Past, Present and Future of IEC and IEEE High-Voltage Testing Standards
- Autores
- Li, Y.; Hällström, J.; Larzelere, W.; Bergman, A.; Rickmann, J.; Hauschild, W.; Diaz, Ricardo Ruben; Garnacho, F.; McComb, T.; Okabe, S.; Zhang, Y. X.; Elg, Alf Peter
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Recently, IEC and IEEE have published a number of revised and new standards for high-voltage and high-current testing. These standards include IEC 60060 1:2010, IEC 60060 2:2010, IEC 61083 2:2013, IEC 62475:2010 and IEEE Std.4 2013. Significant changes and additions have been introduced to these revised and new standards. Many members of CIGRE WG D1.35 were involved in the revision and development of these standards as members of IEC TC 42 and IEEE PSIM Subcommittee HVTT, particularly in the development of the new techniques and new procedures that are now adopted in the standards. This Guide has been written by members of CIGRE WG D1.35 to give high-voltage test engineers a broader knowledge of how to apply the latest high-voltage and high-current testing standards.
Fil: Li, Y..
Fil: Hällström, J.. Helsinki University Of Technology; Finlandia
Fil: Larzelere, W..
Fil: Bergman, A..
Fil: Rickmann, J..
Fil: Hauschild, W..
Fil: Diaz, Ricardo Ruben. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Tucumán; Argentina
Fil: Garnacho, F..
Fil: McComb, T..
Fil: Okabe, S..
Fil: Zhang, Y. X..
Fil: Elg, Alf Peter. - Materia
-
High Voltage
High Current
Measurement
Standard - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/7261
Ver los metadatos del registro completo
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Past, Present and Future of IEC and IEEE High-Voltage Testing StandardsLi, Y.Hällström, J.Larzelere, W.Bergman, A.Rickmann, J.Hauschild, W.Diaz, Ricardo RubenGarnacho, F.McComb, T.Okabe, S.Zhang, Y. X.Elg, Alf PeterHigh VoltageHigh CurrentMeasurementStandardhttps://purl.org/becyt/ford/2.2https://purl.org/becyt/ford/2Recently, IEC and IEEE have published a number of revised and new standards for high-voltage and high-current testing. These standards include IEC 60060 1:2010, IEC 60060 2:2010, IEC 61083 2:2013, IEC 62475:2010 and IEEE Std.4 2013. Significant changes and additions have been introduced to these revised and new standards. Many members of CIGRE WG D1.35 were involved in the revision and development of these standards as members of IEC TC 42 and IEEE PSIM Subcommittee HVTT, particularly in the development of the new techniques and new procedures that are now adopted in the standards. This Guide has been written by members of CIGRE WG D1.35 to give high-voltage test engineers a broader knowledge of how to apply the latest high-voltage and high-current testing standards.Fil: Li, Y..Fil: Hällström, J.. Helsinki University Of Technology; FinlandiaFil: Larzelere, W..Fil: Bergman, A..Fil: Rickmann, J..Fil: Hauschild, W..Fil: Diaz, Ricardo Ruben. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Tucumán; ArgentinaFil: Garnacho, F..Fil: McComb, T..Fil: Okabe, S..Fil: Zhang, Y. X..Fil: Elg, Alf Peter.International Council on Large Electric Systems2014-08info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/7261Li, Y.; Hällström, J.; Larzelere, W.; Bergman, A.; Rickmann, J.; et al.; Past, Present and Future of IEC and IEEE High-Voltage Testing Standards; International Council on Large Electric Systems; Electra; 276; 8-2014; 65-711519-793Xenginfo:eu-repo/semantics/altIdentifier/url/http://www.e-cigre.org/Order/select.asp?ID=1705172info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T10:08:54Zoai:ri.conicet.gov.ar:11336/7261instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 10:08:54.949CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
title |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
spellingShingle |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards Li, Y. High Voltage High Current Measurement Standard |
title_short |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
title_full |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
title_fullStr |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
