Structure and dielectric properties of electrochemically grown ZrO2 films

Autores
Gomez Sanchez, Andrea Valeria; Katunar, Maria Rosa; Schreiner, Wido; Duffo, Gustavo Sergio; Cere, Silvia; Schiffrin, David
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The dielectric properties of electrochemically grown zirconium oxide films by anodisation of zirconium in 1.0 mol dm?3 phosphoric acid solution were investigated in a 3 to 30 V potential range with a view to inducing surface modifications for eventual use in biomedical and electronic applications. The oxide films grown at different potentials were characterised by Atomic Force Microscopy, X-ray photoelectron and Raman spectroscopies; the latter demonstrated the incorporation of phosphate ions into the passive films. Flat band potentials calculated from the Mott-Shottky analysis of the oxides semiconducting properties confirm the bilayer structure of the films. The oxide dielectric permittivity was evaluated from impedance spectroscopy measurements and the film oxide model proposed gave values independent of the oxide growth potential
Fil: Gomez Sanchez, Andrea Valeria. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Katunar, Maria Rosa. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Schreiner, Wido. Universidade Federal do Paraná. Departamento de Física; Brasil
Fil: Duffo, Gustavo Sergio. Comision Nacional de Energia Atomica. Gerencia D/area de Energia Nuclear. Unidad de Actividad de Materiales (cac); Argentina. Universidad Nacional de San Martín; Argentina
Fil: Cere, Silvia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Schiffrin, David. University of Liverpool; Reino Unido
Materia
ZIRCONIUM
ANODIC FILMS
RAMAN
XPS
EIS
RAMAN SPECTROSCOPY OF ANODIC FILMS
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/5016
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/5016
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Structure and dielectric properties of electrochemically grown ZrO2 filmsGomez Sanchez, Andrea ValeriaKatunar, Maria RosaSchreiner, WidoDuffo, Gustavo SergioCere, SilviaSchiffrin, DavidZIRCONIUMANODIC FILMSRAMANXPSEISRAMAN SPECTROSCOPY OF ANODIC FILMShttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2https://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1The dielectric properties of electrochemically grown zirconium oxide films by anodisation of zirconium in 1.0 mol dm?3 phosphoric acid solution were investigated in a 3 to 30 V potential range with a view to inducing surface modifications for eventual use in biomedical and electronic applications. The oxide films grown at different potentials were characterised by Atomic Force Microscopy, X-ray photoelectron and Raman spectroscopies; the latter demonstrated the incorporation of phosphate ions into the passive films. Flat band potentials calculated from the Mott-Shottky analysis of the oxides semiconducting properties confirm the bilayer structure of the films. The oxide dielectric permittivity was evaluated from impedance spectroscopy measurements and the film oxide model proposed gave values independent of the oxide growth potentialFil: Gomez Sanchez, Andrea Valeria. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Katunar, Maria Rosa. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Schreiner, Wido. Universidade Federal do Paraná. Departamento de Física; BrasilFil: Duffo, Gustavo Sergio. Comision Nacional de Energia Atomica. Gerencia D/area de Energia Nuclear. Unidad de Actividad de Materiales (cac); Argentina. Universidad Nacional de San Martín; ArgentinaFil: Cere, Silvia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Schiffrin, David. University of Liverpool; Reino UnidoSlovensko Kemijsko Drustvo2014-05info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/5016Gomez Sanchez, Andrea Valeria; Katunar, Maria Rosa; Schreiner, Wido; Duffo, Gustavo Sergio; Cere, Silvia; et al.; Structure and dielectric properties of electrochemically grown ZrO2 films; Slovensko Kemijsko Drustvo; Acta Chimica Slovenica; 61; 2; 5-2014; 316-3271318-02071580-3155enginfo:eu-repo/semantics/altIdentifier/url/http://acta-arhiv.chem-soc.si/61/61-2-316.pdfinfo:eu-repo/semantics/altIdentifier/issn/1318-0207info:eu-repo/semantics/altIdentifier/pmid/25125115info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:33:01Zoai:ri.conicet.gov.ar:11336/5016instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:33:02.077CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Structure and dielectric properties of electrochemically grown ZrO2 films
title Structure and dielectric properties of electrochemically grown ZrO2 films
spellingShingle Structure and dielectric properties of electrochemically grown ZrO2 films
