Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions

Autores
Leani, Juan Jose; Sanchez, Hector Jorge; Perez, Roberto Daniel; Perez, Carlos
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Both X-ray total reflection and X-ray Raman scattering techniques were combined to discriminate chemical environments in depth-profiling studies using an energy dispersive system. This allowed, for the first time, to resolve oxidation state on surface nanolayers with a low-resolution system. Samples of pure Cu and Fe oxidized in tap water and salty water, respectively, were studied in the Brazilian synchrotron facility using monochromatic radiation and an EDS setup. The measurements were carried out in total reflection geometry with incident energy lower and close to the K absorption edge of both elements. The results allowed observing the presence of very thin oxide layers, usually not observable with conventional geometries of irradiation. They also permit the identification of the compound present in a particular depth of the sample with nanometric, or even subnanometric, resolution using a low-resolution system.
Fil: Leani, Juan Jose. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Sanchez, Hector Jorge. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Perez, Roberto Daniel. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Perez, Carlos. Laboratorio Nacional de Luz Síncrotron; Brasil
Materia
Raman
Nano-Análisis
Perfil Superficial
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/25801
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditionsLeani, Juan JoseSanchez, Hector JorgePerez, Roberto DanielPerez, CarlosRamanNano-AnálisisPerfil Superficialhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Both X-ray total reflection and X-ray Raman scattering techniques were combined to discriminate chemical environments in depth-profiling studies using an energy dispersive system. This allowed, for the first time, to resolve oxidation state on surface nanolayers with a low-resolution system. Samples of pure Cu and Fe oxidized in tap water and salty water, respectively, were studied in the Brazilian synchrotron facility using monochromatic radiation and an EDS setup. The measurements were carried out in total reflection geometry with incident energy lower and close to the K absorption edge of both elements. The results allowed observing the presence of very thin oxide layers, usually not observable with conventional geometries of irradiation. They also permit the identification of the compound present in a particular depth of the sample with nanometric, or even subnanometric, resolution using a low-resolution system.Fil: Leani, Juan Jose. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Sanchez, Hector Jorge. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Perez, Roberto Daniel. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Perez, Carlos. Laboratorio Nacional de Luz Síncrotron; BrasilAmerican Chemical Society2013-06info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/25801Leani, Juan Jose; Sanchez, Hector Jorge; Perez, Roberto Daniel; Perez, Carlos; Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions; American Chemical Society; Analytical Chemistry; 85; 15; 6-2013; 7069-70750003-2700CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1021/ac4000317info:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/ac4000317info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:36:07Zoai:ri.conicet.gov.ar:11336/25801instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:36:07.672CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
title Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
spellingShingle Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
Leani, Juan Jose
Raman
Nano-Análisis
Perfil Superficial
title_short Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
title_full Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
title_fullStr Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
title_full_unstemmed Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
title_sort Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions
dc.creator.none.fl_str_mv Leani, Juan Jose
Sanchez, Hector Jorge
Perez, Roberto Daniel
Perez, Carlos
author Leani, Juan Jose
author_facet Leani, Juan Jose
Sanchez, Hector Jorge
Perez, Roberto Daniel
Perez, Carlos
author_role author
author2 Sanchez, Hector Jorge
Perez, Roberto Daniel
Perez, Carlos
author2_role author
author
author
dc.subject.none.fl_str_mv Raman
Nano-Análisis
Perfil Superficial
topic Raman
Nano-Análisis
Perfil Superficial
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Both X-ray total reflection and X-ray Raman scattering techniques were combined to discriminate chemical environments in depth-profiling studies using an energy dispersive system. This allowed, for the first time, to resolve oxidation state on surface nanolayers with a low-resolution system. Samples of pure Cu and Fe oxidized in tap water and salty water, respectively, were studied in the Brazilian synchrotron facility using monochromatic radiation and an EDS setup. The measurements were carried out in total reflection geometry with incident energy lower and close to the K absorption edge of both elements. The results allowed observing the presence of very thin oxide layers, usually not observable with conventional geometries of irradiation. They also permit the identification of the compound present in a particular depth of the sample with nanometric, or even subnanometric, resolution using a low-resolution system.
Fil: Leani, Juan Jose. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Sanchez, Hector Jorge. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Perez, Roberto Daniel. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía y Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Perez, Carlos. Laboratorio Nacional de Luz Síncrotron; Brasil
description Both X-ray total reflection and X-ray Raman scattering techniques were combined to discriminate chemical environments in depth-profiling studies using an energy dispersive system. This allowed, for the first time, to resolve oxidation state on surface nanolayers with a low-resolution system. Samples of pure Cu and Fe oxidized in tap water and salty water, respectively, were studied in the Brazilian synchrotron facility using monochromatic radiation and an EDS setup. The measurements were carried out in total reflection geometry with incident energy lower and close to the K absorption edge of both elements. The results allowed observing the presence of very thin oxide layers, usually not observable with conventional geometries of irradiation. They also permit the identification of the compound present in a particular depth of the sample with nanometric, or even subnanometric, resolution using a low-resolution system.
publishDate 2013
dc.date.none.fl_str_mv 2013-06
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/25801
Leani, Juan Jose; Sanchez, Hector Jorge; Perez, Roberto Daniel; Perez, Carlos; Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions; American Chemical Society; Analytical Chemistry; 85; 15; 6-2013; 7069-7075
0003-2700
CONICET Digital
CONICET
url http://hdl.handle.net/11336/25801
identifier_str_mv Leani, Juan Jose; Sanchez, Hector Jorge; Perez, Roberto Daniel; Perez, Carlos; Depth profiling nano-analysis of chemical environments using resonant Raman spectroscopy at grazing incidence conditions; American Chemical Society; Analytical Chemistry; 85; 15; 6-2013; 7069-7075
0003-2700
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1021/ac4000317
info:eu-repo/semantics/altIdentifier/url/http://pubs.acs.org/doi/abs/10.1021/ac4000317
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Chemical Society
publisher.none.fl_str_mv American Chemical Society
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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