Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index

Autores
Vega Moreno, Milena Amparo; Martín del Valle, Eva M.; Perez, Maximiliano Sebastian; Pecharromán, Carlos; Marcelo, Gema
Año de publicación
2018
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential reflectance maximum right at the visible/UV boundary (∼400 nm). Therefore, a small deposit of PDA modifies the optical path, in such manner that the wavelength of the maximum of reflectance red shifts. Because the human eye is very sensitive to any change of the light spectral distribution at the visible region, very small film thickness changes (∼30 nm) are enough to notably modify the perceived color. Consequently, a controlled deposit of PDA, tune the color along the whole visible spectrum. Additionally, good quality of PDA deposits allowed us to determine the refractive index of polydopamine by ellipsometry spectroscopy. This data can be crucial in confocal skin microscopic techniques, presently used in diagnosis of skin tumors.
Fil: Vega Moreno, Milena Amparo. Universidad de Salamanca; España
Fil: Martín del Valle, Eva M.. Universidad de Salamanca; España
Fil: Perez, Maximiliano Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional. Facultad Regional Haedo; Argentina
Fil: Pecharromán, Carlos. Consejo Superior de Investigaciones Científicas. Instituto de Ciencia de los Materiales de Barcelona; España
Fil: Marcelo, Gema. Universidad de Salamanca; España
Materia
COLOR
POLYDOPAMINE
REFRACTIVE INDEX
SILICON NITRIDE
THIN-FILM INTERFERENCE
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/98243
Acceder
id CONICETDig_ae2d783c7ec8979cb4fa5fac3a258b3a
oai_identifier_str oai:ri.conicet.gov.ar:11336/98243
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive IndexVega Moreno, Milena AmparoMartín del Valle, Eva M.Perez, Maximiliano SebastianPecharromán, CarlosMarcelo, GemaCOLORPOLYDOPAMINEREFRACTIVE INDEXSILICON NITRIDETHIN-FILM INTERFERENCEhttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential reflectance maximum right at the visible/UV boundary (∼400 nm). Therefore, a small deposit of PDA modifies the optical path, in such manner that the wavelength of the maximum of reflectance red shifts. Because the human eye is very sensitive to any change of the light spectral distribution at the visible region, very small film thickness changes (∼30 nm) are enough to notably modify the perceived color. Consequently, a controlled deposit of PDA, tune the color along the whole visible spectrum. Additionally, good quality of PDA deposits allowed us to determine the refractive index of polydopamine by ellipsometry spectroscopy. This data can be crucial in confocal skin microscopic techniques, presently used in diagnosis of skin tumors.Fil: Vega Moreno, Milena Amparo. Universidad de Salamanca; EspañaFil: Martín del Valle, Eva M.. Universidad de Salamanca; EspañaFil: Perez, Maximiliano Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional. Facultad Regional Haedo; ArgentinaFil: Pecharromán, Carlos. Consejo Superior de Investigaciones Científicas. Instituto de Ciencia de los Materiales de Barcelona; EspañaFil: Marcelo, Gema. Universidad de Salamanca; EspañaWiley VCH Verlag2018-12info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/98243Vega Moreno, Milena Amparo; Martín del Valle, Eva M.; Perez, Maximiliano Sebastian; Pecharromán, Carlos; Marcelo, Gema; Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index; Wiley VCH Verlag; Chemphyschem; 19; 24; 12-2018; 3418-34241439-4235CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://doi.wiley.com/10.1002/cphc.201800747info:eu-repo/semantics/altIdentifier/doi/10.1002/cphc.201800747info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-nd/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T09:45:19Zoai:ri.conicet.gov.ar:11336/98243instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 09:45:19.372CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
title Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
spellingShingle Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
Vega Moreno, Milena Amparo
COLOR
POLYDOPAMINE
REFRACTIVE INDEX
SILICON NITRIDE
THIN-FILM INTERFERENCE
title_short Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
title_full Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
title_fullStr Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
title_full_unstemmed Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
title_sort Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index
dc.creator.none.fl_str_mv Vega Moreno, Milena Amparo
Martín del Valle, Eva M.
Perez, Maximiliano Sebastian
Pecharromán, Carlos
Marcelo, Gema
author Vega Moreno, Milena Amparo
author_facet Vega Moreno, Milena Amparo
Martín del Valle, Eva M.
Perez, Maximiliano Sebastian
Pecharromán, Carlos
Marcelo, Gema
author_role author
author2 Martín del Valle, Eva M.
Perez, Maximiliano Sebastian
Pecharromán, Carlos
Marcelo, Gema
author2_role author
author
author
author
dc.subject.none.fl_str_mv COLOR
POLYDOPAMINE
REFRACTIVE INDEX
SILICON NITRIDE
THIN-FILM INTERFERENCE
topic COLOR
POLYDOPAMINE
REFRACTIVE INDEX
SILICON NITRIDE
THIN-FILM INTERFERENCE
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential reflectance maximum right at the visible/UV boundary (∼400 nm). Therefore, a small deposit of PDA modifies the optical path, in such manner that the wavelength of the maximum of reflectance red shifts. Because the human eye is very sensitive to any change of the light spectral distribution at the visible region, very small film thickness changes (∼30 nm) are enough to notably modify the perceived color. Consequently, a controlled deposit of PDA, tune the color along the whole visible spectrum. Additionally, good quality of PDA deposits allowed us to determine the refractive index of polydopamine by ellipsometry spectroscopy. This data can be crucial in confocal skin microscopic techniques, presently used in diagnosis of skin tumors.
Fil: Vega Moreno, Milena Amparo. Universidad de Salamanca; España
Fil: Martín del Valle, Eva M.. Universidad de Salamanca; España
Fil: Perez, Maximiliano Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional. Facultad Regional Haedo; Argentina
Fil: Pecharromán, Carlos. Consejo Superior de Investigaciones Científicas. Instituto de Ciencia de los Materiales de Barcelona; España
Fil: Marcelo, Gema. Universidad de Salamanca; España
description A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential reflectance maximum right at the visible/UV boundary (∼400 nm). Therefore, a small deposit of PDA modifies the optical path, in such manner that the wavelength of the maximum of reflectance red shifts. Because the human eye is very sensitive to any change of the light spectral distribution at the visible region, very small film thickness changes (∼30 nm) are enough to notably modify the perceived color. Consequently, a controlled deposit of PDA, tune the color along the whole visible spectrum. Additionally, good quality of PDA deposits allowed us to determine the refractive index of polydopamine by ellipsometry spectroscopy. This data can be crucial in confocal skin microscopic techniques, presently used in diagnosis of skin tumors.
publishDate 2018
dc.date.none.fl_str_mv 2018-12
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/98243
Vega Moreno, Milena Amparo; Martín del Valle, Eva M.; Perez, Maximiliano Sebastian; Pecharromán, Carlos; Marcelo, Gema; Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index; Wiley VCH Verlag; Chemphyschem; 19; 24; 12-2018; 3418-3424
1439-4235
CONICET Digital
CONICET
url http://hdl.handle.net/11336/98243
identifier_str_mv Vega Moreno, Milena Amparo; Martín del Valle, Eva M.; Perez, Maximiliano Sebastian; Pecharromán, Carlos; Marcelo, Gema; Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index; Wiley VCH Verlag; Chemphyschem; 19; 24; 12-2018; 3418-3424
1439-4235
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://doi.wiley.com/10.1002/cphc.201800747
info:eu-repo/semantics/altIdentifier/doi/10.1002/cphc.201800747
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Wiley VCH Verlag
publisher.none.fl_str_mv Wiley VCH Verlag
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1842268722598772736
score 13.13397

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