Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies

Autores
Schipani, Federico; Ponce, Miguel Adolfo; Joanni, Ednan; Williams, Federico Jose; Aldao, Celso Manuel
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Changes in the concentration of oxygen vacancies within the grains of polycrystalline SnO2, due to different atmosphere exposures, were detected using impedance and photoemission spectroscopies. From measured capacitance values, variations of the potential barrier widths could be determined. It is shown that under the presence of an oxygen rich atmosphere, at relatively low temperature, the width of intergranular potential barriers increase to the point that grains become completely depleted of carriers. With subsequent exposure to vacuum, capacitance adopts a higher value, indicative of intergranular barriers and quasi-neutral regions at the center of the grains. X-ray and ultraviolet photoemission spectroscopy measurements showed that SnO2 samples treated in oxidizing or reducing environments have similar barrier heights and different work functions. Results are especially relevant in the study of mechanisms responsible for metal oxide gas sensing
Fil: Schipani, Federico. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Ponce, Miguel Adolfo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Joanni, Ednan. CTI Renato Archer. Sao Paulo; Brasil
Fil: Williams, Federico Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Química, Física de los Materiales, Medioambiente y Energía; Argentina
Fil: Aldao, Celso Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Materia
SENSORS
OXYGEN VACANCIE DIFFUSION
CAPACITANCE
XPS
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/5178
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopiesSchipani, FedericoPonce, Miguel AdolfoJoanni, EdnanWilliams, Federico JoseAldao, Celso ManuelSENSORSOXYGEN VACANCIE DIFFUSIONCAPACITANCEXPShttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Changes in the concentration of oxygen vacancies within the grains of polycrystalline SnO2, due to different atmosphere exposures, were detected using impedance and photoemission spectroscopies. From measured capacitance values, variations of the potential barrier widths could be determined. It is shown that under the presence of an oxygen rich atmosphere, at relatively low temperature, the width of intergranular potential barriers increase to the point that grains become completely depleted of carriers. With subsequent exposure to vacuum, capacitance adopts a higher value, indicative of intergranular barriers and quasi-neutral regions at the center of the grains. X-ray and ultraviolet photoemission spectroscopy measurements showed that SnO2 samples treated in oxidizing or reducing environments have similar barrier heights and different work functions. Results are especially relevant in the study of mechanisms responsible for metal oxide gas sensingFil: Schipani, Federico. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Ponce, Miguel Adolfo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaFil: Joanni, Ednan. CTI Renato Archer. Sao Paulo; BrasilFil: Williams, Federico Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Química, Física de los Materiales, Medioambiente y Energía; ArgentinaFil: Aldao, Celso Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; ArgentinaAmerican Institute Of Physics2014-11-18info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/5178Schipani, Federico; Ponce, Miguel Adolfo; Joanni, Ednan; Williams, Federico Jose; Aldao, Celso Manuel; Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies; American Institute Of Physics; Journal Of Applied Physics; 116; 19; 18-11-2014; 194502-1945020021-8979enginfo:eu-repo/semantics/altIdentifier/url/http://scitation.aip.org/content/aip/journal/jap/116/19/10.1063/1.4902150info:eu-repo/semantics/altIdentifier/doi/info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4902150info:eu-repo/semantics/altIdentifier/issn/0021-8979info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:26:57Zoai:ri.conicet.gov.ar:11336/5178instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:26:57.85CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
title Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
spellingShingle Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
Schipani, Federico
SENSORS
OXYGEN VACANCIE DIFFUSION
CAPACITANCE
XPS
title_short Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
title_full Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
title_fullStr Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
title_full_unstemmed Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
title_sort Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
dc.creator.none.fl_str_mv Schipani, Federico
Ponce, Miguel Adolfo
Joanni, Ednan
Williams, Federico Jose
Aldao, Celso Manuel
author Schipani, Federico
author_facet Schipani, Federico
Ponce, Miguel Adolfo
Joanni, Ednan
Williams, Federico Jose
Aldao, Celso Manuel
author_role author
author2 Ponce, Miguel Adolfo
Joanni, Ednan
Williams, Federico Jose
Aldao, Celso Manuel
author2_role author
author
author
author
dc.subject.none.fl_str_mv SENSORS
OXYGEN VACANCIE DIFFUSION
CAPACITANCE
XPS
topic SENSORS
OXYGEN VACANCIE DIFFUSION
CAPACITANCE
XPS
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Changes in the concentration of oxygen vacancies within the grains of polycrystalline SnO2, due to different atmosphere exposures, were detected using impedance and photoemission spectroscopies. From measured capacitance values, variations of the potential barrier widths could be determined. It is shown that under the presence of an oxygen rich atmosphere, at relatively low temperature, the width of intergranular potential barriers increase to the point that grains become completely depleted of carriers. With subsequent exposure to vacuum, capacitance adopts a higher value, indicative of intergranular barriers and quasi-neutral regions at the center of the grains. X-ray and ultraviolet photoemission spectroscopy measurements showed that SnO2 samples treated in oxidizing or reducing environments have similar barrier heights and different work functions. Results are especially relevant in the study of mechanisms responsible for metal oxide gas sensing
Fil: Schipani, Federico. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Ponce, Miguel Adolfo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
Fil: Joanni, Ednan. CTI Renato Archer. Sao Paulo; Brasil
Fil: Williams, Federico Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Química, Física de los Materiales, Medioambiente y Energía; Argentina
Fil: Aldao, Celso Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Mar del Plata. Instituto de Investigación En Ciencia y Tecnología de Materiales (i); Argentina. Universidad Nacional de Mar del Plata. Facultad de Ingeniería; Argentina
description Changes in the concentration of oxygen vacancies within the grains of polycrystalline SnO2, due to different atmosphere exposures, were detected using impedance and photoemission spectroscopies. From measured capacitance values, variations of the potential barrier widths could be determined. It is shown that under the presence of an oxygen rich atmosphere, at relatively low temperature, the width of intergranular potential barriers increase to the point that grains become completely depleted of carriers. With subsequent exposure to vacuum, capacitance adopts a higher value, indicative of intergranular barriers and quasi-neutral regions at the center of the grains. X-ray and ultraviolet photoemission spectroscopy measurements showed that SnO2 samples treated in oxidizing or reducing environments have similar barrier heights and different work functions. Results are especially relevant in the study of mechanisms responsible for metal oxide gas sensing
publishDate 2014
dc.date.none.fl_str_mv 2014-11-18
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/5178
Schipani, Federico; Ponce, Miguel Adolfo; Joanni, Ednan; Williams, Federico Jose; Aldao, Celso Manuel; Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies; American Institute Of Physics; Journal Of Applied Physics; 116; 19; 18-11-2014; 194502-194502
0021-8979
url http://hdl.handle.net/11336/5178
identifier_str_mv Schipani, Federico; Ponce, Miguel Adolfo; Joanni, Ednan; Williams, Federico Jose; Aldao, Celso Manuel; Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies; American Institute Of Physics; Journal Of Applied Physics; 116; 19; 18-11-2014; 194502-194502
0021-8979
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://scitation.aip.org/content/aip/journal/jap/116/19/10.1063/1.4902150
info:eu-repo/semantics/altIdentifier/doi/
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4902150
info:eu-repo/semantics/altIdentifier/issn/0021-8979
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute Of Physics
publisher.none.fl_str_mv American Institute Of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 12.982451

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