Raman spectroscopy of GeSe and AgGeSe thin films

Autores
Conde Garrido, Juan Manuel; Piarristeguy, A.; Le Parc, R.; Ureña, Maria Andrea; Fontana, Marcelo; Arcondo, B.; Pradel, A.
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The structural properties of Agy(Ge0.25Se0.75)1-y thin films (y=0, 0.07, 0.10, 0.15, 0.20 and 0.25 at. fraction) were studied. The films were prepared by pulsed laser deposition using bulk glass targets of the studied ternary system and deposited onto microscope slides. Their amorphous structures were confirmed by XRD (X-ray Diffraction). The effect of silver content on films structures was analysed by Raman spectroscopy. Typical Raman vibration modes were observed in the Ge0.25Se0.75 binary film: Ge-Se corner-sharing tetrahedra mode (CS) at 199 cm-1, edge sharing tetrahedra mode (ES) at 217 cm-1, and SeSe rings and chains mode at 255-265 cm-1 (CM). In the Agy(Ge0.25Se0.75)1-y ternary thin films, the same modes were observed but with a red shift and an intensity reduction in the ES and CM bands.
Fil: Conde Garrido, Juan Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería "Hilario Fernández Long". Universidad de Buenos Aires. Facultad de Ingeniería. Instituto de Tecnologías y Ciencias de la Ingeniería ; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
Fil: Piarristeguy, A.. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería "Hilario Fernández Long". Universidad de Buenos Aires. Facultad de Ingeniería. Instituto de Tecnologías y Ciencias de la Ingeniería ; Argentina
Fil: Le Parc, R.. Centre National de la Recherche Scientifique; Francia. Universite Montpellier II; Francia
Fil: Ureña, Maria Andrea.
Fil: Fontana, Marcelo.
Fil: Arcondo, B..
Fil: Pradel, A.. Universite Montpellier Ii; Francia
Materia
Chalcogenide Glasses
Ag-Ge-Se
Films
Raman Spectroscopy
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/16885

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network_name_str CONICET Digital (CONICET)
spelling Raman spectroscopy of GeSe and AgGeSe thin filmsConde Garrido, Juan ManuelPiarristeguy, A.Le Parc, R.Ureña, Maria AndreaFontana, MarceloArcondo, B.Pradel, A.Chalcogenide GlassesAg-Ge-SeFilmsRaman Spectroscopyhttps://purl.org/becyt/ford/2.5https://purl.org/becyt/ford/2The structural properties of Agy(Ge0.25Se0.75)1-y thin films (y=0, 0.07, 0.10, 0.15, 0.20 and 0.25 at. fraction) were studied. The films were prepared by pulsed laser deposition using bulk glass targets of the studied ternary system and deposited onto microscope slides. Their amorphous structures were confirmed by XRD (X-ray Diffraction). The effect of silver content on films structures was analysed by Raman spectroscopy. Typical Raman vibration modes were observed in the Ge0.25Se0.75 binary film: Ge-Se corner-sharing tetrahedra mode (CS) at 199 cm-1, edge sharing tetrahedra mode (ES) at 217 cm-1, and SeSe rings and chains mode at 255-265 cm-1 (CM). In the Agy(Ge0.25Se0.75)1-y ternary thin films, the same modes were observed but with a red shift and an intensity reduction in the ES and CM bands.Fil: Conde Garrido, Juan Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería "Hilario Fernández Long". Universidad de Buenos Aires. Facultad de Ingeniería. Instituto de Tecnologías y Ciencias de la Ingeniería ; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; ArgentinaFil: Piarristeguy, A.. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería "Hilario Fernández Long". Universidad de Buenos Aires. Facultad de Ingeniería. Instituto de Tecnologías y Ciencias de la Ingeniería ; ArgentinaFil: Le Parc, R.. Centre National de la Recherche Scientifique; Francia. Universite Montpellier II; FranciaFil: Ureña, Maria Andrea.Fil: Fontana, Marcelo.Fil: Arcondo, B..Fil: Pradel, A.. Universite Montpellier Ii; FranciaNatl Inst R&d Materials Physics2013-11info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/16885Conde Garrido, Juan Manuel; Piarristeguy, A.; Le Parc, R.; Ureña, Maria Andrea; Fontana, Marcelo; et al.; Raman spectroscopy of GeSe and AgGeSe thin films; Natl Inst R&d Materials Physics; Chalcogenide Letters; 10; 11; 11-2013; 427-4331584-8663enginfo:eu-repo/semantics/altIdentifier/url/http://www.chalcogen.ro/index.php/journals/chalcogenide-letters/11-cl/87-volume-10-number-11-november-2013info:eu-repo/semantics/altIdentifier/url/http://chalcogen.ro/427_Conde.pdfinfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T10:01:09Zoai:ri.conicet.gov.ar:11336/16885instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 10:01:09.755CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Raman spectroscopy of GeSe and AgGeSe thin films
title Raman spectroscopy of GeSe and AgGeSe thin films
spellingShingle Raman spectroscopy of GeSe and AgGeSe thin films
Conde Garrido, Juan Manuel
Chalcogenide Glasses
Ag-Ge-Se
Films
Raman Spectroscopy
title_short Raman spectroscopy of GeSe and AgGeSe thin films
title_full Raman spectroscopy of GeSe and AgGeSe thin films
title_fullStr Raman spectroscopy of GeSe and AgGeSe thin films
title_full_unstemmed Raman spectroscopy of GeSe and AgGeSe thin films
title_sort Raman spectroscopy of GeSe and AgGeSe thin films
dc.creator.none.fl_str_mv Conde Garrido, Juan Manuel
Piarristeguy, A.
