Defect spectroscopy of single ZnO microwires

Autores
Villafuerte, Manuel Jose; Ferreyra, J. M.; Zapata, C.; Barzola Quiquia, J.; Iikawa, F.; Esquinazi, P.; Huleani, S. P.; de Lima, M. M.; Cantarero, A.
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
The point defects of single ZnO microwires grown by carbothermal reduction were studied by microphotoluminescence, photoresistance excitation spectra, and resistance as a function of the temperature. We found the deep level defect density profile along the microwire showing that the concentration of defects decreases from the base to the tip of the microwires and this effect correlates with a band gap narrowing. The results show a characteristic deep defect levels inside the gap at 0.88 eV from the top of the VB. The resistance as a function of the temperature shows defect levels next to the bottom of the CB at 110 meV and a mean defect concentration of 4 1018 cm3 . This combination of techniques allows us to study the band gap values and defects states inside the gap in single ZnO microwires and opens the possibility to be used as a defect spectroscopy method.
Fil: Villafuerte, Manuel Jose. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Ferreyra, J. M.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina
Fil: Zapata, C.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina
Fil: Barzola Quiquia, J.. University of Leipzig; Alemania
Fil: Iikawa, F.. Instituto de Física “Gleb Wataghin"; Brasil
Fil: Esquinazi, P.. University of Leipzig; Alemania
Fil: Huleani, S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina
Fil: de Lima, M. M.. Universidad de Valencia; España
Fil: Cantarero, A.. Universidad de Valencia; España
Materia
Microwires
ZnO
Defects
Spectroscopy
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/12760
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Defect spectroscopy of single ZnO microwiresVillafuerte, Manuel JoseFerreyra, J. M.Zapata, C.Barzola Quiquia, J.Iikawa, F.Esquinazi, P.Huleani, S. P.de Lima, M. M.Cantarero, A.MicrowiresZnODefectsSpectroscopyhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1The point defects of single ZnO microwires grown by carbothermal reduction were studied by microphotoluminescence, photoresistance excitation spectra, and resistance as a function of the temperature. We found the deep level defect density profile along the microwire showing that the concentration of defects decreases from the base to the tip of the microwires and this effect correlates with a band gap narrowing. The results show a characteristic deep defect levels inside the gap at 0.88 eV from the top of the VB. The resistance as a function of the temperature shows defect levels next to the bottom of the CB at 110 meV and a mean defect concentration of 4 1018 cm3 . This combination of techniques allows us to study the band gap values and defects states inside the gap in single ZnO microwires and opens the possibility to be used as a defect spectroscopy method.Fil: Villafuerte, Manuel Jose. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Ferreyra, J. M.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; ArgentinaFil: Zapata, C.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; ArgentinaFil: Barzola Quiquia, J.. University of Leipzig; AlemaniaFil: Iikawa, F.. Instituto de Física “Gleb Wataghin"; BrasilFil: Esquinazi, P.. University of Leipzig; AlemaniaFil: Huleani, S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; ArgentinaFil: de Lima, M. M.. Universidad de Valencia; EspañaFil: Cantarero, A.. Universidad de Valencia; EspañaAmerican Institute Of Physics2014-04info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/12760Villafuerte, Manuel Jose; Ferreyra, J. M.; Zapata, C.; Barzola Quiquia, J.; Iikawa, F.; et al.; Defect spectroscopy of single ZnO microwires; American Institute Of Physics; Journal Of Applied Physics; 115; 13; 4-2014; 1-5; 1331010021-8979enginfo:eu-repo/semantics/altIdentifier/doi/10.1063/1.4869555info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4869555info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:51:54Zoai:ri.conicet.gov.ar:11336/12760instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:51:54.619CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Defect spectroscopy of single ZnO microwires
title Defect spectroscopy of single ZnO microwires
spellingShingle Defect spectroscopy of single ZnO microwires
Villafuerte, Manuel Jose
Microwires
ZnO
Defects
Spectroscopy
title_short Defect spectroscopy of single ZnO microwires
title_full Defect spectroscopy of single ZnO microwires
title_fullStr Defect spectroscopy of single ZnO microwires
title_full_unstemmed Defect spectroscopy of single ZnO microwires
title_sort Defect spectroscopy of single ZnO microwires
dc.creator.none.fl_str_mv Villafuerte, Manuel Jose
Ferreyra, J. M.
