High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction

Autores
Schäfer, Dominik; Mardare, Cezarina; Savan, Alan; Sanchez, Miguel Dario; Mei, Bastian; Xia, Wei; Muhler, Martin; Ludwig, Alfred; Schuhmann, Wolfgang
Año de publicación
2011
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Thin film metal oxide material libraries were prepared by sputter deposition of nanoscale Ti/Nb precursor multilayers followed by ex situ oxidation. The metal composition was varied from 6 at.% Nb to 27 at.% Nb. Additionally, thin wedge-type layers of Pt with a nominal thickness gradient from 0 to 5 nm were sputter-deposited on top of the oxides. The materials libraries were characterized with respect to metallic film composition, oxide thickness, phases, electrical conductivity, Pt thickness, and electrochemical activity for the oxygen reduction reaction (ORR). Electrochemical investigations were carried out by cyclic voltammetry using an automated scanning droplet cell. For a nominal Pt thickness >1 nm, no significant dependence of the ORR activity on the Pt thickness or the substrate composition was observed. However, below that critical thickness, a strong decrease of the surface-normalized activity in terms of reduction currents and potentials was observed. For such thin Pt layers, the conductivity of the substrate seems to have a substantial impact on the catalytic activity. Results from X-ray photoelectron spectroscopy (XPS) measurements suggest that the critical Pt thickness coincides with the transition from a continuous Pt film into isolated particles at decreasing nominal Pt thickness. In the case of isolated Pt particles, the activity of Pt decisively depends on its ability to exchange electrons with the oxide layer, and hence, a dependence on the substrate conductivity is rationalized.
Fil: Schäfer, Dominik. Ruhr Universität Bochum; Alemania
Fil: Mardare, Cezarina. Ruhr Universität Bochum; Alemania
Fil: Savan, Alan. Ruhr Universität Bochum; Alemania
Fil: Sanchez, Miguel Dario. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Bahía Blanca; Argentina. Universidad Nacional del Sur. Departamento de Física; Argentina. Ruhr Universität Bochum; Alemania
Fil: Mei, Bastian. Ruhr Universität Bochum; Alemania
Fil: Xia, Wei. Ruhr Universität Bochum; Alemania
Fil: Muhler, Martin. Ruhr Universität Bochum; Alemania
Fil: Ludwig, Alfred. Ruhr Universität Bochum; Alemania
Fil: Schuhmann, Wolfgang. Ruhr Universität Bochum; Alemania
Materia
THIN FILM METAL OXIDE
SPUTTER DEPOSITION
PLATINUM
OXIGEN REDUCTION REACTION
Nivel de accesibilidad
acceso abierto
Condiciones de uso
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
Repositorio
CONICET Digital (CONICET)
Institución
Consejo Nacional de Investigaciones Científicas y Técnicas
OAI Identificador
oai:ri.conicet.gov.ar:11336/105712
Acceder
id CONICETDig_972e8efdcb7d0c8935196deaaeda438c
oai_identifier_str oai:ri.conicet.gov.ar:11336/105712
network_acronym_str CONICETDig
repository_id_str 3498
network_name_str CONICET Digital (CONICET)
spelling High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction ReactionSchäfer, DominikMardare, CezarinaSavan, AlanSanchez, Miguel DarioMei, BastianXia, WeiMuhler, MartinLudwig, AlfredSchuhmann, WolfgangTHIN FILM METAL OXIDESPUTTER DEPOSITIONPLATINUMOXIGEN REDUCTION REACTIONhttps://purl.org/becyt/ford/1.4https://purl.org/becyt/ford/1Thin film metal oxide material libraries were prepared by sputter deposition of nanoscale Ti/Nb precursor multilayers followed by ex situ oxidation. The metal composition was varied from 6 at.% Nb to 27 at.% Nb. Additionally, thin wedge-type layers of Pt with a nominal thickness gradient from 0 to 5 nm were sputter-deposited on top of the oxides. The materials libraries were characterized with respect to metallic film composition, oxide thickness, phases, electrical conductivity, Pt thickness, and electrochemical activity for the oxygen reduction reaction (ORR). Electrochemical investigations were carried out by cyclic voltammetry using an automated scanning droplet cell. For a nominal Pt thickness >1 nm, no significant dependence of the ORR activity on the Pt thickness or the substrate composition was observed. However, below that critical thickness, a strong decrease of the surface-normalized activity in terms of reduction currents and potentials was observed. For such thin Pt layers, the conductivity of the substrate seems to have a substantial impact on the catalytic activity. Results from X-ray photoelectron spectroscopy (XPS) measurements suggest that the critical Pt thickness coincides with the transition from a continuous Pt film into isolated particles at decreasing nominal Pt thickness. In the case of isolated Pt particles, the activity of Pt decisively depends on its ability to exchange electrons with the oxide layer, and hence, a dependence on the substrate conductivity is rationalized.Fil: Schäfer, Dominik. Ruhr Universität Bochum; AlemaniaFil: Mardare, Cezarina. Ruhr Universität Bochum; AlemaniaFil: Savan, Alan. Ruhr Universität Bochum; AlemaniaFil: Sanchez, Miguel Dario. