Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
- Autores
- Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán
- Año de publicación
- 2013
- Idioma
- inglés
- Tipo de recurso
- artículo
- Estado
- versión publicada
- Descripción
- This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers.
Fil: Ciocci Brazzano, Ligia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina
Fil: Sorichetti, Patricio Aníbal. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: Santiago, Guillermo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
Fil: González, Martín Germán. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina - Materia
-
POLY(VINYLIDENE FLUORIDE)
PVDF
PIEZOELECTRIC THIN FILMS
ULTRASONIC TRANSDUCERS
MEDICAL IMAGING
BROADBAND DIELECTRIC SPECTROSCOPY
CLAMPED PIEZOELECTRIC - Nivel de accesibilidad
- acceso abierto
- Condiciones de uso
- https://creativecommons.org/licenses/by-nc-nd/2.5/ar/
- Repositorio
- Institución
- Consejo Nacional de Investigaciones Científicas y Técnicas
- OAI Identificador
- oai:ri.conicet.gov.ar:11336/25353
Ver los metadatos del registro completo
id |
CONICETDig_97bf4fd89a63f78ad78745fff908d7a1 |
---|---|
oai_identifier_str |
oai:ri.conicet.gov.ar:11336/25353 |
network_acronym_str |
CONICETDig |
repository_id_str |
3498 |
network_name_str |
CONICET Digital (CONICET) |
spelling |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 KCiocci Brazzano, LigiaSorichetti, Patricio AníbalSantiago, GuillermoGonzález, Martín GermánPOLY(VINYLIDENE FLUORIDE)PVDFPIEZOELECTRIC THIN FILMSULTRASONIC TRANSDUCERSMEDICAL IMAGINGBROADBAND DIELECTRIC SPECTROSCOPYCLAMPED PIEZOELECTRIChttps://purl.org/becyt/ford/1.3https://purl.org/becyt/ford/1This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers.Fil: Ciocci Brazzano, Ligia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; ArgentinaFil: Sorichetti, Patricio Aníbal. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Santiago, Guillermo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: González, Martín Germán. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaElsevier2013-07info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/25353Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán; Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K; Elsevier; Polymer Testing; 32; 7; 7-2013; 1186-11910142-9418CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/doi/10.1016/j.polymertesting.2013.07.004info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0142941813001360info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-nd/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-09-03T10:08:33Zoai:ri.conicet.gov.ar:11336/25353instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-09-03 10:08:33.786CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse |
dc.title.none.fl_str_mv |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
title |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
spellingShingle |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K Ciocci Brazzano, Ligia POLY(VINYLIDENE FLUORIDE) PVDF PIEZOELECTRIC THIN FILMS ULTRASONIC TRANSDUCERS MEDICAL IMAGING BROADBAND DIELECTRIC SPECTROSCOPY CLAMPED PIEZOELECTRIC |
title_short |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
title_full |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
title_fullStr |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
title_full_unstemmed |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
title_sort |
Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K |
dc.creator.none.fl_str_mv |
Ciocci Brazzano, Ligia Sorichetti, Patricio Aníbal Santiago, Guillermo González, Martín Germán |
author |
Ciocci Brazzano, Ligia |
author_facet |
Ciocci Brazzano, Ligia Sorichetti, Patricio Aníbal Santiago, Guillermo González, Martín Germán |
author_role |
author |
author2 |
Sorichetti, Patricio Aníbal Santiago, Guillermo González, Martín Germán |
author2_role |
author author author |
dc.subject.none.fl_str_mv |
POLY(VINYLIDENE FLUORIDE) PVDF PIEZOELECTRIC THIN FILMS ULTRASONIC TRANSDUCERS MEDICAL IMAGING BROADBAND DIELECTRIC SPECTROSCOPY CLAMPED PIEZOELECTRIC |
topic |
POLY(VINYLIDENE FLUORIDE) PVDF PIEZOELECTRIC THIN FILMS ULTRASONIC TRANSDUCERS MEDICAL IMAGING BROADBAND DIELECTRIC SPECTROSCOPY CLAMPED PIEZOELECTRIC |
purl_subject.fl_str_mv |
https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
dc.description.none.fl_txt_mv |
This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers. Fil: Ciocci Brazzano, Ligia. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina Fil: Sorichetti, Patricio Aníbal. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina Fil: Santiago, Guillermo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina Fil: González, Martín Germán. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina |
description |
This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers. |
publishDate |
2013 |
dc.date.none.fl_str_mv |
2013-07 |
dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion http://purl.org/coar/resource_type/c_6501 info:ar-repo/semantics/articulo |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
http://hdl.handle.net/11336/25353 Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán; Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K; Elsevier; Polymer Testing; 32; 7; 7-2013; 1186-1191 0142-9418 CONICET Digital CONICET |
url |
http://hdl.handle.net/11336/25353 |
identifier_str_mv |
Ciocci Brazzano, Ligia; Sorichetti, Patricio Aníbal; Santiago, Guillermo; González, Martín Germán; Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K; Elsevier; Polymer Testing; 32; 7; 7-2013; 1186-1191 0142-9418 CONICET Digital CONICET |
dc.language.none.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.polymertesting.2013.07.004 info:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0142941813001360 |
dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-nd/2.5/ar/ |
eu_rights_str_mv |
openAccess |
rights_invalid_str_mv |
https://creativecommons.org/licenses/by-nc-nd/2.5/ar/ |
dc.format.none.fl_str_mv |
application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf application/pdf |
dc.publisher.none.fl_str_mv |
Elsevier |
publisher.none.fl_str_mv |
Elsevier |
dc.source.none.fl_str_mv |
reponame:CONICET Digital (CONICET) instname:Consejo Nacional de Investigaciones Científicas y Técnicas |
reponame_str |
CONICET Digital (CONICET) |
collection |
CONICET Digital (CONICET) |
instname_str |
Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.name.fl_str_mv |
CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas |
repository.mail.fl_str_mv |
dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar |
_version_ |
1842270049666072576 |
score |
13.13397 |