Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers

Autores
Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; Geraldo, Daniela A.; Arratia Perez, Ramiro
Año de publicación
2016
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.
Fil: Oyarzún Jerez, Diego Patricio. Universidad Andrés Bello; Chile
Fil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
Fil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
Fil: Zuñiga, César. Universidad Andrés Bello; Chile
Fil: Jeraldo, Eduardo. Universidad Andrés Bello; Chile
Fil: Geraldo, Daniela A.. Universidad Andrés Bello; Chile
Fil: Arratia Perez, Ramiro. Universidad Andrés Bello; Chile
Materia
3d Confocal Microscopy
Materials Characterization
Thin Films
Tio2 Nanoporous
Tuning Fork Afm
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/50410
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layersOyarzún Jerez, Diego PatricioLinarez Pérez, Omar EzequielLopez Teijelo, ManuelZuñiga, CésarJeraldo, EduardoGeraldo, Daniela A.Arratia Perez, Ramiro3d Confocal MicroscopyMaterials CharacterizationThin FilmsTio2 NanoporousTuning Fork Afmhttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.Fil: Oyarzún Jerez, Diego Patricio. Universidad Andrés Bello; ChileFil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; ArgentinaFil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; ArgentinaFil: Zuñiga, César. Universidad Andrés Bello; ChileFil: Jeraldo, Eduardo. Universidad Andrés Bello; ChileFil: Geraldo, Daniela A.. Universidad Andrés Bello; ChileFil: Arratia Perez, Ramiro. Universidad Andrés Bello; ChileElsevier Science2016-02-25info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/50410Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; et al.; Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers; Elsevier Science; Materials Letters; 165; 25-2-2016; 67-700167-577XCONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0167577X15309095info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matlet.2015.11.087info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:20:52Zoai:ri.conicet.gov.ar:11336/50410instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:20:52.524CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
title Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
spellingShingle Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
Oyarzún Jerez, Diego Patricio
3d Confocal Microscopy
Materials Characterization
Thin Films
Tio2 Nanoporous
Tuning Fork Afm
title_short Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
title_full Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
title_fullStr Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
title_full_unstemmed Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
title_sort Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers
dc.creator.none.fl_str_mv Oyarzún Jerez, Diego Patricio
Linarez Pérez, Omar Ezequiel
Lopez Teijelo, Manuel
Zuñiga, César
Jeraldo, Eduardo
Geraldo, Daniela A.
Arratia Perez, Ramiro
author Oyarzún Jerez, Diego Patricio
author_facet Oyarzún Jerez, Diego Patricio
Linarez Pérez, Omar Ezequiel
Lopez Teijelo, Manuel
Zuñiga, César
Jeraldo, Eduardo
Geraldo, Daniela A.
Arratia Perez, Ramiro
author_role author
author2 Linarez Pérez, Omar Ezequiel
Lopez Teijelo, Manuel
Zuñiga, César
Jeraldo, Eduardo
Geraldo, Daniela A.
Arratia Perez, Ramiro
author2_role author
author
author
author
author
author
dc.subject.none.fl_str_mv 3d Confocal Microscopy
Materials Characterization
Thin Films
Tio2 Nanoporous
Tuning Fork Afm
topic 3d Confocal Microscopy
Materials Characterization
Thin Films
Tio2 Nanoporous
Tuning Fork Afm
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.
Fil: Oyarzún Jerez, Diego Patricio. Universidad Andrés Bello; Chile
Fil: Linarez Pérez, Omar Ezequiel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
Fil: Lopez Teijelo, Manuel. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; Argentina
Fil: Zuñiga, César. Universidad Andrés Bello; Chile
Fil: Jeraldo, Eduardo. Universidad Andrés Bello; Chile
Fil: Geraldo, Daniela A.. Universidad Andrés Bello; Chile
Fil: Arratia Perez, Ramiro. Universidad Andrés Bello; Chile
description The morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting.
publishDate 2016
dc.date.none.fl_str_mv 2016-02-25
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/50410
Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; et al.; Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers; Elsevier Science; Materials Letters; 165; 25-2-2016; 67-70
0167-577X
CONICET Digital
CONICET
url http://hdl.handle.net/11336/50410
identifier_str_mv Oyarzún Jerez, Diego Patricio; Linarez Pérez, Omar Ezequiel; Lopez Teijelo, Manuel; Zuñiga, César; Jeraldo, Eduardo; et al.; Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers; Elsevier Science; Materials Letters; 165; 25-2-2016; 67-70
0167-577X
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S0167577X15309095
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.matlet.2015.11.087
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier Science
publisher.none.fl_str_mv Elsevier Science
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 12.982451

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