Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis

Autores
Sanchez, Hector Jorge; Valentinuzzi, Maria Cecilia; Leani, Juan Jose
Año de publicación
2011
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
In this work we present theoretical calculations of the resonant Raman scattering contributions to the background of X-ray fluorescence spectra. The main goal of the paper is to obtain a simple and reliable procedure to calculate the influence of RRS in spectrochemical analysis by X-ray fluorescence including second order enhancement processes. In order to perform the calculations, the Shiraiwa and Fujino model was used to calculate the characteristic intensities of the different atomic processes involved. In the case of polychromatic excitation over a multi-element sample of proximate atomic numbers, the calculations show that the contribution of RRS is higher than Compton scattering but lower than coherent scattering, this last process being the most important source of background in the range of the fluorescent lines. The calculated effects of enhancements are rather low and have influence only on the lightest elements of the spectra. On the other hand, the resonant Raman scattering line interferes with fluorescent peaks in the case of monochromatic excitation when elements of proximate atomic numbers are analyzed (for example Al–Si). The model proposed here allows the analysis of the different sources of background, which contribute to a better understanding of the physical processes involved in the different techniques of XRF analysis. In addition, the calculations presented here can contribute significantly to a more precise quantification of traces and minor components.
Fil: Sanchez, Hector Jorge. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Valentinuzzi, Maria Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Leani, Juan Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Materia
Theoretical calculations
resonant Raman scattering
RRS
XRF spectrochemical analysis
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/279113
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/279113
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysisSanchez, Hector JorgeValentinuzzi, Maria CeciliaLeani, Juan JoseTheoretical calculationsresonant Raman scatteringRRSXRF spectrochemical analysishttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1In this work we present theoretical calculations of the resonant Raman scattering contributions to the background of X-ray fluorescence spectra. The main goal of the paper is to obtain a simple and reliable procedure to calculate the influence of RRS in spectrochemical analysis by X-ray fluorescence including second order enhancement processes. In order to perform the calculations, the Shiraiwa and Fujino model was used to calculate the characteristic intensities of the different atomic processes involved. In the case of polychromatic excitation over a multi-element sample of proximate atomic numbers, the calculations show that the contribution of RRS is higher than Compton scattering but lower than coherent scattering, this last process being the most important source of background in the range of the fluorescent lines. The calculated effects of enhancements are rather low and have influence only on the lightest elements of the spectra. On the other hand, the resonant Raman scattering line interferes with fluorescent peaks in the case of monochromatic excitation when elements of proximate atomic numbers are analyzed (for example Al–Si). The model proposed here allows the analysis of the different sources of background, which contribute to a better understanding of the physical processes involved in the different techniques of XRF analysis. In addition, the calculations presented here can contribute significantly to a more precise quantification of traces and minor components.Fil: Sanchez, Hector Jorge. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; ArgentinaFil: Valentinuzzi, Maria Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; ArgentinaFil: Leani, Juan Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; ArgentinaRoyal Society of Chemistry2011-11info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/279113Sanchez, Hector Jorge; Valentinuzzi, Maria Cecilia; Leani, Juan Jose; Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 27; 2; 11-2011; 232-2380267-9477CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://pubs.rsc.org/en/content/articlelanding/2012/ja/c1ja10219binfo:eu-repo/semantics/altIdentifier/doi/10.1039/C1JA10219Binfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2026-01-14T12:04:32Zoai:ri.conicet.gov.ar:11336/279113instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982026-01-14 12:04:32.427CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
title Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
spellingShingle Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
Sanchez, Hector Jorge
Theoretical calculations
resonant Raman scattering
RRS
XRF spectrochemical analysis
title_short Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
title_full Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
title_fullStr Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
title_full_unstemmed Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
title_sort Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis
dc.creator.none.fl_str_mv Sanchez, Hector Jorge
Valentinuzzi, Maria Cecilia
Leani, Juan Jose
author Sanchez, Hector Jorge
author_facet Sanchez, Hector Jorge
Valentinuzzi, Maria Cecilia
Leani, Juan Jose
author_role author
author2 Valentinuzzi, Maria Cecilia
Leani, Juan Jose
author2_role author
author
dc.subject.none.fl_str_mv Theoretical calculations
resonant Raman scattering
RRS
XRF spectrochemical analysis
topic Theoretical calculations
resonant Raman scattering
RRS
XRF spectrochemical analysis
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv In this work we present theoretical calculations of the resonant Raman scattering contributions to the background of X-ray fluorescence spectra. The main goal of the paper is to obtain a simple and reliable procedure to calculate the influence of RRS in spectrochemical analysis by X-ray fluorescence including second order enhancement processes. In order to perform the calculations, the Shiraiwa and Fujino model was used to calculate the characteristic intensities of the different atomic processes involved. In the case of polychromatic excitation over a multi-element sample of proximate atomic numbers, the calculations show that the contribution of RRS is higher than Compton scattering but lower than coherent scattering, this last process being the most important source of background in the range of the fluorescent lines. The calculated effects of enhancements are rather low and have influence only on the lightest elements of the spectra. On the other hand, the resonant Raman scattering line interferes with fluorescent peaks in the case of monochromatic excitation when elements of proximate atomic numbers are analyzed (for example Al–Si). The model proposed here allows the analysis of the different sources of background, which contribute to a better understanding of the physical processes involved in the different techniques of XRF analysis. In addition, the calculations presented here can contribute significantly to a more precise quantification of traces and minor components.
Fil: Sanchez, Hector Jorge. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Valentinuzzi, Maria Cecilia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
Fil: Leani, Juan Jose. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Física Enrique Gaviola. Universidad Nacional de Córdoba. Instituto de Física Enrique Gaviola; Argentina
description In this work we present theoretical calculations of the resonant Raman scattering contributions to the background of X-ray fluorescence spectra. The main goal of the paper is to obtain a simple and reliable procedure to calculate the influence of RRS in spectrochemical analysis by X-ray fluorescence including second order enhancement processes. In order to perform the calculations, the Shiraiwa and Fujino model was used to calculate the characteristic intensities of the different atomic processes involved. In the case of polychromatic excitation over a multi-element sample of proximate atomic numbers, the calculations show that the contribution of RRS is higher than Compton scattering but lower than coherent scattering, this last process being the most important source of background in the range of the fluorescent lines. The calculated effects of enhancements are rather low and have influence only on the lightest elements of the spectra. On the other hand, the resonant Raman scattering line interferes with fluorescent peaks in the case of monochromatic excitation when elements of proximate atomic numbers are analyzed (for example Al–Si). The model proposed here allows the analysis of the different sources of background, which contribute to a better understanding of the physical processes involved in the different techniques of XRF analysis. In addition, the calculations presented here can contribute significantly to a more precise quantification of traces and minor components.
publishDate 2011
dc.date.none.fl_str_mv 2011-11
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/279113
Sanchez, Hector Jorge; Valentinuzzi, Maria Cecilia; Leani, Juan Jose; Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 27; 2; 11-2011; 232-238
0267-9477
CONICET Digital
CONICET
url http://hdl.handle.net/11336/279113
identifier_str_mv Sanchez, Hector Jorge; Valentinuzzi, Maria Cecilia; Leani, Juan Jose; Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 27; 2; 11-2011; 232-238
0267-9477
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://pubs.rsc.org/en/content/articlelanding/2012/ja/c1ja10219b
info:eu-repo/semantics/altIdentifier/doi/10.1039/C1JA10219B
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Royal Society of Chemistry
publisher.none.fl_str_mv Royal Society of Chemistry
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.071171

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