Cita APA

Bueno, P. R., Tararan, R., Parra, R., Joanni, E., Ramírez, M. A., Ribeiro, W. C., . . . Varela, J. A. (2009). A polaronic stacking fault defect model for CaCu3Ti4O12 material: An approach for the origin of the huge dielectric constant and semiconducting coexistent features. Web

Citación estilo Chicago

Bueno, Paulo R., Ronald Tararan, Rodrigo Parra, Ednan Joanni, Miguel A. Ramírez, Willian C. Ribeiro, Elson Longo, and José A. Varela. A Polaronic Stacking Fault Defect Model for CaCu3Ti4O12 Material: An Approach for the Origin of the Huge Dielectric Constant and Semiconducting Coexistent Features. 2009.

Cita MLA

Bueno, Paulo R., et al. A Polaronic Stacking Fault Defect Model for CaCu3Ti4O12 Material: An Approach for the Origin of the Huge Dielectric Constant and Semiconducting Coexistent Features. 2009.