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Bahía Blanca; Argentina. Universidad Nacional del Sur. Departamento de Física; Argentina. Ruhr Universität Bochum; AlemaniaFil: Mei, Bastian. Ruhr Universität Bochum; AlemaniaFil: Xia, Wei. Ruhr Universität Bochum; AlemaniaFil: Muhler, Martin. Ruhr Universität Bochum; AlemaniaFil: Ludwig, Alfred. Ruhr Universität Bochum; AlemaniaFil: Schuhmann, Wolfgang. Ruhr Universität Bochum; AlemaniaAmerican Chemical Society2011-02-17info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloapplication/pdfapplication/pdfhttp://hdl.handle.net/11336/105712Schäfer, Dominik; Mardare, Cezarina; Savan, Alan; Sanchez, Miguel Dario; Mei, Bastian; et al.; High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction; American Chemical Society; Analytical Chemistry; 83; 6; 17-2-2011; 1916-19230003-2700CONICET DigitalCONICETenginfo:eu-repo/semantics/altIdentifier/url/https://pubs.acs.org/doi/10.1021/ac102303uinfo:eu-repo/semantics/altIdentifier/doi/10.1021/ac102303uinfo:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/reponame:CONICET Digital (CONICET)instname:Consejo Nacional de Investigaciones Científicas y Técnicas2025-10-22T12:02:53Zoai:ri.conicet.gov.ar:11336/105712instacron:CONICETInstitucionalhttp://ri.conicet.gov.ar/Organismo científico-tecnológicoNo correspondehttp://ri.conicet.gov.ar/oai/requestdasensio@conicet.gov.ar; lcarlino@conicet.gov.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:34982025-10-22 12:02:53.567CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicasfalse
dc.title.none.fl_str_mv High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
title High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
spellingShingle High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
Schäfer, Dominik
THIN FILM METAL OXIDE
SPUTTER DEPOSITION
PLATINUM
OXIGEN REDUCTION REACTION
title_short High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
title_full High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
title_fullStr High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
title_full_unstemmed High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
title_sort High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction
dc.creator.none.fl_str_mv Schäfer, Dominik
Mardare, Cezarina
Savan, Alan
Sanchez, Miguel Dario
Mei, Bastian
Xia, Wei
Muhler, Martin
Ludwig, Alfred
Schuhmann, Wolfgang
author Schäfer, Dominik
author_facet Schäfer, Dominik
Mardare, Cezarina
Savan, Alan
Sanchez, Miguel Dario
Mei, Bastian
Xia, Wei
Muhler, Martin
Ludwig, Alfred
Schuhmann, Wolfgang
author_role author
author2 Mardare, Cezarina
Savan, Alan
Sanchez, Miguel Dario
Mei, Bastian
Xia, Wei
Muhler, Martin
Ludwig, Alfred
Schuhmann, Wolfgang
author2_role author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv THIN FILM METAL OXIDE
SPUTTER DEPOSITION
PLATINUM
OXIGEN REDUCTION REACTION
topic THIN FILM METAL OXIDE
SPUTTER DEPOSITION
PLATINUM
OXIGEN REDUCTION REACTION
purl_subject.fl_str_mv https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
dc.description.none.fl_txt_mv Thin film metal oxide material libraries were prepared by sputter deposition of nanoscale Ti/Nb precursor multilayers followed by ex situ oxidation. The metal composition was varied from 6 at.% Nb to 27 at.% Nb. Additionally, thin wedge-type layers of Pt with a nominal thickness gradient from 0 to 5 nm were sputter-deposited on top of the oxides. The materials libraries were characterized with respect to metallic film composition, oxide thickness, phases, electrical conductivity, Pt thickness, and electrochemical activity for the oxygen reduction reaction (ORR). Electrochemical investigations were carried out by cyclic voltammetry using an automated scanning droplet cell. For a nominal Pt thickness >1 nm, no significant dependence of the ORR activity on the Pt thickness or the substrate composition was observed. However, below that critical thickness, a strong decrease of the surface-normalized activity in terms of reduction currents and potentials was observed. For such thin Pt layers, the conductivity of the substrate seems to have a substantial impact on the catalytic activity. Results from X-ray photoelectron spectroscopy (XPS) measurements suggest that the critical Pt thickness coincides with the transition from a continuous Pt film into isolated particles at decreasing nominal Pt thickness. In the case of isolated Pt particles, the activity of Pt decisively depends on its ability to exchange electrons with the oxide layer, and hence, a dependence on the substrate conductivity is rationalized.
