Pagano, R., Lombardo, S., Palumbo, F. R. M., Carloni, S., Kirsch, P., Krishnan, S., . . . Stathis, J. (2008). A New Methodology for Characterizing the Progressive BD of Hfo2/Sio2 Metal Gate Stacks. Web
Citación estilo ChicagoPagano, Roberto, et al. A New Methodology for Characterizing the Progressive BD of Hfo2/Sio2 Metal Gate Stacks. 2008.
Cita MLAPagano, Roberto, et al. A New Methodology for Characterizing the Progressive BD of Hfo2/Sio2 Metal Gate Stacks. 2008.
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