Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering

Autores
Valluzzi, Marcos Gabriel; Valluzzi, Lucas Gabriel; Meyer, Marcos; Hernandez Fenollosa, María Angeles; Damonte, Laura Cristina
Año de publicación
2018
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices. The samples were characterized by UV-visible spectroscopy, atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM). The effect of Co interlayer thickness (4, 8, and 12 nm) on the transmittance spectra yielded an optical absorption edge shift. The work function of these films was determined by KPFM technique allowing us to predict the Fermi level shift by extending the model for pure materials to our multilayer system. The Fermi level and optical absorption edge seem to be correlated and shifted toward lower energies when Co interlayer thickness is increased.
Fil: Valluzzi, Marcos Gabriel. Universidad Nacional de Tierra del Fuego. Instituto de Desarrollo Economico E Innovacion; Argentina
Fil: Valluzzi, Lucas Gabriel. Universidad Nacional de Tierra del Fuego. Instituto de Desarrollo Economico E Innovacion; Argentina
Fil: Meyer, Marcos. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; Argentina
Fil: Hernandez Fenollosa, María Angeles. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Damonte, Laura Cristina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; Argentina
Materia
SEMICONDUCTOR
TRANSPARENT OXIDE
MULTILAYER
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/99779
Acceder
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network_name_str CONICET Digital (CONICET)
spelling Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron SputteringValluzzi, Marcos GabrielValluzzi, Lucas GabrielMeyer, MarcosHernandez Fenollosa, María AngelesDamonte, Laura CristinaSEMICONDUCTORTRANSPARENT OXIDEMULTILAYERhttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices. The samples were characterized by UV-visible spectroscopy, atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM). The effect of Co interlayer thickness (4, 8, and 12 nm) on the transmittance spectra yielded an optical absorption edge shift. The work function of these films was determined by KPFM technique allowing us to predict the Fermi level shift by extending the model for pure materials to our multilayer system. The Fermi level and optical absorption edge seem to be correlated and shifted toward lower energies when Co interlayer thickness is increased.Fil: Valluzzi, Marcos Gabriel. Universidad Nacional de Tierra del Fuego. Instituto de Desarrollo Economico E Innovacion; ArgentinaFil: Valluzzi, Lucas Gabriel. Universidad Nacional de Tierra del Fuego. Instituto de Desarrollo Economico E Innovacion; ArgentinaFil: Meyer, Marcos. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; ArgentinaFil: Hernandez Fenollosa, María Angeles. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; EspañaFil: Damonte, Laura Cristina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; ArgentinaHindawi2018-06info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/99779Valluzzi, Marcos Gabriel; Valluzzi, Lucas Gabriel; Meyer, Marcos; Hernandez Fenollosa, María Angeles; Damonte, Laura Cristina; Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering; Hindawi; Advances in Condensed Matter Physics; 2018; 6-2018; 1-81687-8108CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://www.hindawi.com/journals/acmp/2018/1257543/info:eu-repo/semantics/altIdentifier/doi/10.1155/2018/1257543info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-15T15:29:54Zoai:ri.conicet.gov.ar:11336/99779instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-15 15:29:54.507CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
title Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
spellingShingle Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
Valluzzi, Marcos Gabriel
SEMICONDUCTOR
TRANSPARENT OXIDE
MULTILAYER
title_short Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
title_full Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
title_fullStr Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
title_full_unstemmed Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
title_sort Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering
dc.creator.none.fl_str_mv Valluzzi, Marcos Gabriel
Valluzzi, Lucas Gabriel
Meyer, Marcos
Hernandez Fenollosa, María Angeles
Damonte, Laura Cristina
author Valluzzi, Marcos Gabriel
author_facet Valluzzi, Marcos Gabriel
Valluzzi, Lucas Gabriel
Meyer, Marcos
Hernandez Fenollosa, María Angeles
Damonte, Laura Cristina
author_role author
author2 Valluzzi, Lucas Gabriel
Meyer, Marcos
Hernandez Fenollosa, María Angeles
Damonte, Laura Cristina
author2_role author
author
author
author
dc.subject.none.fl_str_mv SEMICONDUCTOR
TRANSPARENT OXIDE
MULTILAYER
topic SEMICONDUCTOR
TRANSPARENT OXIDE
MULTILAYER
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices. The samples were characterized by UV-visible spectroscopy, atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM). The effect of Co interlayer thickness (4, 8, and 12 nm) on the transmittance spectra yielded an optical absorption edge shift. The work function of these films was determined by KPFM technique allowing us to predict the Fermi level shift by extending the model for pure materials to our multilayer system. The Fermi level and optical absorption edge seem to be correlated and shifted toward lower energies when Co interlayer thickness is increased.
Fil: Valluzzi, Marcos Gabriel. Universidad Nacional de Tierra del Fuego. Instituto de Desarrollo Economico E Innovacion; Argentina
Fil: Valluzzi, Lucas Gabriel. Universidad Nacional de Tierra del Fuego. Instituto de Desarrollo Economico E Innovacion; Argentina
Fil: Meyer, Marcos. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; Argentina
Fil: Hernandez Fenollosa, María Angeles. Universidad Politécnica de Valencia. Instituto de Tecnología de Materiales; España
Fil: Damonte, Laura Cristina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Instituto de Física La Plata. Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Instituto de Física La Plata; Argentina
description Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices. The samples were characterized by UV-visible spectroscopy, atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM). The effect of Co interlayer thickness (4, 8, and 12 nm) on the transmittance spectra yielded an optical absorption edge shift. The work function of these films was determined by KPFM technique allowing us to predict the Fermi level shift by extending the model for pure materials to our multilayer system. The Fermi level and optical absorption edge seem to be correlated and shifted toward lower energies when Co interlayer thickness is increased.
publishDate 2018
dc.date.none.fl_str_mv 2018-06
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/99779
Valluzzi, Marcos Gabriel; Valluzzi, Lucas Gabriel; Meyer, Marcos; Hernandez Fenollosa, María Angeles; Damonte, Laura Cristina; Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering; Hindawi; Advances in Condensed Matter Physics; 2018; 6-2018; 1-8
1687-8108
CONICET Digital
CONICET
url http://hdl.handle.net/11336/99779
identifier_str_mv Valluzzi, Marcos Gabriel; Valluzzi, Lucas Gabriel; Meyer, Marcos; Hernandez Fenollosa, María Angeles; Damonte, Laura Cristina; Optical and Electrical Properties of TiO 2 /Co/TiO 2 Multilayer Films Grown by DC Magnetron Sputtering; Hindawi; Advances in Condensed Matter Physics; 2018; 6-2018; 1-8
1687-8108
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://www.hindawi.com/journals/acmp/2018/1257543/
info:eu-repo/semantics/altIdentifier/doi/10.1155/2018/1257543
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Hindawi
publisher.none.fl_str_mv Hindawi
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.22299

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