Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K

Autores
Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán
Año de publicación
2013
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers.
Fil: Ciocci Brazzano, Ligia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Sorichetti, Patricio Aníbal. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Santiago, Guillermo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: González, Martín Germán. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Materia
POLY(VINYLIDENE FLUORIDE)
PVDF
PIEZOELECTRIC THIN FILMS
ULTRASONIC TRANSDUCERS
MEDICAL IMAGING
BROADBAND DIELECTRIC SPECTROSCOPY
CLAMPED PIEZOELECTRIC
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/25353

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network_name_str CONICET Digital (CONICET)
spelling Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 KCiocci Brazzano, LigiaSorichetti, Patricio AníbalSantiago, GuillermoGonzález, Martín GermánPOLY(VINYLIDENE FLUORIDE)PVDFPIEZOELECTRIC THIN FILMSULTRASONIC TRANSDUCERSMEDICAL IMAGINGBROADBAND DIELECTRIC SPECTROSCOPYCLAMPED PIEZOELECTRIChttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers.Fil: Ciocci Brazzano, Ligia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; ArgentinaFil: Sorichetti, Patricio Aníbal. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Santiago, Guillermo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: González, Martín Germán. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaElsevier2013-07info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/25353Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán; Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K; Elsevier; Polymer Testing; 32; 7; 7-2013; 1186-11910142-9418CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.polymertesting.2013.07.004info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0142941813001360info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-nd/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T10:08:33Zoai:ri.conicet.gov.ar:11336/25353instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 10:08:33.786CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
spellingShingle Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
Ciocci Brazzano, Ligia
POLY(VINYLIDENE FLUORIDE)
PVDF
PIEZOELECTRIC THIN FILMS
ULTRASONIC TRANSDUCERS
MEDICAL IMAGING
BROADBAND DIELECTRIC SPECTROSCOPY
CLAMPED PIEZOELECTRIC
title_short Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_full Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_fullStr Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_full_unstemmed Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_sort Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
dc.creator.none.fl_str_mv Ciocci Brazzano, Ligia
Sorichetti, Patricio Aníbal
Santiago, Guillermo
González, Martín Germán
author Ciocci Brazzano, Ligia
author_facet Ciocci Brazzano, Ligia
Sorichetti, Patricio Aníbal
Santiago, Guillermo
González, Martín Germán
author_role author
author2 Sorichetti, Patricio Aníbal
Santiago, Guillermo
González, Martín Germán
author2_role author
author
author
dc.subject.none.fl_str_mv POLY(VINYLIDENE FLUORIDE)
PVDF
PIEZOELECTRIC THIN FILMS
ULTRASONIC TRANSDUCERS
MEDICAL IMAGING
BROADBAND DIELECTRIC SPECTROSCOPY
CLAMPED PIEZOELECTRIC
topic POLY(VINYLIDENE FLUORIDE)
PVDF
PIEZOELECTRIC THIN FILMS
ULTRASONIC TRANSDUCERS
MEDICAL IMAGING
BROADBAND DIELECTRIC SPECTROSCOPY
CLAMPED PIEZOELECTRIC
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.3
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers.
Fil: Ciocci Brazzano, Ligia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Sorichetti, Patricio Aníbal. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Santiago, Guillermo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: González, Martín Germán. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
description This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers.
publishDate 2013
dc.date.none.fl_str_mv 2013-07
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/25353
Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán; Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K; Elsevier; Polymer Testing; 32; 7; 7-2013; 1186-1191
0142-9418
CONICET Digital
CONICET
url http://hdl.handle.net/11336/25353
identifier_str_mv Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán; Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K; Elsevier; Polymer Testing; 32; 7; 7-2013; 1186-1191
0142-9418
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/doi/10.1016/j.polymertesting.2013.07.004
info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0142941813001360
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
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