Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference

Autores
Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; García, Sebastián E.; Gatti, Edmundo; Hernandez, Fernando
Año de publicación
2012
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.
Fil: Benfica, Juliano. Pontificia Universidade Católica do Rio Grande do Sul; Brasil
Fil: Poehls, Leticia M. Bolzani. Pontificia Universidade Católica do Rio Grande do Sul; Brasil
Fil: Vargas, Fabian. Pontificia Universidade Católica do Rio Grande do Sul; Brasil
Fil: Lipovetzky, José. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires; Argentina
Fil: Lutenberg, Ariel. Universidad de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: García, Sebastián E.. Universidad de Buenos Aires; Argentina
Fil: Gatti, Edmundo. Instituto Nacional de Tecnología Industrial; Argentina
Fil: Hernandez, Fernando. Universidad ORT Uruguay; Uruguay
Materia
ELECTROMAGNETIC IMMUNITY
EMBEDDED SYSTEMS
TOTAL IONIZING DOSE (TID) RADIATION
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/197045
Acceder
id CONICETDig_a200ed92745f01c63696de100bc45e47
oai_identifier_str oai:ri.conicet.gov.ar:11336/197045
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic InterferenceBenfica, JulianoPoehls, Leticia M. BolzaniVargas, FabianLipovetzky, JoséLutenberg, ArielGarcía, Sebastián E.Gatti, EdmundoHernandez, FernandoELECTROMAGNETIC IMMUNITYEMBEDDED SYSTEMSTOTAL IONIZING DOSE (TID) RADIATIONhttps://purl.org/becyt/ford/2.2https://purl.org/becyt/ford/2Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.Fil: Benfica, Juliano. Pontificia Universidade Católica do Rio Grande do Sul; BrasilFil: Poehls, Leticia M. Bolzani. Pontificia Universidade Católica do Rio Grande do Sul; BrasilFil: Vargas, Fabian. Pontificia Universidade Católica do Rio Grande do Sul; BrasilFil: Lipovetzky, José. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires; ArgentinaFil: Lutenberg, Ariel. Universidad de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: García, Sebastián E.. Universidad de Buenos Aires; ArgentinaFil: Gatti, Edmundo. Instituto Nacional de Tecnología Industrial; ArgentinaFil: Hernandez, Fernando. Universidad ORT Uruguay; UruguayInstitute of Electrical and Electronics Engineers2012-08info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/197045Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; et al.; Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 4 PART 1; 8-2012; 1015-10190018-9499CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/6190732info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2012.2190621info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-29T09:50:33Zoai:ri.conicet.gov.ar:11336/197045instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-29 09:50:33.751CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
title Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
spellingShingle Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
Benfica, Juliano
ELECTROMAGNETIC IMMUNITY
EMBEDDED SYSTEMS
TOTAL IONIZING DOSE (TID) RADIATION
title_short Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
title_full Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
title_fullStr Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
title_full_unstemmed Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
title_sort Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
dc.creator.none.fl_str_mv Benfica, Juliano
Poehls, Leticia M. Bolzani
Vargas, Fabian
Lipovetzky, José
Lutenberg, Ariel
García, Sebastián E.
Gatti, Edmundo
Hernandez, Fernando
author Benfica, Juliano
author_facet Benfica, Juliano
Poehls, Leticia M. Bolzani
Vargas, Fabian
Lipovetzky, José
Lutenberg, Ariel
García, Sebastián E.
Gatti, Edmundo
Hernandez, Fernando
author_role author
author2 Poehls, Leticia M. Bolzani
Vargas, Fabian
Lipovetzky, José
Lutenberg, Ariel
García, Sebastián E.
Gatti, Edmundo
Hernandez, Fernando
author2_role author
author
author
author
author
author
author
dc.subject.none.fl_str_mv ELECTROMAGNETIC IMMUNITY
EMBEDDED SYSTEMS
TOTAL IONIZING DOSE (TID) RADIATION
topic ELECTROMAGNETIC IMMUNITY
EMBEDDED SYSTEMS
TOTAL IONIZING DOSE (TID) RADIATION
purl_subject.fl_str_mv https://purl.org/becyt/ford/2.2
https://purl.org/becyt/ford/2
dc.description.none.fl_txt_mv Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.
Fil: Benfica, Juliano. Pontificia Universidade Católica do Rio Grande do Sul; Brasil
Fil: Poehls, Leticia M. Bolzani. Pontificia Universidade Católica do Rio Grande do Sul; Brasil
Fil: Vargas, Fabian. Pontificia Universidade Católica do Rio Grande do Sul; Brasil
Fil: Lipovetzky, José. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires; Argentina
Fil: Lutenberg, Ariel. Universidad de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: García, Sebastián E.. Universidad de Buenos Aires; Argentina
Fil: Gatti, Edmundo. Instituto Nacional de Tecnología Industrial; Argentina
Fil: Hernandez, Fernando. Universidad ORT Uruguay; Uruguay
description Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.
publishDate 2012
dc.date.none.fl_str_mv 2012-08
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/197045
Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; et al.; Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 4 PART 1; 8-2012; 1015-1019
0018-9499
CONICET Digital
CONICET
url http://hdl.handle.net/11336/197045
identifier_str_mv Benfica, Juliano; Poehls, Leticia M. Bolzani; Vargas, Fabian; Lipovetzky, José; Lutenberg, Ariel; et al.; Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference; Institute of Electrical and Electronics Engineers; Ieee Transactions on Nuclear Science; 59; 4 PART 1; 8-2012; 1015-1019
0018-9499
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/6190732
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2012.2190621
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1844613557982855168
score 13.070432

Publicaciones similares