Cita APA

Kataev, E., Wechsler, D., Williams, F. J., Köbl, J., Tsud, N., Franchi, S., . . . Lytken, O. (2020). Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy. Web

Citación estilo Chicago

Kataev, Elmar, Daniel Wechsler, Federico José Williams, Julia Köbl, Natalia Tsud, Stefano Franchi, Hans Peter Steinruck, and Ole Lytken. Probing the Roughness of Porphyrin Thin Films With X-ray Photoelectron Spectroscopy. 2020.

Cita MLA

Kataev, Elmar, et al. Probing the Roughness of Porphyrin Thin Films With X-ray Photoelectron Spectroscopy. 2020.