Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy

Autores
Kataev, Elmar; Wechsler, Daniel; Williams, Federico José; Köbl, Julia; Tsud, Natalia; Franchi, Stefano; Steinruck, Hans Peter; Lytken, Ole
Año de publicación
2020
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Thin-film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X-ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated assuming a uniform thickness across a surface. This results in an error for rough films, and the magnitude of this error depends on the kinetic energy of the photoelectrons analyzed. We have used this kinetic-energy dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO2(110). We used two different molecules: cobalt (II) monocarboxyphenyl-10,15,20-triphenylporphyrin (CoMCTPP), with carboxylic-acid anchor groups, and cobalt (II) tetraphenylporphyrin (CoTPP), without anchor groups. We find CoMCTPP to grow as rough films at room temperature across the studied coverage range, whereas for CoTPP the first two layers remain smooth and even; depositing additional CoTPP results in rough films. Although, XPS is not a common technique for measuring roughness, it is fast and provides information of both roughness and thickness in one measurement.
Fil: Kataev, Elmar. Universitat Erlangen-Nuremberg; Alemania
Fil: Wechsler, Daniel. Universitat Erlangen-Nuremberg; Alemania
Fil: Williams, Federico José. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Química, Física de los Materiales, Medioambiente y Energía. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Química, Física de los Materiales, Medioambiente y Energía; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Química Inorgánica, Analítica y Química Física; Argentina
Fil: Köbl, Julia. Universitat Erlangen-Nuremberg; Alemania
Fil: Tsud, Natalia. Karlova Univerzita (cuni); República Checa
Fil: Franchi, Stefano. Istituto di Struttura della Materia; Italia. Consiglio Nazionale delle Ricerche; Italia
Fil: Steinruck, Hans Peter. Universitat Erlangen-Nuremberg; Alemania
Fil: Lytken, Ole. Universitat Erlangen-Nuremberg; Alemania
Materia
GROWTH
PORPHYRIN MOLECULES
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/141385
Acceder
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network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron SpectroscopyKataev, ElmarWechsler, DanielWilliams, Federico JoséKöbl, JuliaTsud, NataliaFranchi, StefanoSteinruck, Hans PeterLytken, OleGROWTHPORPHYRIN MOLECULESTHIN FILMSX-RAY PHOTOELECTRON SPECTROSCOPYhttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1Thin-film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X-ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated assuming a uniform thickness across a surface. This results in an error for rough films, and the magnitude of this error depends on the kinetic energy of the photoelectrons analyzed. We have used this kinetic-energy dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO2(110). We used two different molecules: cobalt (II) monocarboxyphenyl-10,15,20-triphenylporphyrin (CoMCTPP), with carboxylic-acid anchor groups, and cobalt (II) tetraphenylporphyrin (CoTPP), without anchor groups. We find CoMCTPP to grow as rough films at room temperature across the studied coverage range, whereas for CoTPP the first two layers remain smooth and even; depositing additional CoTPP results in rough films. Although, XPS is not a common technique for measuring roughness, it is fast and provides information of both roughness and thickness in one measurement.Fil: Kataev, Elmar. Universitat Erlangen-Nuremberg; AlemaniaFil: Wechsler, Daniel. Universitat Erlangen-Nuremberg; AlemaniaFil: Williams, Federico José. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Química, Física de los Materiales, Medioambiente y Energía. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Química, Física de los Materiales, Medioambiente y Energía; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Química Inorgánica, Analítica y Química Física; ArgentinaFil: Köbl, Julia. Universitat Erlangen-Nuremberg; AlemaniaFil: Tsud, Natalia. Karlova Univerzita (cuni); República ChecaFil: Franchi, Stefano. Istituto di Struttura della Materia; Italia. Consiglio Nazionale delle Ricerche; ItaliaFil: Steinruck, Hans Peter. Universitat Erlangen-Nuremberg; AlemaniaFil: Lytken, Ole. Universitat Erlangen-Nuremberg; AlemaniaWiley VCH Verlag2020-10info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/141385Kataev, Elmar; Wechsler, Daniel; Williams, Federico José; Köbl, Julia; Tsud, Natalia; et al.; Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy; Wiley VCH Verlag; Chemphyschem; 21; 20; 10-2020; 2293-23001439-4235CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1002/cphc.202000568info:eu-repo/semantics/altIdentifier/url/https://chemistry-europe.onlinelibrary.wiley.com/doi/10.1002/cphc.202000568info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:53:08Zoai:ri.conicet.gov.ar:11336/141385instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:53:08.545CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
title Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
spellingShingle Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
Kataev, Elmar
GROWTH
PORPHYRIN MOLECULES
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
title_short Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
title_full Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
title_fullStr Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
title_full_unstemmed Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
title_sort Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
dc.creator.none.fl_str_mv Kataev, Elmar
Wechsler, Daniel
Williams, Federico José
Köbl, Julia
Tsud, Natalia
Franchi, Stefano
Steinruck, Hans Peter
Lytken, Ole
author Kataev, Elmar
author_facet Kataev, Elmar
Wechsler, Daniel
Williams, Federico José
Köbl, Julia
Tsud, Natalia
Franchi, Stefano
Steinruck, Hans Peter
Lytken, Ole
author_role author
author2 Wechsler, Daniel
Williams, Federico José
Köbl, Julia
Tsud, Natalia
Franchi, Stefano
Steinruck, Hans Peter
Lytken, Ole
author2_role author
author
author
author
author
author
author
dc.subject.none.fl_str_mv GROWTH
PORPHYRIN MOLECULES
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
topic GROWTH
PORPHYRIN MOLECULES
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Thin-film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X-ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated assuming a uniform thickness across a surface. This results in an error for rough films, and the magnitude of this error depends on the kinetic energy of the photoelectrons analyzed. We have used this kinetic-energy dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO2(110). We used two different molecules: cobalt (II) monocarboxyphenyl-10,15,20-triphenylporphyrin (CoMCTPP), with carboxylic-acid anchor groups, and cobalt (II) tetraphenylporphyrin (CoTPP), without anchor groups. We find CoMCTPP to grow as rough films at room temperature across the studied coverage range, whereas for CoTPP the first two layers remain smooth and even; depositing additional CoTPP results in rough films. Although, XPS is not a common technique for measuring roughness, it is fast and provides information of both roughness and thickness in one measurement.
Fil: Kataev, Elmar. Universitat Erlangen-Nuremberg; Alemania
Fil: Wechsler, Daniel. Universitat Erlangen-Nuremberg; Alemania
Fil: Williams, Federico José. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Química, Física de los Materiales, Medioambiente y Energía. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Química, Física de los Materiales, Medioambiente y Energía; Argentina. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Departamento de Química Inorgánica, Analítica y Química Física; Argentina
Fil: Köbl, Julia. Universitat Erlangen-Nuremberg; Alemania
Fil: Tsud, Natalia. Karlova Univerzita (cuni); República Checa
Fil: Franchi, Stefano. Istituto di Struttura della Materia; Italia. Consiglio Nazionale delle Ricerche; Italia
Fil: Steinruck, Hans Peter. Universitat Erlangen-Nuremberg; Alemania
Fil: Lytken, Ole. Universitat Erlangen-Nuremberg; Alemania
description Thin-film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X-ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated assuming a uniform thickness across a surface. This results in an error for rough films, and the magnitude of this error depends on the kinetic energy of the photoelectrons analyzed. We have used this kinetic-energy dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO2(110). We used two different molecules: cobalt (II) monocarboxyphenyl-10,15,20-triphenylporphyrin (CoMCTPP), with carboxylic-acid anchor groups, and cobalt (II) tetraphenylporphyrin (CoTPP), without anchor groups. We find CoMCTPP to grow as rough films at room temperature across the studied coverage range, whereas for CoTPP the first two layers remain smooth and even; depositing additional CoTPP results in rough films. Although, XPS is not a common technique for measuring roughness, it is fast and provides information of both roughness and thickness in one measurement.
publishDate 2020
dc.date.none.fl_str_mv 2020-10
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/141385
Kataev, Elmar; Wechsler, Daniel; Williams, Federico José; Köbl, Julia; Tsud, Natalia; et al.; Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy; Wiley VCH Verlag; Chemphyschem; 21; 20; 10-2020; 2293-2300
1439-4235
CONICET Digital
CONICET
url http://hdl.handle.net/11336/141385
identifier_str_mv Kataev, Elmar; Wechsler, Daniel; Williams, Federico José; Köbl, Julia; Tsud, Natalia; et al.; Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy; Wiley VCH Verlag; Chemphyschem; 21; 20; 10-2020; 2293-2300
1439-4235
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1002/cphc.202000568
info:eu-repo/semantics/altIdentifier/url/https://chemistry-europe.onlinelibrary.wiley.com/doi/10.1002/cphc.202000568
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Wiley VCH Verlag
publisher.none.fl_str_mv Wiley VCH Verlag
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.13397

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