Gomez Sanchez, Andrea Valeria
ZIRCONIUM
ANODIC FILMS
RAMAN
XPS
EIS
RAMAN SPECTROSCOPY OF ANODIC FILMS
title_short Structure and dielectric properties of electrochemically grown ZrO2 films
title_full Structure and dielectric properties of electrochemically grown ZrO2 films
title_fullStr Structure and dielectric properties of electrochemically grown ZrO2 films
title_full_unstemmed Structure and dielectric properties of electrochemically grown ZrO2 films
title_sort Structure and dielectric properties of electrochemically grown ZrO2 films
dc.creator.none.fl_str_mv Gomez Sanchez, Andrea Valeria
Katunar, Maria Rosa
Schreiner, Wido
Duffo, Gustavo Sergio
Cere, Silvia
Schiffrin, David
author Gomez Sanchez, Andrea Valeria
author_facet Gomez Sanchez, Andrea Valeria
Katunar, Maria Rosa
Schreiner, Wido
Duffo, Gustavo Sergio
Cere, Silvia
Schiffrin, David
author_role author
author2 Katunar, Maria Rosa
Schreiner, Wido
Duffo, Gustavo Sergio
Cere, Silvia
Schiffrin, David
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv ZIRCONIUM
ANODIC FILMS
RAMAN
XPS
EIS
RAMAN SPECTROSCOPY OF ANODIC FILMS
topic ZIRCONIUM
ANODIC FILMS
RAMAN
XPS
EIS
RAMAN SPECTROSCOPY OF ANODIC FILMS
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The dielectric properties of electrochemically grown zirconium oxide films by anodisation of zirconium in 1.0 mol dm?3 phosphoric acid solution were investigated in a 3 to 30 V potential range with a view to inducing surface modifications for eventual use in biomedical and electronic applications. The oxide films grown at different potentials were characterised by Atomic Force Microscopy, X-ray photoelectron and Raman spectroscopies; the latter demonstrated the incorporation of phosphate ions into the passive films. Flat band potentials calculated from the Mott-Shottky analysis of the oxides semiconducting properties confirm the bilayer structure of the films. The oxide dielectric permittivity was evaluated from impedance spectroscopy measurements and the film oxide model proposed gave values independent of the oxide growth potential
Fil: Gomez Sanchez, Andrea Valeria. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Katunar, Maria Rosa. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Schreiner, Wido. Universidade Federal do Paraná. Departamento de Física; Brasil
Fil: Duffo, Gustavo Sergio. Comision Nacional de Energia Atomica. Gerencia D/area de Energia Nuclear. Unidad de Actividad de Materiales (cac); Argentina. Universidad Nacional de San Martín; Argentina
Fil: Cere, Silvia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación en Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Schiffrin, David. University of Liverpool; Reino Unido
description The dielectric properties of electrochemically grown zirconium oxide films by anodisation of zirconium in 1.0 mol dm?3 phosphoric acid solution were investigated in a 3 to 30 V potential range with a view to inducing surface modifications for eventual use in biomedical and electronic applications. The oxide films grown at different potentials were characterised by Atomic Force Microscopy, X-ray photoelectron and Raman spectroscopies; the latter demonstrated the incorporation of phosphate ions into the passive films. Flat band potentials calculated from the Mott-Shottky analysis of the oxides semiconducting properties confirm the bilayer structure of the films. The oxide dielectric permittivity was evaluated from impedance spectroscopy measurements and the film oxide model proposed gave values independent of the oxide growth potential
publishDate 2014
dc.date.none.fl_str_mv 2014-05
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/5016
Gomez Sanchez, Andrea Valeria; Katunar, Maria Rosa; Schreiner, Wido; Duffo, Gustavo Sergio; Cere, Silvia; et al.; Structure and dielectric properties of electrochemically grown ZrO2 films; Slovensko Kemijsko Drustvo; Acta Chimica Slovenica; 61; 2; 5-2014; 316-327
1318-0207
1580-3155
url http://hdl.handle.net/11336/5016
identifier_str_mv Gomez Sanchez, Andrea Valeria; Katunar, Maria Rosa; Schreiner, Wido; Duffo, Gustavo Sergio; Cere, Silvia; et al.; Structure and dielectric properties of electrochemically grown ZrO2 films; Slovensko Kemijsko Drustvo; Acta Chimica Slovenica; 61; 2; 5-2014; 316-327
1318-0207
1580-3155
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://acta-arhiv.chem-soc.si/61/61-2-316.pdf
info:eu-repo/semantics/altIdentifier/issn/1318-0207
info:eu-repo/semantics/altIdentifier/pmid/25125115
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Slovensko Kemijsko Drustvo
publisher.none.fl_str_mv Slovensko Kemijsko Drustvo
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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