Optical and electrical properties of nanostructured metallic electrical contacts

Autores
Toranzos, Victor J.; Ortiz, Guillermo P.; Mochán, W. Luis; Zerbino, Jorge Omar
Año de publicación
2017
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rsmax ≈ 2.7 Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas
Materia
Física
Effective media
Hotspots
Recursive algorithms
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by/3.0/
Repositorio
SEDICI (UNLP)
Institución
Universidad Nacional de La Plata
OAI Identificador
oai:sedici.unlp.edu.ar:10915/87462

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network_name_str SEDICI (UNLP)
spelling Optical and electrical properties of nanostructured metallic electrical contactsToranzos, Victor J.Ortiz, Guillermo P.Mochán, W. LuisZerbino, Jorge OmarFísicaEffective mediaHotspotsRecursive algorithmsWe study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rsmax ≈ 2.7 Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas2017info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArticulohttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfhttp://sedici.unlp.edu.ar/handle/10915/87462enginfo:eu-repo/semantics/altIdentifier/issn/2053-1591info:eu-repo/semantics/altIdentifier/doi/10.1088/2053-1591/aa58bdinfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by/3.0/Creative Commons Attribution 3.0 Unported (CC BY 3.0)reponame:SEDICI (UNLP)instname:Universidad Nacional de La Platainstacron:UNLP2025-09-29T11:17:18Zoai:sedici.unlp.edu.ar:10915/87462Institucionalhttp://sedici.unlp.edu.ar/Universidad públicaNo correspondehttp://sedici.unlp.edu.ar/oai/snrdalira@sedici.unlp.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:13292025-09-29 11:17:19.272SEDICI (UNLP) - Universidad Nacional de La Platafalse
dc.title.none.fl_str_mv Optical and electrical properties of nanostructured metallic electrical contacts
title Optical and electrical properties of nanostructured metallic electrical contacts
spellingShingle Optical and electrical properties of nanostructured metallic electrical contacts
Toranzos, Victor J.
Física
Effective media
Hotspots
Recursive algorithms
title_short Optical and electrical properties of nanostructured metallic electrical contacts
title_full Optical and electrical properties of nanostructured metallic electrical contacts
title_fullStr Optical and electrical properties of nanostructured metallic electrical contacts
title_full_unstemmed Optical and electrical properties of nanostructured metallic electrical contacts
title_sort Optical and electrical properties of nanostructured metallic electrical contacts
dc.creator.none.fl_str_mv Toranzos, Victor J.
Ortiz, Guillermo P.
Mochán, W. Luis
Zerbino, Jorge Omar
author Toranzos, Victor J.
author_facet Toranzos, Victor J.
Ortiz, Guillermo P.
Mochán, W. Luis
Zerbino, Jorge Omar
author_role author
author2 Ortiz, Guillermo P.
Mochán, W. Luis
Zerbino, Jorge Omar
author2_role author
author
author
dc.subject.none.fl_str_mv Física
Effective media
Hotspots
Recursive algorithms
topic Física
Effective media
Hotspots
Recursive algorithms
dc.description.none.fl_txt_mv We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rsmax ≈ 2.7 Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.
Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas
description We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rsmax ≈ 2.7 Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.
publishDate 2017
dc.date.none.fl_str_mv 2017
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Articulo
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://sedici.unlp.edu.ar/handle/10915/87462
url http://sedici.unlp.edu.ar/handle/10915/87462
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/issn/2053-1591
info:eu-repo/semantics/altIdentifier/doi/10.1088/2053-1591/aa58bd
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by/3.0/
Creative Commons Attribution 3.0 Unported (CC BY 3.0)
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by/3.0/
Creative Commons Attribution 3.0 Unported (CC BY 3.0)
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:SEDICI (UNLP)
instname:Universidad Nacional de La Plata
instacron:UNLP
reponame_str SEDICI (UNLP)
collection SEDICI (UNLP)
instname_str Universidad Nacional de La Plata
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institution UNLP
repository.name.fl_str_mv SEDICI (UNLP) - Universidad Nacional de La Plata
repository.mail.fl_str_mv alira@sedici.unlp.edu.ar
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