Cita APA

Oyarzún Jerez, D. P., Linarez Pérez, O. E., Lopez Teijelo, M., Zuñiga, C., Jeraldo, E., Geraldo, D. A., & Arratia Perez, R. (2016). Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers. Web

Citación estilo Chicago

Oyarzún Jerez, Diego Patricio, Omar Ezequiel Linarez Pérez, Manuel Lopez Teijelo, César Zuñiga, Eduardo Jeraldo, Daniela A. Geraldo, and Ramiro Arratia Perez. Atomic Force Microscopy (AFM) and 3D Confocal Microscopy As Alternative Techniques for the Morphological Characterization of Anodic TiO2 Nanoporous Layers. 2016.

Cita MLA

Oyarzún Jerez, Diego Patricio, et al. Atomic Force Microscopy (AFM) and 3D Confocal Microscopy As Alternative Techniques for the Morphological Characterization of Anodic TiO2 Nanoporous Layers. 2016.