Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation
- Autores
- Pagano, R.; Lombardo, S.; Palumbo, Félix Roberto Mario; Sanfilippo, D.; Valvo, G.; Fallica, G.; Libertino, S.
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose.
Fil: Pagano, R.. Istituto per la Microelettronica e Microsistemi. Catania; Italia
Fil: Lombardo, S.. Istituto per la Microelettronica e Microsistemi. Catania; Italia
Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Technion - Israel Institute of Technology; Israel
Fil: Sanfilippo, D.. STMicroelectronics. Catania; Italia
Fil: Valvo, G.. STMicroelectronics. Catania; Italia
Fil: Fallica, G.. STMicroelectronics. Catania; Italia
Fil: Libertino, S.. Istituto per la Microelettronica e Microsistemi. Catania; Italia - Materia
-
Silicon Photomultiplier
Radiation Damage
Radiation Hardness
Gamma Rays - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/35926
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Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiationPagano, R.Lombardo, S.Palumbo, Félix Roberto MarioSanfilippo, D.Valvo, G.Fallica, G.Libertino, S.Silicon PhotomultiplierRadiation DamageRadiation HardnessGamma Rayshttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose.Fil: Pagano, R.. Istituto per la Microelettronica e Microsistemi. Catania; ItaliaFil: Lombardo, S.. Istituto per la Microelettronica e Microsistemi. Catania; ItaliaFil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Technion - Israel Institute of Technology; IsraelFil: Sanfilippo, D.. STMicroelectronics. Catania; ItaliaFil: Valvo, G.. STMicroelectronics. Catania; ItaliaFil: Fallica, G.. STMicroelectronics. Catania; ItaliaFil: Libertino, S.. Istituto per la Microelettronica e Microsistemi. Catania; ItaliaElsevier Science2014-09info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/35926Pagano, R.; Lombardo, S.; Palumbo, Félix Roberto Mario; Sanfilippo, D.; Valvo, G. ; et al.; Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation; Elsevier Science; Nuclear Instruments And Methods In Physics Research A: Accelerators, Spectrometers, Detectors And Associated Equipament; 767; 9-2014; 347-3520168-9002CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.nima.2014.08.028info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0168900214009577info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T10:40:16Zoai:ri.conicet.gov.ar:11336/35926instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 10:40:16.289CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
title |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
spellingShingle |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation Pagano, R. Silicon Photomultiplier Radiation Damage Radiation Hardness Gamma Rays |
title_short |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
title_full |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
title_fullStr |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
title_full_unstemmed |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
title_sort |
Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation |
dc.creator.none.fl_str_mv |
Pagano, R. Lombardo, S. Palumbo, Félix Roberto Mario Sanfilippo, D. Valvo, G. Fallica, G. Libertino, S. |
author |
Pagano, R. |
author_facet |
Pagano, R. Lombardo, S. Palumbo, Félix Roberto Mario Sanfilippo, D. Valvo, G. Fallica, G. Libertino, S. |
author_role |
author |
author2 |
Lombardo, S. Palumbo, Félix Roberto Mario Sanfilippo, D. Valvo, G. Fallica, G. Libertino, S. |
author2_role |
author author author author author author |
dc.subject.none.fl_str_mv |
Silicon Photomultiplier Radiation Damage Radiation Hardness Gamma Rays |
topic |
Silicon Photomultiplier Radiation Damage Radiation Hardness Gamma Rays |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose. Fil: Pagano, R.. Istituto per la Microelettronica e Microsistemi. Catania; Italia Fil: Lombardo, S.. Istituto per la Microelettronica e Microsistemi. Catania; Italia Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Technion - Israel Institute of Technology; Israel Fil: Sanfilippo, D.. STMicroelectronics. Catania; Italia Fil: Valvo, G.. STMicroelectronics. Catania; Italia Fil: Fallica, G.. STMicroelectronics. Catania; Italia Fil: Libertino, S.. Istituto per la Microelettronica e Microsistemi. Catania; Italia |
description |
Radiation damage in silicon photomultipliers (SiPM) caused by exposure to 60Co γ-rays is experimentally evaluated and discussed. SiPM devices were irradiated to doses up to 9.4 kGy. Dark current, dark count rate, gain, single photon counting capability, and cross-talk probability among SiPM pixels are evaluated as a function of irradiation dose. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-09 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/35926 Pagano, R.; Lombardo, S.; Palumbo, Félix Roberto Mario; Sanfilippo, D.; Valvo, G. ; et al.; Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation; Elsevier Science; Nuclear Instruments And Methods In Physics Research A: Accelerators, Spectrometers, Detectors And Associated Equipament; 767; 9-2014; 347-352 0168-9002 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/35926 |
identifier_str_mv |
Pagano, R.; Lombardo, S.; Palumbo, Félix Roberto Mario; Sanfilippo, D.; Valvo, G. ; et al.; Radiation hardness of silicon Photomultipliers under 60Co γ-ray irradiation; Elsevier Science; Nuclear Instruments And Methods In Physics Research A: Accelerators, Spectrometers, Detectors And Associated Equipament; 767; 9-2014; 347-352 0168-9002 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.nima.2014.08.028 info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0168900214009577 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier Science |
publisher.none.fl_str_mv |
Elsevier Science |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
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CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1844614430015356928 |
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13.070432 |