Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films

Autores
Massa, Nestor Emilio; Denardin, Juliano C.; Socolovsky, Leandro Martin; Knobel, Marcelo; de la Cruz, Fernando Pablo; Zhang, XiXiang
Año de publicación
2010
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
One of the current issues at the basis of the understanding of novel materials is the degree of the role played by spatial inhomogeneities due to subtle phase separations. To clarify this picture here we compare the plain glass network response of transition metal granular films with different metal fractions against what it is known for conducting oxides Films for Nix(SiO2)1-x ,x= 1.0, 0.84,0.75, 0.61,0.54, 0.28, were studied by temperature dependent far infrared measurements. While for pure Ni the spectrum shows a flat high reflectivity, those for x ~0.84 and ~0.75 have a Drude component, vibrational modes mostly carrier screened, and a long tail that extents toward near infrared. This is associated with hopping electron conductivity and strong electron-phonon interactions. The relative reduction of the number of carriers in Ni0.75(SiO2)0.25 allows less screened phonon bands on the top of a continuum and a wide and overdamped oscillator at mid-infrared frequencies. Ni0.54(SiO2)0.46 and Ni0.28(SiO2)0.72 have well defined vibrational bands and a sharp threshold at ~1450 cm-1. It is most remarkable a distinctive resonant peak at 1250 cm-1 found for p-polarized angle dependent specular reflectivity. It originates in an electron cloud traced to electrons that are not able to overcome the metal-dielectric interface that, beating against the positive background, generates the electric dipole. Overall, we conclude that the spectra are analogous to those regularly found in conducting oxides where with a suitable percolating network polarons are formed.
Fil: Massa, Nestor Emilio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; Argentina
Fil: Denardin, Juliano C.. Universidad de Santiago de Chile; Chile
Fil: Socolovsky, Leandro Martin. Universidad de Buenos Aires. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina
Fil: Knobel, Marcelo. Universidade Estadual de Campinas; Brasil
Fil: de la Cruz, Fernando Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; Argentina
Fil: Zhang, XiXiang. King Abdullah University of Science and Technology; Arabia Saudita
Materia
ELECTRON-PHONON INTERACTIONS
GRANULAR FILMS
INFRARED
LIGHT ABSORPTION AND REFLECTION
OXIDES
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/129697
Acceder
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oai_identifier_str oai:ri.conicet.gov.ar:11336/129697
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular filmsMassa, Nestor EmilioDenardin, Juliano C.Socolovsky, Leandro MartinKnobel, Marcelode la Cruz, Fernando PabloZhang, XiXiangELECTRON-PHONON INTERACTIONSGRANULAR FILMSINFRAREDLIGHT ABSORPTION AND REFLECTIONOXIDEShttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1One of the current issues at the basis of the understanding of novel materials is the degree of the role played by spatial inhomogeneities due to subtle phase separations. To clarify this picture here we compare the plain glass network response of transition metal granular films with different metal fractions against what it is known for conducting oxides Films for Nix(SiO2)1-x ,x= 1.0, 0.84,0.75, 0.61,0.54, 0.28, were studied by temperature dependent far infrared measurements. While for pure Ni the spectrum shows a flat high reflectivity, those for x ~0.84 and ~0.75 have a Drude component, vibrational modes mostly carrier screened, and a long tail that extents toward near infrared. This is associated with hopping electron conductivity and strong electron-phonon interactions. The relative reduction of the number of carriers in Ni0.75(SiO2)0.25 allows less screened phonon bands on the top of a continuum and a wide and overdamped oscillator at mid-infrared frequencies. Ni0.54(SiO2)0.46 and Ni0.28(SiO2)0.72 have well defined vibrational bands and a sharp threshold at ~1450 cm-1. It is most remarkable a distinctive resonant peak at 1250 cm-1 found for p-polarized angle dependent specular reflectivity. It originates in an electron cloud traced to electrons that are not able to overcome the metal-dielectric interface that, beating against the positive background, generates the electric dipole. Overall, we conclude that the spectra are analogous to those regularly found in conducting oxides where with a suitable percolating network polarons are formed.Fil: Massa, Nestor Emilio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; ArgentinaFil: Denardin, Juliano C.. Universidad de Santiago de Chile; ChileFil: Socolovsky, Leandro Martin. Universidad de Buenos Aires. Instituto de Tecnologías y Ciencias de la Ingeniería; ArgentinaFil: Knobel, Marcelo. Universidade Estadual de Campinas; BrasilFil: de la Cruz, Fernando Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; ArgentinaFil: Zhang, XiXiang. King Abdullah University of Science and Technology; Arabia SauditaElsevier Science SA2010-05info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/129697Massa, Nestor Emilio; Denardin, Juliano C.; Socolovsky, Leandro Martin; Knobel, Marcelo; de la Cruz, Fernando Pablo; et al.; Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films; Elsevier Science SA; Journal of Alloys and Compounds; 495; 2; 5-2010; 638-6410925-8388CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/http://www.journals.elsevier.com/journal-of-alloys-and-compounds/info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/abs/pii/S0925838809022282info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jallcom.2009.10.228info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:32:18Zoai:ri.conicet.gov.ar:11336/129697instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:32:18.725CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
title Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
spellingShingle Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
Massa, Nestor Emilio
ELECTRON-PHONON INTERACTIONS
GRANULAR FILMS
INFRARED
LIGHT ABSORPTION AND REFLECTION
OXIDES
title_short Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
title_full Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
title_fullStr Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
title_full_unstemmed Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
title_sort Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films
dc.creator.none.fl_str_mv Massa, Nestor Emilio
Denardin, Juliano C.
