L. A. Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMetro); Brasil
Fil: Borinsky, M. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Puelles, M. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Hatamleh, N. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Acosta, O. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Turk, G. National Institute of Standards and Technology (NIST); Estados Unidos
Fil: Rabb, S. National Institute of Standards and Technology (NIST); Estados Unidos
Fil: Sturgeon, R. National Research Council (NRC); Canadá
Fil: Methven, B. National Research Council (NRC); Canadá
Fil: Rienitz, O. Physikalisch-Technische Bundesanstalt (PTB); Alemania
Fil: Jaehrling, R. Physikalisch-Technische Bundesanstalt (PTB); Alemania
Fil: Konopelko, L. A. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fil: Kustikov, Y. A. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fil: Kozyreva, S. B. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fil: Korzh, A. A. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fuente
Metrología, 50
Materia
Metrología
Plomo
Soldadura
Cobre
Plata
Determinación (química)
Instrumentos de medición
Espectroscopía
Incertidumbre
Mediciones
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by/3.0/
Repositorio
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
Institución
Instituto Nacional de Tecnología Industrial
OAI Identificador
nuevadc:Borinsky2013CCQM_pdf

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oai_identifier_str nuevadc:Borinsky2013CCQM_pdf
network_acronym_str RIINTI
repository_id_str
network_name_str Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
spelling Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copperHioki, A.Nonose, N.Liandi, M.Jingbo, C.Liuxing, F.Chao, W.Cho, K. H.Suh, J. K.Min, H. S.Lim, Y.Recknagel, S.Koenig, M.Vogl, J.Caciano de Sena, R.Reis, L. A.Borinsky, M.Puelles, M.Hatamleh, N.Acosta, O.Turk, G.Rabb, S.Sturgeon, R.Methven, B.Rienitz, O.Jaehrling, R.Konopelko, L. A.Kustikov, Y. A.Kozyreva, S. B.Korzh, A. A.MetrologíaPlomoSoldaduraCobrePlataDeterminación (química)Instrumentos de mediciónEspectroscopíaIncertidumbreMedicionesThe CCQM-K88 key comparison was organised by the Inorganic Analysis Working Group of CCQM to test the abilities of the national metrology institutes to measure the mass fraction of lead in lead-free solder containing silver and copper. National Metrology Institute of Japan (NMIJ), National Institute of Metrology P. R. China (NIM) and Korea Research Institute of Standards and Science (KRISS) acted as the coordinating laboratories. The participants used different measurement methods, though most of them used inductively coupled plasma optical emission spectrometry (ICP-OES) or isotope-dilution inductively coupled plasma mass spectrometry (ID-ICP-MS). Accounting for relative expanded uncertainty, comparability of measurement results was successfully demonstrated by the participating NMIs for the measurement of the mass fraction of lead in lead-free solder at the level of 200 mg/kg. It is expected that metals at mass fractions greater than approximately100 mg/kg in lead-free solder containing silver and copper can be determined by each participant using the same technique(s) employed for this key comparison to achieve similar uncertainties mentioned in the present report.Fil: Hioki, A. National Metrology Institute of Japan (NMIJ); JapónFil: Nonose, N. National Metrology Institute of Japan (NMIJ); JapónFil: Liandi, M. National Institute of Metrology (NIM); ChinaFil: Jingbo, C. National Institute of Metrology (NIM); ChinaFil: Liuxing, F. National Institute of Metrology (NIM); ChinaFil: Chao, W. National Institute of Metrology (NIM); ChinaFil: Cho, K. H. Korea Research Institute of Standards and Science (KRISS); Corea del SurFil: Suh, J. K. Korea Research Institute of Standards and Science (KRISS); Corea del SurFil: Min, H. S. Korea Research Institute of Standards and Science (KRISS); Corea del SurFil: Lim, Y. Korea Research Institute of Standards and Science (KRISS); Corea del SurFil: Recknagel, S. Federal Institute for Materials Research and Testing (BAM); AlemaniaFil: Koenig, M. Federal Institute for Materials Research and Testing (BAM); AlemaniaFil: Vogl, J. Federal Institute for Materials Research and Testing (BAM); AlemaniaFil: Caciano de Sena, R. Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMetro); BrasilFil: Reis, L. A. Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMetro); BrasilFil: Borinsky, M. Instituto Nacional de Tecnología Industrial (INTI); ArgentinaFil: Puelles, M. Instituto Nacional de Tecnología Industrial (INTI); ArgentinaFil: Hatamleh, N. Instituto Nacional de Tecnología Industrial (INTI); ArgentinaFil: Acosta, O. Instituto Nacional de Tecnología Industrial (INTI); ArgentinaFil: Turk, G. National Institute of Standards and Technology (NIST); Estados UnidosFil: Rabb, S. National Institute of Standards and Technology (NIST); Estados UnidosFil: Sturgeon, R. National Research Council (NRC); CanadáFil: Methven, B. National Research Council (NRC); CanadáFil: Rienitz, O. Physikalisch-Technische Bundesanstalt (PTB); AlemaniaFil: Jaehrling, R. Physikalisch-Technische Bundesanstalt (PTB); AlemaniaFil: Konopelko, L. A. D. I. Mendeleev Institute for Metrology (VNIIM); RusiaFil: Kustikov, Y. A. D. I. Mendeleev Institute for Metrology (VNIIM); RusiaFil: Kozyreva, S. B. D. I. Mendeleev Institute for Metrology (VNIIM); RusiaFil: Korzh, A. A. D. I. Mendeleev Institute for Metrology (VNIIM); RusiaIOP Publishing2013info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfBorinsky2013CCQM.pdfhttps://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Borinsky/2013CCQM.dir/doc.pdfMetrología, 50reponame:Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)instname:Instituto Nacional de Tecnología Industrialenginfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by/3.0/openAccess2025-10-16T10:46:37Znuevadc:Borinsky2013CCQM_pdfinstacron:INTIInstitucionalhttps://app.inti.gob.ar/greenstone3/biblioOrganismo científico-tecnológicohttps://argentina.gob.ar/intihttps://app.inti.gob.ar/greenstone3/oaiserver?verb=Identifypfalcato@inti.gob.arArgentinaopendoar:2025-10-16 10:46:38.42Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) - Instituto Nacional de Tecnología Industrialfalse
dc.title.none.fl_str_mv Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
title Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
spellingShingle Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
Hioki, A.
Metrología
Plomo
Soldadura
Cobre
Plata
Determinación (química)
Instrumentos de medición
Espectroscopía
Incertidumbre
Mediciones
title_short Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
title_full Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
title_fullStr Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
title_full_unstemmed Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
title_sort Report of the key comparison CCQM-K88 : determination of lead in lead-free solder containing silver and copper
dc.creator.none.fl_str_mv Hioki, A.
Nonose, N.
Liandi, M.
Jingbo, C.
Liuxing, F.
Chao, W.
Cho, K. H.
Suh, J. K.
Min, H. S.
Lim, Y.
Recknagel, S.
Koenig, M.
Vogl, J.
Caciano de Sena, R.
Reis, L. A.
Borinsky, M.
Puelles, M.
Hatamleh, N.
Acosta, O.
Turk, G.
Rabb, S.
Sturgeon, R.
Methven, B.
Rienitz, O.
Jaehrling, R.
Konopelko, L. A.
Kustikov, Y. A.
Kozyreva, S. B.
Korzh, A. A.
author Hioki, A.
author_facet Hioki, A.
Nonose, N.
Liandi, M.
Jingbo, C.
Liuxing, F.
Chao, W.
Cho, K. H.
Suh, J. K.
Min, H. S.
Lim, Y.
Recknagel, S.
Koenig, M.
Vogl, J.
Caciano de Sena, R.
Reis, L. A.
Borinsky, M.
Puelles, M.
Hatamleh, N.
Acosta, O.
Turk, G.
Rabb, S.
Sturgeon, R.
Methven, B.
Rienitz, O.
Jaehrling, R.
Konopelko, L. A.
Kustikov, Y. A.
Kozyreva, S. B.
Korzh, A. A.
author_role author
author2 Nonose, N.
Liandi, M.
Jingbo, C.
Liuxing, F.
Chao, W.
Cho, K. H.
Suh, J. K.
Min, H. S.
Lim, Y.
Recknagel, S.
Koenig, M.
Vogl, J.
Caciano de Sena, R.
Reis, L. A.
Borinsky, M.
Puelles, M.
Hatamleh, N.
Acosta, O.
Turk, G.
Rabb, S.
Sturgeon, R.
Methven, B.
Rienitz, O.
Jaehrling, R.
Konopelko, L. A.
Kustikov, Y. A.
Kozyreva, S. B.
