Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime

Autores
Real, M. A.; Tonina, A.; Arrachea, L.; Giudici, P.; Reichl, C.; Wegscheider, W.; Dietsche, W.
Año de publicación
2023
Idioma
inglés
Tipo de recurso
artículo
Estado
versión aceptada
Descripción
We present an experimental technique to generate and measure a temperature bias in the quantum Hall effect of GaAs/AlGaAs Corbino samples. The bias is generated by injecting an electrical current at a central resistive heater and the resulting radial temperature drop is determined by conductance measurements at internal and external concentric rings. The experimental results agree with the predictions of numerical simulations of the heat flow through the substrate. We also compare these results with previous predictions based on the thermoelectric response of these devices.
Fil: Real, M. A. Instituto Nacional de Tecnología Industrial. Dto. de Metrología Cuántica.; Argentina
Fil: Tonina, A. Instituto Nacional de Tecnología Industrial. Dto. de Metrología Cuántica.; Argentina
Fil: Arrachea, L. UNSAM. Escuela de Ciencia y Tecnología; Argentina
Fil: Arrachea, L. UNSAM. ICIFI; Argentina
Fil: Giudici, P. CNEA-CONICET. Instituto de Nanociencia y Nanotecnología; Argentina
Fil: Reichl, C. ETH Zürich. Solid State Physics Laboratory; Suiza
Fil: Wegscheider, W. ETH Zürich. Solid State Physics Laboratory; Suiza
Fil: Dietsche, W. ETH Zürich. Solid State Physics Laboratory; Suiza
Fil: Dietsche, W. Max-Planck-Institut für Festkörperforschung; Alemania
Fuente
arXiv:2210.15599v3
Materia
Electrodinámica cuántica
Magnetorresistencia
Termoelectricidad
Mediciones
Método experimental
Metrología
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-nd/4.0
Repositorio
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
Institución
Instituto Nacional de Tecnología Industrial
OAI Identificador
nuevadc:Real2023Corbino_pdf
Acceder
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oai_identifier_str nuevadc:Real2023Corbino_pdf
network_acronym_str RIINTI
repository_id_str
network_name_str Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
spelling Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regimeReal, M. A.Tonina, A.Arrachea, L.Giudici, P.Reichl, C.Wegscheider, W.Dietsche, W.Electrodinámica cuánticaMagnetorresistenciaTermoelectricidadMedicionesMétodo experimentalMetrologíaWe present an experimental technique to generate and measure a temperature bias in the quantum Hall effect of GaAs/AlGaAs Corbino samples. The bias is generated by injecting an electrical current at a central resistive heater and the resulting radial temperature drop is determined by conductance measurements at internal and external concentric rings. The experimental results agree with the predictions of numerical simulations of the heat flow through the substrate. We also compare these results with previous predictions based on the thermoelectric response of these devices.Fil: Real, M. A. Instituto Nacional de Tecnología Industrial. Dto. de Metrología Cuántica.; ArgentinaFil: Tonina, A. Instituto Nacional de Tecnología Industrial. Dto. de Metrología Cuántica.; ArgentinaFil: Arrachea, L. UNSAM. Escuela de Ciencia y Tecnología; ArgentinaFil: Arrachea, L. UNSAM. ICIFI; ArgentinaFil: Giudici, P. CNEA-CONICET. Instituto de Nanociencia y Nanotecnología; ArgentinaFil: Reichl, C. ETH Zürich. Solid State Physics Laboratory; SuizaFil: Wegscheider, W. ETH Zürich. Solid State Physics Laboratory; SuizaFil: Dietsche, W. ETH Zürich. Solid State Physics Laboratory; SuizaFil: Dietsche, W. Max-Planck-Institut für Festkörperforschung; AlemaniaarXiv2023info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfReal2023Corbino.pdfhttps://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Real2023.dir/doc.pdfarXiv:2210.15599v3reponame:Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)instname:Instituto Nacional de Tecnología Industrialenginfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-nd/4.0openAccess2025-10-16T10:46:38Znuevadc:Real2023Corbino_pdfinstacron:INTIInstitucionalhttps://app.inti.gob.ar/greenstone3/biblioOrganismo científico-tecnológicohttps://argentina.gob.ar/intihttps://app.inti.gob.ar/greenstone3/oaiserver?verb=Identifypfalcato@inti.gob.arArgentinaopendoar:2025-10-16 10:46:38.659Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) - Instituto Nacional de Tecnología Industrialfalse
dc.title.none.fl_str_mv Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
title Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
spellingShingle Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
Real, M. A.