Fil: Schäfer, Dominik. Ruhr Universität Bochum; Alemania
Fil: Mardare, Cezarina. Ruhr Universität Bochum; Alemania
Fil: Savan, Alan. Ruhr Universität Bochum; Alemania
Fil: Sanchez, Miguel Dario. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Bahía Blanca; Argentina. Universidad Nacional del Sur. Departamento de Física; Argentina. Ruhr Universität Bochum; Alemania
Fil: Mei, Bastian. Ruhr Universität Bochum; Alemania
Fil: Xia, Wei. Ruhr Universität Bochum; Alemania
Fil: Muhler, Martin. Ruhr Universität Bochum; Alemania
Fil: Ludwig, Alfred. Ruhr Universität Bochum; Alemania
Fil: Schuhmann, Wolfgang. Ruhr Universität Bochum; Alemania
description Thin film metal oxide material libraries were prepared by sputter deposition of nanoscale Ti/Nb precursor multilayers followed by ex situ oxidation. The metal composition was varied from 6 at.% Nb to 27 at.% Nb. Additionally, thin wedge-type layers of Pt with a nominal thickness gradient from 0 to 5 nm were sputter-deposited on top of the oxides. The materials libraries were characterized with respect to metallic film composition, oxide thickness, phases, electrical conductivity, Pt thickness, and electrochemical activity for the oxygen reduction reaction (ORR). Electrochemical investigations were carried out by cyclic voltammetry using an automated scanning droplet cell. For a nominal Pt thickness >1 nm, no significant dependence of the ORR activity on the Pt thickness or the substrate composition was observed. However, below that critical thickness, a strong decrease of the surface-normalized activity in terms of reduction currents and potentials was observed. For such thin Pt layers, the conductivity of the substrate seems to have a substantial impact on the catalytic activity. Results from X-ray photoelectron spectroscopy (XPS) measurements suggest that the critical Pt thickness coincides with the transition from a continuous Pt film into isolated particles at decreasing nominal Pt thickness. In the case of isolated Pt particles, the activity of Pt decisively depends on its ability to exchange electrons with the oxide layer, and hence, a dependence on the substrate conductivity is rationalized.
publishDate 2011
dc.date.none.fl_str_mv 2011-02-17
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/11336/105712
Schäfer, Dominik; Mardare, Cezarina; Savan, Alan; Sanchez, Miguel Dario; Mei, Bastian; et al.; High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction; American Chemical Society; Analytical Chemistry; 83; 6; 17-2-2011; 1916-1923
0003-2700
CONICET Digital
CONICET
url http://hdl.handle.net/11336/105712
identifier_str_mv Schäfer, Dominik; Mardare, Cezarina; Savan, Alan; Sanchez, Miguel Dario; Mei, Bastian; et al.; High-Throughput Characterization of Pt Supported on Thin Film Oxide Material Libraries Applied in the Oxygen Reduction Reaction; American Chemical Society; Analytical Chemistry; 83; 6; 17-2-2011; 1916-1923
0003-2700
CONICET Digital
CONICET
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv info:eu-repo/semantics/altIdentifier/url/https://pubs.acs.org/doi/10.1021/ac102303u
info:eu-repo/semantics/altIdentifier/doi/10.1021/ac102303u
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
eu_rights_str_mv openAccess
rights_invalid_str_mv https://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Chemical Society
publisher.none.fl_str_mv American Chemical Society
dc.source.none.fl_str_mv reponame:CONICET Digital (CONICET)
instname:Consejo Nacional de Investigaciones Científicas y Técnicas
reponame_str CONICET Digital (CONICET)
collection CONICET Digital (CONICET)
instname_str Consejo Nacional de Investigaciones Científicas y Técnicas
repository.name.fl_str_mv CONICET Digital (CONICET) - Consejo Nacional de Investigaciones Científicas y Técnicas
repository.mail.fl_str_mv dasensio@conicet.gov.ar; lcarlino@conicet.gov.ar
_version_ 1846782367582126080
score 12.982451

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