Cita APA

Ghenzi, N., Quinteros, C. P., Miranda, E., & Levy, P. E. (2025). Characterization and modeling of the electrical nociceptive properties of HfO2/TiOx/SiO2-based memristive devices. Web

Citación estilo Chicago

Ghenzi, Néstor, Cynthia Paula Quinteros, E. Miranda, and Pablo Eduardo Levy. Characterization and Modeling of the Electrical Nociceptive Properties of HfO2/TiOx/SiO2-based Memristive Devices. 2025.

Cita MLA

Ghenzi, Néstor, Cynthia Paula Quinteros, E. Miranda, and Pablo Eduardo Levy. Characterization and Modeling of the Electrical Nociceptive Properties of HfO2/TiOx/SiO2-based Memristive Devices. 2025.