Massa, N. E., Denardin, J. C., Socolovsky, L. M., Knobel, M., de la Cruz, F. P., & Zhang, X. (2010). Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films. Web
Citación estilo ChicagoMassa, Nestor Emilio, Juliano C. Denardin, Leandro Martin Socolovsky, Marcelo Knobel, Fernando Pablo de la Cruz, and XiXiang Zhang. Far Infrared Near Normal Specular Reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) Granular Films. 2010.
Cita MLAMassa, Nestor Emilio, et al. Far Infrared Near Normal Specular Reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) Granular Films. 2010.
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