Palumbo, F. R. M., Aguirre, F. L., Pazos, S. M., Krylov, I., Winter, R., & Eizenberg, M. (2018). Influence of the spatial distribution of border traps in the capacitance frequency dispersion of Al2O3/InGaAs. Web
Citación estilo ChicagoPalumbo, Félix Roberto Mario, Fernando Leonel Aguirre, Sebastián Matías Pazos, Igor Krylov, Roy Winter, and Moshe Eizenberg. Influence of the Spatial Distribution of Border Traps in the Capacitance Frequency Dispersion of Al2O3/InGaAs. 2018.
Cita MLAPalumbo, Félix Roberto Mario, et al. Influence of the Spatial Distribution of Border Traps in the Capacitance Frequency Dispersion of Al2O3/InGaAs. 2018.
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