Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
- Autores
- Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; Geraldo, Daniela A.; Arratia Perez, Ramiro
- Año de publicación
- 2016
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.
Fil: Oyarzún Jerez, Diego Patricio. Universidad Andrés Bello; Chile
Fil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
Fil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
Fil: Zuñiga, César. Universidad Andrés Bello; Chile
Fil: Jeraldo, Eduardo. Universidad Andrés Bello; Chile
Fil: Geraldo, Daniela A.. Universidad Andrés Bello; Chile
Fil: Arratia Perez, Ramiro. Universidad Andrés Bello; Chile - Materia
-
3d Confocal Microscopy
Materials Characterization
Thin Films
Tio2 Nanoporous
Tuning Fork Afm - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/50410
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oai:ri.conicet.gov.ar:11336/50410 |
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spelling |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layersOyarzún Jerez, Diego PatricioLinarez Pérez, Omar EzequielLopez Teijelo, ManuelZuñiga, CésarJeraldo, EduardoGeraldo, Daniela A.Arratia Perez, Ramiro3d Confocal MicroscopyMaterials CharacterizationThin FilmsTio2 NanoporousTuning Fork Afmhttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.Fil: Oyarzún Jerez, Diego Patricio. Universidad Andrés Bello; ChileFil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; ArgentinaFil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; ArgentinaFil: Zuñiga, César. Universidad Andrés Bello; ChileFil: Jeraldo, Eduardo. Universidad Andrés Bello; ChileFil: Geraldo, Daniela A.. Universidad Andrés Bello; ChileFil: Arratia Perez, Ramiro. Universidad Andrés Bello; ChileElsevier Science2016-02-25info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/50410Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; et al.; Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers; Elsevier Science; Materials Letters; 165; 25-2-2016; 67-700167-577XCONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0167577X15309095info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matlet.2015.11.087info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:51:28Zoai:ri.conicet.gov.ar:11336/50410instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:51:28.451CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
title |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
spellingShingle |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers Oyarzún Jerez, Diego Patricio 3d Confocal Microscopy Materials Characterization Thin Films Tio2 Nanoporous Tuning Fork Afm |
title_short |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
title_full |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
title_fullStr |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
title_full_unstemmed |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
title_sort |
Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers |
dc.creator.none.fl_str_mv |
Oyarzún Jerez, Diego Patricio Linarez Pérez, Omar Ezequiel Lopez Teijelo, Manuel Zuñiga, César Jeraldo, Eduardo Geraldo, Daniela A. Arratia Perez, Ramiro |
author |
Oyarzún Jerez, Diego Patricio |
author_facet |
Oyarzún Jerez, Diego Patricio Linarez Pérez, Omar Ezequiel Lopez Teijelo, Manuel Zuñiga, César Jeraldo, Eduardo Geraldo, Daniela A. Arratia Perez, Ramiro |
author_role |
author |
author2 |
Linarez Pérez, Omar Ezequiel Lopez Teijelo, Manuel Zuñiga, César Jeraldo, Eduardo Geraldo, Daniela A. Arratia Perez, Ramiro |
author2_role |
author author author author author author |
dc.subject.none.fl_str_mv |
3d Confocal Microscopy Materials Characterization Thin Films Tio2 Nanoporous Tuning Fork Afm |
topic |
3d Confocal Microscopy Materials Characterization Thin Films Tio2 Nanoporous Tuning Fork Afm |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.4 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting. Fil: Oyarzún Jerez, Diego Patricio. Universidad Andrés Bello; Chile Fil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina Fil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina Fil: Zuñiga, César. Universidad Andrés Bello; Chile Fil: Jeraldo, Eduardo. Universidad Andrés Bello; Chile Fil: Geraldo, Daniela A.. Universidad Andrés Bello; Chile Fil: Arratia Perez, Ramiro. Universidad Andrés Bello; Chile |
description |
The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting. |
publishDate |
2016 |
dc.date.none.fl_str_mv |
2016-02-25 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/50410 Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; et al.; Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers; Elsevier Science; Materials Letters; 165; 25-2-2016; 67-70 0167-577X CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/50410 |
identifier_str_mv |
Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; et al.; Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers; Elsevier Science; Materials Letters; 165; 25-2-2016; 67-70 0167-577X CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0167577X15309095 info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matlet.2015.11.087 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier Science |
publisher.none.fl_str_mv |
Elsevier Science |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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1844613582370635776 |
score |
13.070432 |