Electrodinámica cuántica
Magnetorresistencia
Termoelectricidad
Mediciones
Método experimental
Metrología
title_short Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
title_full Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
title_fullStr Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
title_full_unstemmed Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
title_sort Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime
dc.creator.none.fl_str_mv Real, M. A.
Tonina, A.
Arrachea, L.
Giudici, P.
Reichl, C.
Wegscheider, W.
Dietsche, W.
author Real, M. A.
author_facet Real, M. A.
Tonina, A.
Arrachea, L.
Giudici, P.
Reichl, C.
Wegscheider, W.
Dietsche, W.
author_role author
author2 Tonina, A.
Arrachea, L.
Giudici, P.
Reichl, C.
Wegscheider, W.
Dietsche, W.
author2_role author
author
author
author
author
author
dc.subject.none.fl_str_mv Electrodinámica cuántica
Magnetorresistencia
Termoelectricidad
Mediciones
Método experimental
Metrología
topic Electrodinámica cuántica
Magnetorresistencia
Termoelectricidad
Mediciones
Método experimental
Metrología
dc.description.none.fl_txt_mv We present an experimental technique to generate and measure a temperature bias in the quantum Hall effect of GaAs/AlGaAs Corbino samples. The bias is generated by injecting an electrical current at a central resistive heater and the resulting radial temperature drop is determined by conductance measurements at internal and external concentric rings. The experimental results agree with the predictions of numerical simulations of the heat flow through the substrate. We also compare these results with previous predictions based on the thermoelectric response of these devices.
Fil: Real, M. A. Instituto Nacional de Tecnología Industrial. Dto. de Metrología Cuántica.; Argentina
Fil: Tonina, A. Instituto Nacional de Tecnología Industrial. Dto. de Metrología Cuántica.; Argentina
Fil: Arrachea, L. UNSAM. Escuela de Ciencia y Tecnología; Argentina
Fil: Arrachea, L. UNSAM. ICIFI; Argentina
Fil: Giudici, P. CNEA-CONICET. Instituto de Nanociencia y Nanotecnología; Argentina
Fil: Reichl, C. ETH Zürich. Solid State Physics Laboratory; Suiza
Fil: Wegscheider, W. ETH Zürich. Solid State Physics Laboratory; Suiza
Fil: Dietsche, W. ETH Zürich. Solid State Physics Laboratory; Suiza
Fil: Dietsche, W. Max-Planck-Institut für Festkörperforschung; Alemania
description We present an experimental technique to generate and measure a temperature bias in the quantum Hall effect of GaAs/AlGaAs Corbino samples. The bias is generated by injecting an electrical current at a central resistive heater and the resulting radial temperature drop is determined by conductance measurements at internal and external concentric rings. The experimental results agree with the predictions of numerical simulations of the heat flow through the substrate. We also compare these results with previous predictions based on the thermoelectric response of these devices.
publishDate 2023
dc.date.none.fl_str_mv 2023
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv Real2023Corbino.pdf
https://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Real2023.dir/doc.pdf
identifier_str_mv Real2023Corbino.pdf
url https://app.inti.gob.ar/greenstone3/sites/localsite/collect/nuevadc/index/assoc/Real2023.dir/doc.pdf
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-nd/4.0
openAccess
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-nd/4.0
openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv arXiv
publisher.none.fl_str_mv arXiv
dc.source.none.fl_str_mv arXiv:2210.15599v3
reponame:Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
instname:Instituto Nacional de Tecnología Industrial
reponame_str Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
collection Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
instname_str Instituto Nacional de Tecnología Industrial
repository.name.fl_str_mv Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) - Instituto Nacional de Tecnología Industrial
repository.mail.fl_str_mv pfalcato@inti.gob.ar
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score 12.712165

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