Optical and electrical properties of nanostructured metallic electrical contacts

Autores
Toranzos, Víctor José; Ortiz, Guillermo Pablo; Mochán, W. Luis; Zerbino, Jorge O.
Año de publicación
2017
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Fil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina.
Fil: Mochán, W. Luis. Universidad Nacional Autónoma de México. Instituto de Ciencias Físicas; Argentina.
Fil: Zerbino, Jorge O. Centro Investigaciones Científicas de la Provincia de Buenos Aires. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas; Argentina.
We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.
Fuente
Materials Research Express, 2017, vol. 4, no. 1, p. 1-11.
Materia
Hotspots
Effective media
Recursive algorithms
Nivel de accesibilidad
acceso abierto
Condiciones de uso
http://creativecommons.org/licenses/by-nc-nd/2.5/ar/
Repositorio
Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)
Institución
Universidad Nacional del Nordeste
OAI Identificador
oai:repositorio.unne.edu.ar:123456789/28082

id RIUNNE_185fa6e89f8e565003864941f1477afc
oai_identifier_str oai:repositorio.unne.edu.ar:123456789/28082
network_acronym_str RIUNNE
repository_id_str 4871
network_name_str Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)
spelling Optical and electrical properties of nanostructured metallic electrical contactsToranzos, Víctor JoséOrtiz, Guillermo PabloMochán, W. LuisZerbino, Jorge O.HotspotsEffective mediaRecursive algorithmsFil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina.Fil: Mochán, W. Luis. Universidad Nacional Autónoma de México. Instituto de Ciencias Físicas; Argentina.Fil: Zerbino, Jorge O. Centro Investigaciones Científicas de la Provincia de Buenos Aires. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas; Argentina.We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.IOP Publishing Ltd2017info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfToranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591.2053-1591http://repositorio.unne.edu.ar/handle/123456789/28082Materials Research Express, 2017, vol. 4, no. 1, p. 1-11.reponame:Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)instname:Universidad Nacional del Nordesteenginfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/2.5/ar/Atribución-NoComercial-SinDerivadas 2.5 Argentina2025-09-29T14:29:25Zoai:repositorio.unne.edu.ar:123456789/28082instacron:UNNEInstitucionalhttp://repositorio.unne.edu.ar/Universidad públicaNo correspondehttp://repositorio.unne.edu.ar/oaiososa@bib.unne.edu.ar;sergio.alegria@unne.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:48712025-09-29 14:29:25.292Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) - Universidad Nacional del Nordestefalse
dc.title.none.fl_str_mv Optical and electrical properties of nanostructured metallic electrical contacts
title Optical and electrical properties of nanostructured metallic electrical contacts
spellingShingle Optical and electrical properties of nanostructured metallic electrical contacts
Toranzos, Víctor José
Hotspots
Effective media
Recursive algorithms
title_short Optical and electrical properties of nanostructured metallic electrical contacts
title_full Optical and electrical properties of nanostructured metallic electrical contacts
title_fullStr Optical and electrical properties of nanostructured metallic electrical contacts
title_full_unstemmed Optical and electrical properties of nanostructured metallic electrical contacts
title_sort Optical and electrical properties of nanostructured metallic electrical contacts
dc.creator.none.fl_str_mv Toranzos, Víctor José
Ortiz, Guillermo Pablo
Mochán, W. Luis
Zerbino, Jorge O.
author Toranzos, Víctor José
author_facet Toranzos, Víctor José
Ortiz, Guillermo Pablo
Mochán, W. Luis
Zerbino, Jorge O.
author_role author
author2 Ortiz, Guillermo Pablo
Mochán, W. Luis
Zerbino, Jorge O.
author2_role author
author
author
dc.subject.none.fl_str_mv Hotspots
Effective media
Recursive algorithms
topic Hotspots
Effective media
Recursive algorithms
dc.description.none.fl_txt_mv Fil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina.
Fil: Mochán, W. Luis. Universidad Nacional Autónoma de México. Instituto de Ciencias Físicas; Argentina.
Fil: Zerbino, Jorge O. Centro Investigaciones Científicas de la Provincia de Buenos Aires. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas; Argentina.
We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.
description Fil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina.
publishDate 2017
dc.date.none.fl_str_mv 2017
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv Toranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591.
2053-1591
http://repositorio.unne.edu.ar/handle/123456789/28082
identifier_str_mv Toranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591.
2053-1591
url http://repositorio.unne.edu.ar/handle/123456789/28082
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/2.5/ar/
Atribución-NoComercial-SinDerivadas 2.5 Argentina
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-nd/2.5/ar/
Atribución-NoComercial-SinDerivadas 2.5 Argentina
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv IOP Publishing Ltd
publisher.none.fl_str_mv IOP Publishing Ltd
dc.source.none.fl_str_mv Materials Research Express, 2017, vol. 4, no. 1, p. 1-11.
reponame:Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)
instname:Universidad Nacional del Nordeste
reponame_str Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)
collection Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)
instname_str Universidad Nacional del Nordeste
repository.name.fl_str_mv Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) - Universidad Nacional del Nordeste
repository.mail.fl_str_mv ososa@bib.unne.edu.ar;sergio.alegria@unne.edu.ar
_version_ 1844621663481626624
score 12.559606