A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture
- Autores
- Chen, Yung-Yuan
- Año de publicación
- 2006
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- In this paper, we propose an efficient diagnosis scheme to detect and locate the switching network defects/faults in reconfigurable array architecture. This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occurring in the switching network. After the diagnosis of switching network, the processing element (PE) test can then be initiated through the good switches and links. Errors in testing that cause a good switch, link or PE to be considered as a bad one is called "killing error". The issue of killing error in testing is addressed and the probability of killing error for our diagnosis technique is analyzed and shown to be extremely low. The significance of this approach is the ability to detect and locate the multiple faults in switches, links, and PEs with low testing circuit overhead, and to offer the good test quality in linear diagnosis time.
Facultad de Informática - Materia
-
Ciencias Informáticas
Reliability, Testing, and Fault-Tolerance
Arrays
switching network - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- http://creativecommons.org/licenses/by-nc/3.0/
- Repositorio
- Institución
- Universidad Nacional de La Plata
- OAI Identificador
- oai:sedici.unlp.edu.ar:10915/9511
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A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array ArchitectureChen, Yung-YuanCiencias InformáticasReliability, Testing, and Fault-ToleranceArraysswitching networkIn this paper, we propose an efficient diagnosis scheme to detect and locate the switching network defects/faults in reconfigurable array architecture. This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occurring in the switching network. After the diagnosis of switching network, the processing element (PE) test can then be initiated through the good switches and links. Errors in testing that cause a good switch, link or PE to be considered as a bad one is called "killing error". The issue of killing error in testing is addressed and the probability of killing error for our diagnosis technique is analyzed and shown to be extremely low. The significance of this approach is the ability to detect and locate the multiple faults in switches, links, and PEs with low testing circuit overhead, and to offer the good test quality in linear diagnosis time.Facultad de Informática2006-04info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdf12-21http://sedici.unlp.edu.ar/handle/10915/9511enginfo:eu-repo/semantics/altIdentifier/url/http://journal.info.unlp.edu.ar/wp-content/uploads/JCST-Apr06-3.pdfinfo:eu-repo/semantics/altIdentifier/issn/1666-6038info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc/3.0/Creative Commons Attribution-NonCommercial 3.0 Unported (CC BY-NC 3.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-09-03T10:23:34Zoai:sedici.unlp.edu.ar:10915/9511Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-09-03 10:23:34.582SEDICI (UNLP) - Universidad Nacional de La Platafalse |
dc.title.none.fl_str_mv |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
title |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
spellingShingle |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture Chen, Yung-Yuan Ciencias Informáticas Reliability, Testing, and Fault-Tolerance Arrays switching network |
title_short |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
title_full |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
title_fullStr |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
title_full_unstemmed |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
title_sort |
A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture |
dc.creator.none.fl_str_mv |
Chen, Yung-Yuan |
author |
Chen, Yung-Yuan |
author_facet |
Chen, Yung-Yuan |
author_role |
author |
dc.subject.none.fl_str_mv |
Ciencias Informáticas Reliability, Testing, and Fault-Tolerance Arrays switching network |
topic |
Ciencias Informáticas Reliability, Testing, and Fault-Tolerance Arrays switching network |
dc.description.none.fl_txt_mv |
In this paper, we propose an efficient diagnosis scheme to detect and locate the switching network defects/faults in reconfigurable array architecture. This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occurring in the switching network. After the diagnosis of switching network, the processing element (PE) test can then be initiated through the good switches and links. Errors in testing that cause a good switch, link or PE to be considered as a bad one is called "killing error". The issue of killing error in testing is addressed and the probability of killing error for our diagnosis technique is analyzed and shown to be extremely low. The significance of this approach is the ability to detect and locate the multiple faults in switches, links, and PEs with low testing circuit overhead, and to offer the good test quality in linear diagnosis time. Facultad de Informática |
description |
In this paper, we propose an efficient diagnosis scheme to detect and locate the switching network defects/faults in reconfigurable array architecture. This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occurring in the switching network. After the diagnosis of switching network, the processing element (PE) test can then be initiated through the good switches and links. Errors in testing that cause a good switch, link or PE to be considered as a bad one is called "killing error". The issue of killing error in testing is addressed and the probability of killing error for our diagnosis technique is analyzed and shown to be extremely low. The significance of this approach is the ability to detect and locate the multiple faults in switches, links, and PEs with low testing circuit overhead, and to offer the good test quality in linear diagnosis time. |
publishDate |
2006 |
dc.date.none.fl_str_mv |
2006-04 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Articulo http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://sedici.unlp.edu.ar/handle/10915/9511 |
url |
http://sedici.unlp.edu.ar/handle/10915/9511 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/http://journal.info.unlp.edu.ar/wp-content/uploads/JCST-Apr06-3.pdf info:eu-repo/semantics/altIdentifier/issn/1666-6038 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc/3.0/ Creative Commons Attribution-NonCommercial 3.0 Unported (CC BY-NC 3.0) |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
http://creativecommons.org/licenses/by-nc/3.0/ Creative Commons Attribution-NonCommercial 3.0 Unported (CC BY-NC 3.0) |
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application/pdf 12-21 |
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