Cita APA

Palumbo, F. R. M., Pazos, S. M., Aguirre, F. L., Winter, R., Krylov, I., & Eizenberg, M. (2017). Temperature dependence of trapping effects in metal gates/Al2O3/InGaAs stacks. Web

Citación estilo Chicago

Palumbo, Félix Roberto Mario, Sebastián Matías Pazos, Fernando Leonel Aguirre, R. Winter, I. Krylov, and M. Eizenberg. Temperature Dependence of Trapping Effects in Metal Gates/Al2O3/InGaAs Stacks. 2017.

Cita MLA

Palumbo, Félix Roberto Mario, et al. Temperature Dependence of Trapping Effects in Metal Gates/Al2O3/InGaAs Stacks. 2017.