Optical and electrical properties of nanostructured metallic electrical contacts
- Autores
- Toranzos, Víctor José; Ortiz, Guillermo Pablo; Mochán, W. Luis; Zerbino, Jorge O.
- Año de publicación
- 2017
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- Fil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina.
Fil: Mochán, W. Luis. Universidad Nacional Autónoma de México. Instituto de Ciencias Físicas; Argentina.
Fil: Zerbino, Jorge O. Centro Investigaciones Científicas de la Provincia de Buenos Aires. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas; Argentina.
We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones. - Fuente
- Materials Research Express, 2017, vol. 4, no. 1, p. 1-11.
- Materia
-
Hotspots
Effective media
Recursive algorithms - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- http://creativecommons.org/licenses/by-nc-nd/2.5/ar/
- Repositorio
- Institución
- Universidad Nacional del Nordeste
- OAI Identificador
- oai:repositorio.unne.edu.ar:123456789/28082
Ver los metadatos del registro completo
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Optical and electrical properties of nanostructured metallic electrical contactsToranzos, Víctor JoséOrtiz, Guillermo PabloMochán, W. LuisZerbino, Jorge O.HotspotsEffective mediaRecursive algorithmsFil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina.Fil: Mochán, W. Luis. Universidad Nacional Autónoma de México. Instituto de Ciencias Físicas; Argentina.Fil: Zerbino, Jorge O. Centro Investigaciones Científicas de la Provincia de Buenos Aires. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas; Argentina.We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.IOP Publishing Ltd2017info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfToranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591.2053-1591http://repositorio.unne.edu.ar/handle/123456789/28082Materials Research Express, 2017, vol. 4, no. 1, p. 1-11.reponame:Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE)instname:Universidad Nacional del Nordesteenginfo:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/2.5/ar/Atribución-NoComercial-SinDerivadas 2.5 Argentina2025-09-29T14:29:25Zoai:repositorio.unne.edu.ar:123456789/28082instacron:UNNEInstitucionalhttp://repositorio.unne.edu.ar/Universidad públicaNo correspondehttp://repositorio.unne.edu.ar/oaiososa@bib.unne.edu.ar;sergio.alegria@unne.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:48712025-09-29 14:29:25.292Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) - Universidad Nacional del Nordestefalse |
dc.title.none.fl_str_mv |
Optical and electrical properties of nanostructured metallic electrical contacts |
title |
Optical and electrical properties of nanostructured metallic electrical contacts |
spellingShingle |
Optical and electrical properties of nanostructured metallic electrical contacts Toranzos, Víctor José Hotspots Effective media Recursive algorithms |
title_short |
Optical and electrical properties of nanostructured metallic electrical contacts |
title_full |
Optical and electrical properties of nanostructured metallic electrical contacts |
title_fullStr |
Optical and electrical properties of nanostructured metallic electrical contacts |
title_full_unstemmed |
Optical and electrical properties of nanostructured metallic electrical contacts |
title_sort |
Optical and electrical properties of nanostructured metallic electrical contacts |
dc.creator.none.fl_str_mv |
Toranzos, Víctor José Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. |
author |
Toranzos, Víctor José |
author_facet |
Toranzos, Víctor José Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. |
author_role |
author |
author2 |
Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. |
author2_role |
author author author |
dc.subject.none.fl_str_mv |
Hotspots Effective media Recursive algorithms |
topic |
Hotspots Effective media Recursive algorithms |
dc.description.none.fl_txt_mv |
Fil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina. Fil: Mochán, W. Luis. Universidad Nacional Autónoma de México. Instituto de Ciencias Físicas; Argentina. Fil: Zerbino, Jorge O. Centro Investigaciones Científicas de la Provincia de Buenos Aires. Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas; Argentina. We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones. |
description |
Fil: Toranzos, Víctor José. Universidad Nacional del Nordeste. Facultad de Ciencias Exactas Naturales y Agrimensura; Argentina. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
Toranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591. 2053-1591 http://repositorio.unne.edu.ar/handle/123456789/28082 |
identifier_str_mv |
Toranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591. 2053-1591 |
url |
http://repositorio.unne.edu.ar/handle/123456789/28082 |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc-nd/2.5/ar/ Atribución-NoComercial-SinDerivadas 2.5 Argentina |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
http://creativecommons.org/licenses/by-nc-nd/2.5/ar/ Atribución-NoComercial-SinDerivadas 2.5 Argentina |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
IOP Publishing Ltd |
publisher.none.fl_str_mv |
IOP Publishing Ltd |
dc.source.none.fl_str_mv |
Materials Research Express, 2017, vol. 4, no. 1, p. 1-11. reponame:Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) instname:Universidad Nacional del Nordeste |
reponame_str |
Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) |
collection |
Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) |
instname_str |
Universidad Nacional del Nordeste |
repository.name.fl_str_mv |
Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) - Universidad Nacional del Nordeste |
repository.mail.fl_str_mv |
ososa@bib.unne.edu.ar;sergio.alegria@unne.edu.ar |
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1844621663481626624 |
score |
12.559606 |