Calibration method for confocal X-ray microanalysis with polychromatic excitation

Autores
Sosa, Carlos Manuel; Stoytschew, V.; Leani, Juan Jose; Sanchez, Hector Jorge; Pérez, C. A.; Perez, Roberto Daniel
Año de publicación
2015
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
To apply the fundamental parameters method at the confocal setup the knowledge of the sensitivity of the spectrometer is required which depends on the characteristics of two X-ray lenses: one in the excitation channel and another in the detection channel. For the particular case of polychromatic excitation, the theory shows that the focalization properties of the excitation lens for all incident energies affect the X-ray fluorescence intensity. Therefore the traditional calibration method based on the measurement of standard samples becomes unstable since the number of required fitting parameters is too high. To reduce these parameters a previous characterization of the excitation lens by a simulation program was employed giving rise to a simplified confocal setup calibration. The developed calibration method was applied for a confocal spectrometer implemented in the Brazilian Synchrotron Radiation Source (LNLS) with white beam. The experimental parameters of the sensitivity were obtained from depth profile analysis of several pure thin films. The calibrated confocal setup was used to quantify reference standards in order to validate the calibration procedure. Our results for elemental concentrations show relative errors less than 15% for the quantitative analysis of a light matrix reference standard.
Fil: Sosa, Carlos Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Stoytschew, V.. Technishe Universitat Berlin; Alemania
Fil: Leani, Juan Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Sanchez, Hector Jorge. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina
Fil: Pérez, C. A.. Laboratorio Nacional de Luz Síncrotron; Brasil
Fil: Perez, Roberto Daniel. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina
Materia
Confocal
x-ray microfluorescence
Synchrotron Radiation
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/51179
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/51179
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repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Calibration method for confocal X-ray microanalysis with polychromatic excitationSosa, Carlos ManuelStoytschew, V.Leani, Juan JoseSanchez, Hector JorgePérez, C. A.Perez, Roberto DanielConfocalx-ray microfluorescenceSynchrotron Radiationhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1To apply the fundamental parameters method at the confocal setup the knowledge of the sensitivity of the spectrometer is required which depends on the characteristics of two X-ray lenses: one in the excitation channel and another in the detection channel. For the particular case of polychromatic excitation, the theory shows that the focalization properties of the excitation lens for all incident energies affect the X-ray fluorescence intensity. Therefore the traditional calibration method based on the measurement of standard samples becomes unstable since the number of required fitting parameters is too high. To reduce these parameters a previous characterization of the excitation lens by a simulation program was employed giving rise to a simplified confocal setup calibration. The developed calibration method was applied for a confocal spectrometer implemented in the Brazilian Synchrotron Radiation Source (LNLS) with white beam. The experimental parameters of the sensitivity were obtained from depth profile analysis of several pure thin films. The calibrated confocal setup was used to quantify reference standards in order to validate the calibration procedure. Our results for elemental concentrations show relative errors less than 15% for the quantitative analysis of a light matrix reference standard.Fil: Sosa, Carlos Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; ArgentinaFil: Stoytschew, V.. Technishe Universitat Berlin; AlemaniaFil: Leani, Juan Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; ArgentinaFil: Sanchez, Hector Jorge. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; ArgentinaFil: Pérez, C. A.. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Perez, Roberto Daniel. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; ArgentinaHindawi Publishing Corporation2015-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/51179Sosa, Carlos Manuel; Stoytschew, V.; Leani, Juan Jose; Sanchez, Hector Jorge; Pérez, C. A.; et al.; Calibration method for confocal X-ray microanalysis with polychromatic excitation; Hindawi Publishing Corporation; Journal of Spectroscopy; 2015; 064; 1-2015; 1-72314-4939CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1155/2015/368054info:eu-repo/semantics/altIdentifier/url/https://www.hindawi.com/journals/jspec/2015/368054/info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:45:20Zoai:ri.conicet.gov.ar:11336/51179instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:45:20.938CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Calibration method for confocal X-ray microanalysis with polychromatic excitation
title Calibration method for confocal X-ray microanalysis with polychromatic excitation
spellingShingle Calibration method for confocal X-ray microanalysis with polychromatic excitation
Sosa, Carlos Manuel
Confocal
x-ray microfluorescence
Synchrotron Radiation
title_short Calibration method for confocal X-ray microanalysis with polychromatic excitation
title_full Calibration method for confocal X-ray microanalysis with polychromatic excitation
title_fullStr Calibration method for confocal X-ray microanalysis with polychromatic excitation
title_full_unstemmed Calibration method for confocal X-ray microanalysis with polychromatic excitation
title_sort Calibration method for confocal X-ray microanalysis with polychromatic excitation
dc.creator.none.fl_str_mv Sosa, Carlos Manuel
Stoytschew, V.