Korzh, A. A.
author2_role author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Metrología
Plomo
Soldadura
Cobre
Plata
Determinación (química)
Instrumentos de medición
Espectroscopía
Incertidumbre
Mediciones
topic Metrología
Plomo
Soldadura
Cobre
Plata
Determinación (química)
Instrumentos de medición
Espectroscopía
Incertidumbre
Mediciones
dc.description.none.fl_txt_mv The CCQM-K88 key comparison was organised by the Inorganic Analysis Working Group of CCQM to test the abilities of the national metrology institutes to measure the mass fraction of lead in lead-free solder containing silver and copper. National Metrology Institute of Japan (NMIJ), National Institute of Metrology P. R. China (NIM) and Korea Research Institute of Standards and Science (KRISS) acted as the coordinating laboratories. The participants used different measurement methods, though most of them used inductively coupled plasma optical emission spectrometry (ICP-OES) or isotope-dilution inductively coupled plasma mass spectrometry (ID-ICP-MS). Accounting for relative expanded uncertainty, comparability of measurement results was successfully demonstrated by the participating NMIs for the measurement of the mass fraction of lead in lead-free solder at the level of 200 mg/kg. It is expected that metals at mass fractions greater than approximately100 mg/kg in lead-free solder containing silver and copper can be determined by each participant using the same technique(s) employed for this key comparison to achieve similar uncertainties mentioned in the present report.
Fil: Hioki, A. National Metrology Institute of Japan (NMIJ); Japón
Fil: Nonose, N. National Metrology Institute of Japan (NMIJ); Japón
Fil: Liandi, M. National Institute of Metrology (NIM); China
Fil: Jingbo, C. National Institute of Metrology (NIM); China
Fil: Liuxing, F. National Institute of Metrology (NIM); China
Fil: Chao, W. National Institute of Metrology (NIM); China
Fil: Cho, K. H. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Suh, J. K. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Min, H. S. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Lim, Y. Korea Research Institute of Standards and Science (KRISS); Corea del Sur
Fil: Recknagel, S. Federal Institute for Materials Research and Testing (BAM); Alemania
Fil: Koenig, M. Federal Institute for Materials Research and Testing (BAM); Alemania
Fil: Vogl, J. Federal Institute for Materials Research and Testing (BAM); Alemania
Fil: Caciano de Sena, R. Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMetro); Brasil
Fil: Reis, L. A. Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMetro); Brasil
Fil: Borinsky, M. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Puelles, M. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Hatamleh, N. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Acosta, O. Instituto Nacional de Tecnología Industrial (INTI); Argentina
Fil: Turk, G. National Institute of Standards and Technology (NIST); Estados Unidos
Fil: Rabb, S. National Institute of Standards and Technology (NIST); Estados Unidos
Fil: Sturgeon, R. National Research Council (NRC); Canadá
Fil: Methven, B. National Research Council (NRC); Canadá
Fil: Rienitz, O. Physikalisch-Technische Bundesanstalt (PTB); Alemania
Fil: Jaehrling, R. Physikalisch-Technische Bundesanstalt (PTB); Alemania
Fil: Konopelko, L. A. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fil: Kustikov, Y. A. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fil: Kozyreva, S. B. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
Fil: Korzh, A. A. D. I. Mendeleev Institute for Metrology (VNIIM); Rusia
description The CCQM-K88 key comparison was organised by the Inorganic Analysis Working Group of CCQM to test the abilities of the national metrology institutes to measure the mass fraction of lead in lead-free solder containing silver and copper. National Metrology Institute of Japan (NMIJ), National Institute of Metrology P. R. China (NIM) and Korea Research Institute of Standards and Science (KRISS) acted as the coordinating laboratories. The participants used different measurement methods, though most of them used inductively coupled plasma optical emission spectrometry (ICP-OES) or isotope-dilution inductively coupled plasma mass spectrometry (ID-ICP-MS). Accounting for relative expanded uncertainty, comparability of measurement results was successfully demonstrated by the participating NMIs for the measurement of the mass fraction of lead in lead-free solder at the level of 200 mg/kg. It is expected that metals at mass fractions greater than approximately100 mg/kg in lead-free solder containing silver and copper can be determined by each participant using the same technique(s) employed for this key comparison to achieve similar uncertainties mentioned in the present report.
publishDate 2013
dc.date.none.fl_str_mv 2013
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv Borinsky2013CCQM.pdf
https://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Borinsky/2013CCQM.dir/doc.pdf
identifier_str_mv Borinsky2013CCQM.pdf
url https://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Borinsky/2013CCQM.dir/doc.pdf
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by/3.0/
openAccess
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by/3.0/
openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv IOP Publishing
publisher.none.fl_str_mv IOP Publishing
dc.source.none.fl_str_mv Metrología, 50
reponame:Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
instname:Instituto Nacional de Tecnología Industrial
reponame_str Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
collection Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
instname_str Instituto Nacional de Tecnología Industrial
repository.name.fl_str_mv Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) - Instituto Nacional de Tecnología Industrial
repository.mail.fl_str_mv pfalcato@inti.gob.ar
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score 12.712165