Zapata, C.
Barzola Quiquia, J.
Iikawa, F.
Esquinazi, P.
Huleani, S. P.
de Lima, M. M.
Cantarero, A.
author Villafuerte, Manuel Jose
author_facet Villafuerte, Manuel Jose
Ferreyra, J. M.
Zapata, C.
Barzola Quiquia, J.
Iikawa, F.
Esquinazi, P.
Huleani, S. P.
de Lima, M. M.
Cantarero, A.
author_role author
author2 Ferreyra, J. M.
Zapata, C.
Barzola Quiquia, J.
Iikawa, F.
Esquinazi, P.
Huleani, S. P.
de Lima, M. M.
Cantarero, A.
author2_role author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Microwires
ZnO
Defects
Spectroscopy
topic Microwires
ZnO
Defects
Spectroscopy
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv The point defects of single ZnO microwires grown by carbothermal reduction were studied by microphotoluminescence, photoresistance excitation spectra, and resistance as a function of the temperature. We found the deep level defect density profile along the microwire showing that the concentration of defects decreases from the base to the tip of the microwires and this effect correlates with a band gap narrowing. The results show a characteristic deep defect levels inside the gap at 0.88 eV from the top of the VB. The resistance as a function of the temperature shows defect levels next to the bottom of the CB at 110 meV and a mean defect concentration of 4 1018 cm3 . This combination of techniques allows us to study the band gap values and defects states inside the gap in single ZnO microwires and opens the possibility to be used as a defect spectroscopy method.
Fil: Villafuerte, Manuel Jose. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Ferreyra, J. M.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina
Fil: Zapata, C.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina
Fil: Barzola Quiquia, J.. University of Leipzig; Alemania
Fil: Iikawa, F.. Instituto de Física “Gleb Wataghin"; Brasil
Fil: Esquinazi, P.. University of Leipzig; Alemania
Fil: Huleani, S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina
Fil: de Lima, M. M.. Universidad de Valencia; España
Fil: Cantarero, A.. Universidad de Valencia; España
description The point defects of single ZnO microwires grown by carbothermal reduction were studied by microphotoluminescence, photoresistance excitation spectra, and resistance as a function of the temperature. We found the deep level defect density profile along the microwire showing that the concentration of defects decreases from the base to the tip of the microwires and this effect correlates with a band gap narrowing. The results show a characteristic deep defect levels inside the gap at 0.88 eV from the top of the VB. The resistance as a function of the temperature shows defect levels next to the bottom of the CB at 110 meV and a mean defect concentration of 4 1018 cm3 . This combination of techniques allows us to study the band gap values and defects states inside the gap in single ZnO microwires and opens the possibility to be used as a defect spectroscopy method.
publishDate 2014
dc.date.none.fl_str_mv 2014-04
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/12760
Villafuerte, Manuel Jose; Ferreyra, J. M.; Zapata, C.; Barzola Quiquia, J.; Iikawa, F.; et al.; Defect spectroscopy of single ZnO microwires; American Institute Of Physics; Journal Of Applied Physics; 115; 13; 4-2014; 1-5; 133101
0021-8979
url http://hdl.handle.net/11336/12760
identifier_str_mv Villafuerte, Manuel Jose; Ferreyra, J. M.; Zapata, C.; Barzola Quiquia, J.; Iikawa, F.; et al.; Defect spectroscopy of single ZnO microwires; American Institute Of Physics; Journal Of Applied Physics; 115; 13; 4-2014; 1-5; 133101
0021-8979
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4869555
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.4869555
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Institute Of Physics
publisher.none.fl_str_mv American Institute Of Physics
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.13397

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