Leani, Juan Jose
Sanchez, Hector Jorge
Pérez, C. A.
Perez, Roberto Daniel
author Sosa, Carlos Manuel
author_facet Sosa, Carlos Manuel
Stoytschew, V.
Leani, Juan Jose
Sanchez, Hector Jorge
Pérez, C. A.
Perez, Roberto Daniel
author_role author
author2 Stoytschew, V.
Leani, Juan Jose
Sanchez, Hector Jorge
Pérez, C. A.
Perez, Roberto Daniel
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Confocal
x-ray microfluorescence
Synchrotron Radiation
topic Confocal
x-ray microfluorescence
Synchrotron Radiation
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv To apply the fundamental parameters method at the confocal setup the knowledge of the sensitivity of the spectrometer is required which depends on the characteristics of two X-ray lenses: one in the excitation channel and another in the detection channel. For the particular case of polychromatic excitation, the theory shows that the focalization properties of the excitation lens for all incident energies affect the X-ray fluorescence intensity. Therefore the traditional calibration method based on the measurement of standard samples becomes unstable since the number of required fitting parameters is too high. To reduce these parameters a previous characterization of the excitation lens by a simulation program was employed giving rise to a simplified confocal setup calibration. The developed calibration method was applied for a confocal spectrometer implemented in the Brazilian Synchrotron Radiation Source (LNLS) with white beam. The experimental parameters of the sensitivity were obtained from depth profile analysis of several pure thin films. The calibrated confocal setup was used to quantify reference standards in order to validate the calibration procedure. Our results for elemental concentrations show relative errors less than 15% for the quantitative analysis of a light matrix reference standard.
Fil: Sosa, Carlos Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Stoytschew, V.. Technishe Universitat Berlin; Alemania
Fil: Leani, Juan Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Sanchez, Hector Jorge. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina
Fil: Pérez, C. A.. Laboratorio Nacional de Luz Síncrotron; Brasil
Fil: Perez, Roberto Daniel. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina
description To apply the fundamental parameters method at the confocal setup the knowledge of the sensitivity of the spectrometer is required which depends on the characteristics of two X-ray lenses: one in the excitation channel and another in the detection channel. For the particular case of polychromatic excitation, the theory shows that the focalization properties of the excitation lens for all incident energies affect the X-ray fluorescence intensity. Therefore the traditional calibration method based on the measurement of standard samples becomes unstable since the number of required fitting parameters is too high. To reduce these parameters a previous characterization of the excitation lens by a simulation program was employed giving rise to a simplified confocal setup calibration. The developed calibration method was applied for a confocal spectrometer implemented in the Brazilian Synchrotron Radiation Source (LNLS) with white beam. The experimental parameters of the sensitivity were obtained from depth profile analysis of several pure thin films. The calibrated confocal setup was used to quantify reference standards in order to validate the calibration procedure. Our results for elemental concentrations show relative errors less than 15% for the quantitative analysis of a light matrix reference standard.
publishDate 2015
dc.date.none.fl_str_mv 2015-01
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/51179
Sosa, Carlos Manuel; Stoytschew, V.; Leani, Juan Jose; Sanchez, Hector Jorge; Pérez, C. A.; et al.; Calibration method for confocal X-ray microanalysis with polychromatic excitation; Hindawi Publishing Corporation; Journal of Spectroscopy; 2015; 064; 1-2015; 1-7
2314-4939
CONICET Digital
CONICET
url http://hdl.handle.net/11336/51179
identifier_str_mv Sosa, Carlos Manuel; Stoytschew, V.; Leani, Juan Jose; Sanchez, Hector Jorge; Pérez, C. A.; et al.; Calibration method for confocal X-ray microanalysis with polychromatic excitation; Hindawi Publishing Corporation; Journal of Spectroscopy; 2015; 064; 1-2015; 1-7
2314-4939
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1155/2015/368054
info:eu-repo/semantics/altIdentifier/url/https://www.hindawi.com/journals/jspec/2015/368054/
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Hindawi Publishing Corporation
publisher.none.fl_str_mv Hindawi Publishing Corporation
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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