Socolovsky, Leandro Martin
Knobel, Marcelo
de la Cruz, Fernando Pablo
Zhang, XiXiang
author Massa, Nestor Emilio
author_facet Massa, Nestor Emilio
Denardin, Juliano C.
Socolovsky, Leandro Martin
Knobel, Marcelo
de la Cruz, Fernando Pablo
Zhang, XiXiang
author_role author
author2 Denardin, Juliano C.
Socolovsky, Leandro Martin
Knobel, Marcelo
de la Cruz, Fernando Pablo
Zhang, XiXiang
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv ELECTRON-PHONON INTERACTIONS
GRANULAR FILMS
INFRARED
LIGHT ABSORPTION AND REFLECTION
OXIDES
topic ELECTRON-PHONON INTERACTIONS
GRANULAR FILMS
INFRARED
LIGHT ABSORPTION AND REFLECTION
OXIDES
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv One of the current issues at the basis of the understanding of novel materials is the degree of the role played by spatial inhomogeneities due to subtle phase separations. To clarify this picture here we compare the plain glass network response of transition metal granular films with different metal fractions against what it is known for conducting oxides Films for Nix(SiO2)1-x ,x= 1.0, 0.84,0.75, 0.61,0.54, 0.28, were studied by temperature dependent far infrared measurements. While for pure Ni the spectrum shows a flat high reflectivity, those for x ~0.84 and ~0.75 have a Drude component, vibrational modes mostly carrier screened, and a long tail that extents toward near infrared. This is associated with hopping electron conductivity and strong electron-phonon interactions. The relative reduction of the number of carriers in Ni0.75(SiO2)0.25 allows less screened phonon bands on the top of a continuum and a wide and overdamped oscillator at mid-infrared frequencies. Ni0.54(SiO2)0.46 and Ni0.28(SiO2)0.72 have well defined vibrational bands and a sharp threshold at ~1450 cm-1. It is most remarkable a distinctive resonant peak at 1250 cm-1 found for p-polarized angle dependent specular reflectivity. It originates in an electron cloud traced to electrons that are not able to overcome the metal-dielectric interface that, beating against the positive background, generates the electric dipole. Overall, we conclude that the spectra are analogous to those regularly found in conducting oxides where with a suitable percolating network polarons are formed.
Fil: Massa, Nestor Emilio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; Argentina
Fil: Denardin, Juliano C.. Universidad de Santiago de Chile; Chile
Fil: Socolovsky, Leandro Martin. Universidad de Buenos Aires. Instituto de Tecnologías y Ciencias de la Ingeniería; Argentina
Fil: Knobel, Marcelo. Universidade Estadual de Campinas; Brasil
Fil: de la Cruz, Fernando Pablo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; Argentina
Fil: Zhang, XiXiang. King Abdullah University of Science and Technology; Arabia Saudita
description One of the current issues at the basis of the understanding of novel materials is the degree of the role played by spatial inhomogeneities due to subtle phase separations. To clarify this picture here we compare the plain glass network response of transition metal granular films with different metal fractions against what it is known for conducting oxides Films for Nix(SiO2)1-x ,x= 1.0, 0.84,0.75, 0.61,0.54, 0.28, were studied by temperature dependent far infrared measurements. While for pure Ni the spectrum shows a flat high reflectivity, those for x ~0.84 and ~0.75 have a Drude component, vibrational modes mostly carrier screened, and a long tail that extents toward near infrared. This is associated with hopping electron conductivity and strong electron-phonon interactions. The relative reduction of the number of carriers in Ni0.75(SiO2)0.25 allows less screened phonon bands on the top of a continuum and a wide and overdamped oscillator at mid-infrared frequencies. Ni0.54(SiO2)0.46 and Ni0.28(SiO2)0.72 have well defined vibrational bands and a sharp threshold at ~1450 cm-1. It is most remarkable a distinctive resonant peak at 1250 cm-1 found for p-polarized angle dependent specular reflectivity. It originates in an electron cloud traced to electrons that are not able to overcome the metal-dielectric interface that, beating against the positive background, generates the electric dipole. Overall, we conclude that the spectra are analogous to those regularly found in conducting oxides where with a suitable percolating network polarons are formed.
publishDate 2010
dc.date.none.fl_str_mv 2010-05
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/129697
Massa, Nestor Emilio; Denardin, Juliano C.; Socolovsky, Leandro Martin; Knobel, Marcelo; de la Cruz, Fernando Pablo; et al.; Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films; Elsevier Science SA; Journal of Alloys and Compounds; 495; 2; 5-2010; 638-641
0925-8388
CONICET Digital
CONICET
url http://hdl.handle.net/11336/129697
identifier_str_mv Massa, Nestor Emilio; Denardin, Juliano C.; Socolovsky, Leandro Martin; Knobel, Marcelo; de la Cruz, Fernando Pablo; et al.; Far Infrared near normal specular reflectivty of Nix(SiO2)1-x (x=1.0,0.84,0.75,0.61,0.54,0.28) granular films; Elsevier Science SA; Journal of Alloys and Compounds; 495; 2; 5-2010; 638-641
0925-8388
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/http://www.journals.elsevier.com/journal-of-alloys-and-compounds/
info:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/abs/pii/S0925838809022282
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jallcom.2009.10.228
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier Science SA
publisher.none.fl_str_mv Elsevier Science SA
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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score 13.070432

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