Le Parc, R.
Ureña, Maria Andrea
Fontana, Marcelo
Arcondo, B.
Pradel, A.
author Conde Garrido, Juan Manuel
author_facet Conde Garrido, Juan Manuel
Piarristeguy, A.
Le Parc, R.
Ureña, Maria Andrea
Fontana, Marcelo
Arcondo, B.
Pradel, A.
author_role author
author2 Piarristeguy, A.
Le Parc, R.
Ureña, Maria Andrea
Fontana, Marcelo
Arcondo, B.
Pradel, A.
author2_role author
author
author
author
author
author
dc.subject.none.fl_str_mv Chalcogenide Glasses
Ag-Ge-Se
Films
Raman Spectroscopy
topic Chalcogenide Glasses
Ag-Ge-Se
Films
Raman Spectroscopy
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.5
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv The structural properties of Agy(Ge0.25Se0.75)1-y thin films (y=0, 0.07, 0.10, 0.15, 0.20 and 0.25 at. fraction) were studied. The films were prepared by pulsed laser deposition using bulk glass targets of the studied ternary system and deposited onto microscope slides. Their amorphous structures were confirmed by XRD (X-ray Diffraction). The effect of silver content on films structures was analysed by Raman spectroscopy. Typical Raman vibration modes were observed in the Ge0.25Se0.75 binary film: Ge-Se corner-sharing tetrahedra mode (CS) at 199 cm-1, edge sharing tetrahedra mode (ES) at 217 cm-1, and SeSe rings and chains mode at 255-265 cm-1 (CM). In the Agy(Ge0.25Se0.75)1-y ternary thin films, the same modes were observed but with a red shift and an intensity reduction in the ES and CM bands.
Fil: Conde Garrido, Juan Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería "Hilario Fernández Long". Universidad de Buenos Aires. Facultad de Ingeniería. Instituto de Tecnologías y Ciencias de la Ingeniería ; Argentina. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina
Fil: Piarristeguy, A.. Universidad de Buenos Aires. Facultad de Ingenieria. Departamento de Fisica. Laboratorio de Sólidos Amorfos; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Houssay. Instituto de Tecnologías y Ciencias de la Ingeniería "Hilario Fernández Long". Universidad de Buenos Aires. Facultad de Ingeniería. Instituto de Tecnologías y Ciencias de la Ingeniería ; Argentina
Fil: Le Parc, R.. Centre National de la Recherche Scientifique; Francia. Universite Montpellier II; Francia
Fil: Ureña, Maria Andrea.
Fil: Fontana, Marcelo.
Fil: Arcondo, B..
Fil: Pradel, A.. Universite Montpellier Ii; Francia
description The structural properties of Agy(Ge0.25Se0.75)1-y thin films (y=0, 0.07, 0.10, 0.15, 0.20 and 0.25 at. fraction) were studied. The films were prepared by pulsed laser deposition using bulk glass targets of the studied ternary system and deposited onto microscope slides. Their amorphous structures were confirmed by XRD (X-ray Diffraction). The effect of silver content on films structures was analysed by Raman spectroscopy. Typical Raman vibration modes were observed in the Ge0.25Se0.75 binary film: Ge-Se corner-sharing tetrahedra mode (CS) at 199 cm-1, edge sharing tetrahedra mode (ES) at 217 cm-1, and SeSe rings and chains mode at 255-265 cm-1 (CM). In the Agy(Ge0.25Se0.75)1-y ternary thin films, the same modes were observed but with a red shift and an intensity reduction in the ES and CM bands.
publishDate 2013
dc.date.none.fl_str_mv 2013-11
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/16885
Conde Garrido, Juan Manuel; Piarristeguy, A.; Le Parc, R.; Ureña, Maria Andrea; Fontana, Marcelo; et al.; Raman spectroscopy of GeSe and AgGeSe thin films; Natl Inst R&d Materials Physics; Chalcogenide Letters; 10; 11; 11-2013; 427-433
1584-8663
url http://hdl.handle.net/11336/16885
identifier_str_mv Conde Garrido, Juan Manuel; Piarristeguy, A.; Le Parc, R.; Ureña, Maria Andrea; Fontana, Marcelo; et al.; Raman spectroscopy of GeSe and AgGeSe thin films; Natl Inst R&d Materials Physics; Chalcogenide Letters; 10; 11; 11-2013; 427-433
1584-8663
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://www.chalcogen.ro/index.php/journals/chalcogenide-letters/11-cl/87-volume-10-number-11-november-2013
info:eu-repo/semantics/altIdentifier/url/http://chalcogen.ro/427_Conde.pdf
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Natl Inst R&d Materials Physics
publisher.none.fl_str_mv Natl Inst R&d Materials Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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