Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates

Autores
Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; Roussel, H.; Oueslati, M.; Tsuchiya, T.
Año de publicación
2014
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.
Fil: Othmen, Z.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina
Fil: Daoudi, K.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Boudard, Miguel Santiago. Minatec; Francia
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina
Fil: Roussel, H.. Minatec; Francia
Fil: Oueslati, M.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Tsuchiya, T.. National Institute Of Advanced Industrial Science And Technology; Japón
Materia
Cobaltite Thin Films
Conduction Mechanism
Strain Engineering
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/77156
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/77156
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substratesOthmen, Z.Schulman, Alejandro RaúlDaoudi, K.Boudard, Miguel SantiagoAcha, Carlos EnriqueRoussel, H.Oueslati, M.Tsuchiya, T.Cobaltite Thin FilmsConduction MechanismStrain EngineeringLa 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.Fil: Othmen, Z.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; TúnezFil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; ArgentinaFil: Daoudi, K.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; TúnezFil: Boudard, Miguel Santiago. Minatec; FranciaFil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; ArgentinaFil: Roussel, H.. Minatec; FranciaFil: Oueslati, M.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; TúnezFil: Tsuchiya, T.. National Institute Of Advanced Industrial Science And Technology; JapónElsevier Science2014-03info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/77156Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; et al.; Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates; Elsevier Science; Applied Surface Science; 306; 3-2014; 60-650169-4332CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0169433214005480info:eu-repo/semantics/altIdentifier/doi/10.1016/j.apsusc.2014.03.034info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T11:22:22Zoai:ri.conicet.gov.ar:11336/77156instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 11:22:22.92CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
title Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
spellingShingle Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
Othmen, Z.
Cobaltite Thin Films
Conduction Mechanism
Strain Engineering
title_short Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
title_full Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
title_fullStr Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
title_full_unstemmed Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
title_sort Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
dc.creator.none.fl_str_mv Othmen, Z.
Schulman, Alejandro Raúl
Daoudi, K.
Boudard, Miguel Santiago
Acha, Carlos Enrique
Roussel, H.
Oueslati, M.
Tsuchiya, T.
author Othmen, Z.
author_facet Othmen, Z.
Schulman, Alejandro Raúl
Daoudi, K.
Boudard, Miguel Santiago
Acha, Carlos Enrique
Roussel, H.
Oueslati, M.
Tsuchiya, T.
author_role author
author2 Schulman, Alejandro Raúl
Daoudi, K.
Boudard, Miguel Santiago
Acha, Carlos Enrique
Roussel, H.
Oueslati, M.
Tsuchiya, T.
author2_role author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Cobaltite Thin Films
Conduction Mechanism
Strain Engineering
topic Cobaltite Thin Films
Conduction Mechanism
Strain Engineering
dc.description.none.fl_txt_mv La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.
Fil: Othmen, Z.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Schulman, Alejandro Raúl. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina
Fil: Daoudi, K.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Boudard, Miguel Santiago. Minatec; Francia
Fil: Acha, Carlos Enrique. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina
Fil: Roussel, H.. Minatec; Francia
Fil: Oueslati, M.. Université de Tunis El Manar, Faculté Des Sciences de Tunis; Túnez
Fil: Tsuchiya, T.. National Institute Of Advanced Industrial Science And Technology; Japón
description La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.
publishDate 2014
dc.date.none.fl_str_mv 2014-03
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/77156
Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; et al.; Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates; Elsevier Science; Applied Surface Science; 306; 3-2014; 60-65
0169-4332
CONICET Digital
CONICET
url http://hdl.handle.net/11336/77156
identifier_str_mv Othmen, Z.; Schulman, Alejandro Raúl; Daoudi, K.; Boudard, Miguel Santiago; Acha, Carlos Enrique; et al.; Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates; Elsevier Science; Applied Surface Science; 306; 3-2014; 60-65
0169-4332
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0169433214005480
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.apsusc.2014.03.034
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier Science
publisher.none.fl_str_mv Elsevier Science
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 12.982451

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