Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
- Autores
- Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; Roussel, H.; Oueslati, M.; Tsuchiya, T.
- Año de publicación
- 2014
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.
Fil: Othmen, Z.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina
Fil: Daoudi, K.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Boudard, Miguel Santiago. Minatec; Francia
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina
Fil: Roussel, H.. Minatec; Francia
Fil: Oueslati, M.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Tsuchiya, T.. National Institute Of Advanced Industrial Science And Technology; Japón - Materia
-
Cobaltite Thin Films
Conduction Mechanism
Strain Engineering - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/77156
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Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substratesOthmen, Z.Schulman, Alejandro RaúlDaoudi, K.Boudard, Miguel SantiagoAcha, Carlos EnriqueRoussel, H.Oueslati, M.Tsuchiya, T.Cobaltite Thin FilmsConduction MechanismStrain EngineeringLa 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.Fil: Othmen, Z.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; TúnezFil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; ArgentinaFil: Daoudi, K.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; TúnezFil: Boudard, Miguel Santiago. Minatec; FranciaFil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; ArgentinaFil: Roussel, H.. Minatec; FranciaFil: Oueslati, M.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; TúnezFil: Tsuchiya, T.. National Institute Of Advanced Industrial Science And Technology; JapónElsevier Science2014-03info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/77156Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; et al.; Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates; Elsevier Science; Applied Surface Science; 306; 3-2014; 60-650169-4332CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0169433214005480info:eu-repo/semantics/altIdentifier/doi/10.1016/j.apsusc.2014.03.034info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:52:57Zoai:ri.conicet.gov.ar:11336/77156instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:52:57.323CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
title |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
spellingShingle |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates Othmen, Z. Cobaltite Thin Films Conduction Mechanism Strain Engineering |
title_short |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
title_full |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
title_fullStr |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
title_full_unstemmed |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
title_sort |
Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates |
dc.creator.none.fl_str_mv |
Othmen, Z. Schulman, Alejandro Raúl Daoudi, K. Boudard, Miguel Santiago Acha, Carlos Enrique Roussel, H. Oueslati, M. Tsuchiya, T. |
author |
Othmen, Z. |
author_facet |
Othmen, Z. Schulman, Alejandro Raúl Daoudi, K. Boudard, Miguel Santiago Acha, Carlos Enrique Roussel, H. Oueslati, M. Tsuchiya, T. |
author_role |
author |
author2 |
Schulman, Alejandro Raúl Daoudi, K. Boudard, Miguel Santiago Acha, Carlos Enrique Roussel, H. Oueslati, M. Tsuchiya, T. |
author2_role |
author author author author author author author |
dc.subject.none.fl_str_mv |
Cobaltite Thin Films Conduction Mechanism Strain Engineering |
topic |
Cobaltite Thin Films Conduction Mechanism Strain Engineering |
dc.description.none.fl_txt_mv |
La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved. Fil: Othmen, Z.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina Fil: Daoudi, K.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez Fil: Boudard, Miguel Santiago. Minatec; Francia Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina Fil: Roussel, H.. Minatec; Francia Fil: Oueslati, M.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez Fil: Tsuchiya, T.. National Institute Of Advanced Industrial Science And Technology; Japón |
description |
La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-03 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/77156 Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; et al.; Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates; Elsevier Science; Applied Surface Science; 306; 3-2014; 60-65 0169-4332 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/77156 |
identifier_str_mv |
Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; et al.; Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates; Elsevier Science; Applied Surface Science; 306; 3-2014; 60-65 0169-4332 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0169433214005480 info:eu-repo/semantics/altIdentifier/doi/10.1016/j.apsusc.2014.03.034 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier Science |
publisher.none.fl_str_mv |
Elsevier Science |
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Consejo Nacional de Investigaciones Científicas y Técnicas |
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CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
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13.070432 |