title_full_unstemmed |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
title_sort |
Past, Present and Future of IEC and IEEE High-Voltage Testing Standards |
dc.creator.none.fl_str_mv |
Li, Y. Hällström, J. Larzelere, W. Bergman, A. Rickmann, J. Hauschild, W. Diaz, Ricardo Ruben Garnacho, F. McComb, T. Okabe, S. Zhang, Y. X. Elg, Alf Peter |
author |
Li, Y. |
author_facet |
Li, Y. Hällström, J. Larzelere, W. Bergman, A. Rickmann, J. Hauschild, W. Diaz, Ricardo Ruben Garnacho, F. McComb, T. Okabe, S. Zhang, Y. X. Elg, Alf Peter |
author_role |
author |
author2 |
Hällström, J. Larzelere, W. Bergman, A. Rickmann, J. Hauschild, W. Diaz, Ricardo Ruben Garnacho, F. McComb, T. Okabe, S. Zhang, Y. X. Elg, Alf Peter |
author2_role |
author author author author author author author author author author author |
dc.subject.none.fl_str_mv |
High Voltage High Current Measurement Standard |
topic |
High Voltage High Current Measurement Standard |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/2.2 https://purl.org/becyt/ford/2 |
dc.description.none.fl_txt_mv |
Recently, IEC and IEEE have published a number of revised and new standards for high-voltage and high-current testing. These standards include IEC 60060 1:2010, IEC 60060 2:2010, IEC 61083 2:2013, IEC 62475:2010 and IEEE Std.4 2013. Significant changes and additions have been introduced to these revised and new standards. Many members of CIGRE WG D1.35 were involved in the revision and development of these standards as members of IEC TC 42 and IEEE PSIM Subcommittee HVTT, particularly in the development of the new techniques and new procedures that are now adopted in the standards. This Guide has been written by members of CIGRE WG D1.35 to give high-voltage test engineers a broader knowledge of how to apply the latest high-voltage and high-current testing standards. Fil: Li, Y.. Fil: Hällström, J.. Helsinki University Of Technology; Finlandia Fil: Larzelere, W.. Fil: Bergman, A.. Fil: Rickmann, J.. Fil: Hauschild, W.. Fil: Diaz, Ricardo Ruben. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Tucumán; Argentina Fil: Garnacho, F.. Fil: McComb, T.. Fil: Okabe, S.. Fil: Zhang, Y. X.. Fil: Elg, Alf Peter. |
description |
Recently, IEC and IEEE have published a number of revised and new standards for high-voltage and high-current testing. These standards include IEC 60060 1:2010, IEC 60060 2:2010, IEC 61083 2:2013, IEC 62475:2010 and IEEE Std.4 2013. Significant changes and additions have been introduced to these revised and new standards. Many members of CIGRE WG D1.35 were involved in the revision and development of these standards as members of IEC TC 42 and IEEE PSIM Subcommittee HVTT, particularly in the development of the new techniques and new procedures that are now adopted in the standards. This Guide has been written by members of CIGRE WG D1.35 to give high-voltage test engineers a broader knowledge of how to apply the latest high-voltage and high-current testing standards. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-08 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/7261 Li, Y.; Hällström, J.; Larzelere, W.; Bergman, A.; Rickmann, J.; et al.; Past, Present and Future of IEC and IEEE High-Voltage Testing Standards; International Council on Large Electric Systems; Electra; 276; 8-2014; 65-71 1519-793X |
url |
http://hdl.handle.net/11336/7261 |
identifier_str_mv |
Li, Y.; Hällström, J.; Larzelere, W.; Bergman, A.; Rickmann, J.; et al.; Past, Present and Future of IEC and IEEE High-Voltage Testing Standards; International Council on Large Electric Systems; Electra; 276; 8-2014; 65-71 1519-793X |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/http://www.e-cigre.org/Order/select.asp?ID=1705172 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
International Council on Large Electric Systems |
publisher.none.fl_str_mv |
International Council on Large Electric Systems |
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Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
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